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IPC-TM-650

Number Subject Date

Revision

Page 3 of 7

2.5.5.15

RelativePermittivityandLossTangentUsinga

06/22



 Split-PostDielectricResonator



N/A

4 Apparatus or Material

4.1 Test System

The schematic diagram of the test system is shown in Figure 2. The test can be conducted at room temperature

or an elevated temperature as indicated.

Figure2–SchematicDiagramofTestSystem

4.2 Test Fixture Parameters

Table 2 shows the typical relationship between the SPDR test fixture’s nominal frequency and

and D. For different test frequencies, the corresponding SPDR test fixture of nominal frequency shall be used.

Table 2 – Test Fixture Configurations

SPDRTestFrequency

[GHz]

mm[inch]

1 120 [4.7] 6.0 [0.24]

3 50 [2.0] 3.0 [0.12]

5 to 6 30 [1.2] 2.0 [0.08]

9 to 10 22 [0.9] 0.9 [0.035]

13 to 16 15 [0.6] 0.6 [0.024]

18 to 20 10 [0.4] 0.5 [0.020]

4.3 Vector Network Analyzer (VNA)

The frequency range of the VNA shall be 500 MHz to 20 GHz, The dynamic range of the

VNA shall be more than 60 dB.

4.4 Calibration Reference

The calibration equipment shall include a standard reference sample. For example, a single-crystal

quartz or equivalent reference, and a calibration assembly for the VNA.