ENA-X and ENA Series Vector Network Analyzers.pdf - 第22页

22 B asic Pulsed - RF Mea surements Lite ( S96 0 24 B for E5080B , S9602 4 0B/ S96024 1B for E5081 A ) This application ena bles internal pulse gener ators that can be used to control the analyzer’s int ernal pulse modul…

Additionally, modern DUTs often have more than two ports, leading to more complex crosstalk scenarios

within the measurement setup.

Addressing these challenges requires advanced calibration techniques and models that can accurately

account for and mitigate crosstalk, ensuring reliable and precise measurement results. The application

maintains the integrity of high-frequency testing and supports the development of next-generation

technologies.

Time Domain Analysis (S96010B)

This application enables the analyzer to view reflection and transmission responses in time or distance.

Use time domain to tune filters, gate out the response of fixtures and cables, characterize the impedance

of transmission lines and more.

Enhanced Time Domain Analysis with TDR (S96011B)

This application enables the analyzer to perform enhanced time domain analysis for high-speed data

applications. All functionalities of the S96010B are included (TDR/TDT mode). In addition, the S96011B

enables more detailed measurements and evaluations, such as eye-diagram/mask modes, without adding

PLTS software. Jitters and/or emphasis/equalization capabilities enables simulation of real-world signals and

environment. S96011B covers up to 53 GHz bandwidth with 8.42 ps rise time. Full calibration is available and

the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical

calibration kits or ECal with DC option (e.g., N443xD or N469xD with Option 0DC) are recommended.

Real Time S-Parameter and Power Measurement

Uncertainty (S96015B)

This application provides uncertainties for both S-parameter and power measurements on the analyzer.

The real-time display of the uncertainty associated with power and S-parameter traces increases the

confidence in the reproducibility of measurements. This allows users to implement pass/fail tests easily

because now the instrument quantifies the gray region that is in between a full pass or a full fail, apply

more realistic limit lines which can increase the production yield and reduce the defect percentage on the

finished products. This application easily establishes a metric to quantify the quality of the measurement

process, so your company’s quality control procedures are simplified. It includes the uncertainty

information for most Keysight calibration kits and provides national metrology institute traceability through

Keysight’s calibration kits. This application also helps you to include uncertainty information for your

product’s specifications and data sheets.

Basic Pulsed-RF Measurements Lite (S96024B for

E5080B, S960240B/S960241B for E5081A)

This application enables internal pulse generators that can be used to control the analyzer’s internal pulse

modulators, and it provides an integrated pulse application that uses the wideband-detection method. For

use with E5080B, the S96024B software requires hardware Option 021 or 022 pulse modulator hardware.

There are two frequency choices intended for E5081B ENA-X: S960240B to 20 GHz options and

S960241B to 44 GHz options.

The software provides an easy way to set up point-in-pulse measurements with pulse width as narrow as

50 μs, and pulse-profile measurements with 1 μs minimum timing resolution. Using the built-in pulse

modulators, the analyzer is a complete pulsed-RF measurement solution, eliminating the need for

external test sets and pulse generators. The software also controls external pulse generators and

modulators and can synchronize to external master pulses. The application I/O connector on the rear

panel of the analyzer is recommended if using external master pulses or external pulse modulators.

S96024B is a subset of S96025B and S96024xB is a subset of S96025xB, so they should not be installed

together.

Basic Pulsed-RF Measurements (S96025B for E5080B,

S960250B/S960251B for E5081A)

This application enables internal pulse generators that can be used to control the analyzer’s internal pulse

modulators, and it provides an integrated pulse application that uses the wideband-detection method. For use

with E5080B, the software requires hardware Option 021 or 022 pulse modulator hardware. There are two

frequency choices intended for E5081B ENA-X: S960250B to 20 GHz options and S960251B to 44 GHz options.

The software extends the capabilities of S96024B or S96024xB and provides an easy way to set up point-in-

pulse measurements with pulse width as narrow as 200 ns, and pulse-profile measurements with 40 ns

minimum timing resolution. Using the built-in pulse modulators with pulse width as narrow as 1 us, the

analyzer is a complete pulsed-RF measurement solution, eliminating the need for external test sets and

pulse generators. Examples of pulse modulation shapes with 1 μs and 100 μs pulse width using the internal

pulse modulators are included in E5080B data sheet (5992-3843) or E5081A data sheet (3123-1369). The

software also controls external pulse generators and modulators and can synchronize to external master

pulses. The application I/O connector on the rear panel of the analyzer is recommended if using external

master pulses or external pulse modulators.

Add Mechanical Noise Tuner Control for Noise

Figure/Parameter Measurements (S96027B)

Noise figure measurements using application software S96029B utilize an ECal module as an impedance

tuner to provide source- corrected noise figure and noise parameter measurements of nominally matched

devices, with gamma-opts < 0.3. To measure noise parameters of unmatched devices with higher

gamma- opts, an external tuner is needed. This application software enables control of Maury Microwave

LXI tuners or Focus Microwaves’ CCMT tuners in place of an ECal module, extending noise parameter

measurements to devices with gamma-opts < 0.9. Requires application software S96029B. Refer to

Maury Microwave’s or Focus Microwaves’ websites for more information about compatible tuners.

Noise Figure Measurements with Vector Correction

(S96029B) using E5080B ENA

This software application enables high-accuracy noise figure and noise-power measurements of

amplifiers, frequency converters, and mixers, utilizing Keysight’s unique vector-source-correction

technique that uses Keysight N469xD series ECal module as a source-impedance tuner

to remove the

effects of imperfect system-source match. This approach yields accuracy that surpasses that provided by

the Y-factor method and other cold-source implementations, especially for in-fixture, on-wafer, and

automated-test environments. S96029B controls N469xD Series ECal modules configured as impedance

tuners for use with the E5080B ENA.

A scalar-calibrated method is also available that offers less accuracy but is faster and does not require an

impedance tuner. This method requires an external switch to isolate the E5080B’s source signal during

noise figure measurements. A 50-ohm load must be connected to the DUT’s input using the switch.

The analyzer’s standard receivers are used for noise figure measurements with the S96029B. An external

preamplifier, filter(s) and switches are required for devices with < 30 dB of excess noise (gain plus noise

figure in dB). Typical block diagrams of scalar-calibrated (left) and vector-calibrated (right) noise figure

measurements are shown.

1. 8509x, N443x or N755xA Series ECal modules are not supported.