MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第242页

MIL-STD-883F METHOD 2010.11 18 June 2004 32 Condition A Conditi on B Class le vel S Class lev el B Rectangul ar L tr im FIGURE 2010-30. Resis tor Cri teri a - Conti nued. d. Res is tor widt h that has been reduced by t r…

100%1 / 708
MIL-STD-883F
METHOD 2010.11
18 June 2004
31
Condition A Condition B
Class level S Class level B
c. A kerf containing untrimmed resistor material, unless that material is continuous across the kerf, and is
undisturbed for a width greater than one-half times the narrowest resistor width, unless by design (see figure
2010-30).
NOTE: Maximum allowable current density requirements shall not be exceeded.
Top hat trim
FIGURE 2010-30. Resistor Criteria
.
*
*
MIL-STD-883F
METHOD 2010.11
18 June 2004
32
Condition A Condition B
Class level S Class level B
Rectangular L trim
FIGURE 2010-30. Resistor Criteria
- Continued.
d. Resistor width that has been reduced by trimming to less than one-half the narrowest resistor width, including
voids, scratches, or a combination thereof, in the trim area (see figure 2010-31).
NOTE: Trimming of more than 50 percent of a given resistor shunt link is acceptable by design providing that the last
shunt link of the resistor adder network is not trimmed greater than 50 percent. All trimmable resistor shunt
links shall be defined on the design layout drawing.
*
*
MIL-STD-883F
METHOD 2010.11
18 June 2004
33
FIGURE 2010-31. Scratch, void and trim criteria for resistors
.
*
*