MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第493页
MIL-STD-883F METHOD 3007.1 15 November 1974 1 METHOD 3007.1 LOW LEVEL OUTPUT VOLTAGE 1. PURPOSE . This method est ablis hes the means for as suri ng cir cuit perfor mance to t he limi ts s pecif ied in the applic able ac…
MIL-STD-883F
METHOD 3006.1
15 November 1974
2
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MIL-STD-883F
METHOD 3007.1
15 November 1974
1
METHOD 3007.1
LOW LEVEL OUTPUT VOLTAGE
1. PURPOSE
. This method establishes the means for assuring circuit performance to the limits specified in the
applicable acquisition document with regard to LOW level output drive which is specified as a maximum value (V
OL
max) or
a minimum value (V
OL
min). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
2. APPARATUS
. The test instrument shall be capable of loading the output of the circuit under test with the specified
positive or negative currents (I
OL
). Resistors may be used to simulate the applicable current levels. The test instrument
shall be capable of supplying the worst case power supply and input voltages. The test chamber shall be capable of
maintaining the device under test at any specified temperature.
3. PROCEDURE
. The device shall be stabilized at the specified test temperature. Worst case power supply voltages and
worst case input levels including guaranteed noise margins shall be applied to the test circuit to provide a LOW level output.
Forcing current, equal to the circuit worst case LOW level fan out, shall be applied to the test circuit output and the resultant
output voltage measured. The output measurement shall be made after each input is conditioned.
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test temperature.
b. Current to be forced into or from the output terminal.
c. Power supply voltage(s).
d. Input levels.
e. V
OL
max or V
OL
min limits.
MIL-STD-883F
METHOD 3007.1
15 November 1974
2
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