IPC-TM-650 EN 2022 试验方法1.pdf - 第510页
overshoot undershoot ringing low frequency drift
TDR Instrument
probe
SIU
Maximum
risetime
DUT
(interconnect)
Time
overshoot
undershoot
ringing
low frequency drift
RIE TDR PROCESS
Acquire TDR response for one reference and line under test
Averaging filter of re-sampled TDR waveforms
Cubic spline re-sampling of TDR waveforms
Perform Derivative of filtered TDR waveforms
Determine RIE loss from reference Sample
Determine RIE loss from test Sample
Determine RIE loss ratio
Voltage
Time
Corresponds to probe launch
T0 T1