ENA-X and ENA Series Vector Network Analyzers.pdf - 第21页

21 Additionally, mode rn DUTs often have more tha n two ports, leading t o more complex crosst alk scenarios within the measurem ent setup. Addressing these challenges requires adva nced calibration techniq ues and model…

Description

For E5080B ENA

For E5081A ENA-X

Additional Information

Automated measurement

expert (AMX)

S94701A, S94702A,

KS8400A

S94701A, S94702A,

KS8400A

A smart software solution for

automated multiport S-parameter

measurements with the VNA and

E5092A

. Order each software model

and install in a PC or the analyzer.

DisplayPort DP cable

compliance test software

S94DPPCB

7,8

S94DPPCB

Performs automated compliance

tests of DisplayPort cable

assemblies using 4-port VNA.

USB Type-C interconnects

compliance test software

S94USBCB

7,8

N/A

Performs automated compliance

tests of USB Type-C interconnects

(e.g., cable assemblies,

connectors, or raw cables) using 4-

port E5080B.

Automotive cable test

software

AE6910L, AE2010L

N/A

Automotive Ethernet and SerDes

cable, connector, and harness

conformance. Automated VNA

setup and compliance

measurements with pass/fail

reporting using 4-port E5080B.

1. The S96xxxB software has six license types, please refer to “Keysight Software Licensing Options Provide Flexibility and

Support” for more detail.

2. Provides Frequency Offset Mode (FOM) to independently set the frequency of internal source(s) and receivers, and to configure

external sources using External Device Configuration.

3. The 16198A option 010 is connected with the E5080B’s options up to 20 GHz with either Type-N or 3.5-mm connectors. It offers

optional fixtures to mount 0402 mm (0402 mm / 01005 inch) and 0201 (0201 mm / 008005 inch) devices with option 200 and

100 respectively.

4. The most common method to use S96087B is to use a 4-port VNA with the internal dual source, with each built-in source

generating one tone. An external combiner (for example, hybrid power dividers 87302C, 87303C, or 87304C) is required to

combine the tones.

5. Features of S96007B and S96552B are not supported with the S94051B.

6. A 4-port ECal module (e.g., N4431D or N4433D) is recommended for multiport measurements.

7. Requires S96011B, KS8400B PathWave Test Automation, and KS8104B HTML5 Result Listener Plugin.

8. Supports L8990M-0LZ 20-port switch matrix to configure a multiport test system which eliminates the need for reconnections of

test cables with DUT.

9. E5081A ENA-X is not recommended for USB Type-C low-speed signal test which requires measurements from 300 kHz.

Automatic Fixture Removal (S96007B)

Many devices do not have coaxial connectors and are put in fixtures in order to measure them in a

coaxial environment. Accurately removing the effects of the fixture is required to get a good measurement

of the Device Under Test (DUT). This application adds a powerful application wizard to guide you through

characterizing a fixture and removing it from the measurement. Devices can be single-ended or

differential. Files can be saved in a variety of formats for later use in ENA, PNA, PXI VNA, Streamline

Series VNA, ADS, and PLTS.

Probe and Fixture Leakage Calibration (S95008B)

The software provides a process designed to address and correct crosstalk and leakage errors within the

measurement system. As measurement systems operate at high frequencies, the potential for crosstalk

increases, impacting the accuracy of measurements. With on-wafer measurement setups, probes and

components are placed very close to each other, resulting in crosstalk through physical coupling.

Additionally, modern DUTs often have more than two ports, leading to more complex crosstalk scenarios

within the measurement setup.

Addressing these challenges requires advanced calibration techniques and models that can accurately

account for and mitigate crosstalk, ensuring reliable and precise measurement results. The application

maintains the integrity of high-frequency testing and supports the development of next-generation

technologies.

Time Domain Analysis (S96010B)

This application enables the analyzer to view reflection and transmission responses in time or distance.

Use time domain to tune filters, gate out the response of fixtures and cables, characterize the impedance

of transmission lines and more.

Enhanced Time Domain Analysis with TDR (S96011B)

This application enables the analyzer to perform enhanced time domain analysis for high-speed data

applications. All functionalities of the S96010B are included (TDR/TDT mode). In addition, the S96011B

enables more detailed measurements and evaluations, such as eye-diagram/mask modes, without adding

PLTS software. Jitters and/or emphasis/equalization capabilities enables simulation of real-world signals and

environment. S96011B covers up to 53 GHz bandwidth with 8.42 ps rise time. Full calibration is available and

the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical

calibration kits or ECal with DC option (e.g., N443xD or N469xD with Option 0DC) are recommended.

Real Time S-Parameter and Power Measurement

Uncertainty (S96015B)

This application provides uncertainties for both S-parameter and power measurements on the analyzer.

The real-time display of the uncertainty associated with power and S-parameter traces increases the

confidence in the reproducibility of measurements. This allows users to implement pass/fail tests easily

because now the instrument quantifies the gray region that is in between a full pass or a full fail, apply

more realistic limit lines which can increase the production yield and reduce the defect percentage on the

finished products. This application easily establishes a metric to quantify the quality of the measurement

process, so your company’s quality control procedures are simplified. It includes the uncertainty

information for most Keysight calibration kits and provides national metrology institute traceability through

Keysight’s calibration kits. This application also helps you to include uncertainty information for your

product’s specifications and data sheets.

Basic Pulsed-RF Measurements Lite (S96024B for

E5080B, S960240B/S960241B for E5081A)

This application enables internal pulse generators that can be used to control the analyzer’s internal pulse

modulators, and it provides an integrated pulse application that uses the wideband-detection method. For

use with E5080B, the S96024B software requires hardware Option 021 or 022 pulse modulator hardware.

There are two frequency choices intended for E5081B ENA-X: S960240B to 20 GHz options and

S960241B to 44 GHz options.

The software provides an easy way to set up point-in-pulse measurements with pulse width as narrow as

50 μs, and pulse-profile measurements with 1 μs minimum timing resolution. Using the built-in pulse

modulators, the analyzer is a complete pulsed-RF measurement solution, eliminating the need for

external test sets and pulse generators. The software also controls external pulse generators and

modulators and can synchronize to external master pulses. The application I/O connector on the rear

panel of the analyzer is recommended if using external master pulses or external pulse modulators.

S96024B is a subset of S96025B and S96024xB is a subset of S96025xB, so they should not be installed

together.

Basic Pulsed-RF Measurements (S96025B for E5080B,

S960250B/S960251B for E5081A)

This application enables internal pulse generators that can be used to control the analyzer’s internal pulse

modulators, and it provides an integrated pulse application that uses the wideband-detection method. For use

with E5080B, the software requires hardware Option 021 or 022 pulse modulator hardware. There are two

frequency choices intended for E5081B ENA-X: S960250B to 20 GHz options and S960251B to 44 GHz options.

The software extends the capabilities of S96024B or S96024xB and provides an easy way to set up point-in-

pulse measurements with pulse width as narrow as 200 ns, and pulse-profile measurements with 40 ns

minimum timing resolution. Using the built-in pulse modulators with pulse width as narrow as 1 us, the

analyzer is a complete pulsed-RF measurement solution, eliminating the need for external test sets and

pulse generators. Examples of pulse modulation shapes with 1 μs and 100 μs pulse width using the internal

pulse modulators are included in E5080B data sheet (5992-3843) or E5081A data sheet (3123-1369). The

software also controls external pulse generators and modulators and can synchronize to external master

pulses. The application I/O connector on the rear panel of the analyzer is recommended if using external

master pulses or external pulse modulators.