IPC-D-859.pdf - 第7页
Design Standard for Thick Film Multilayer Hybrid Circuits 1.0 SCOPE This standard covers the requirements and considerations for the design of multilayer hybrid circuits based on indus- try manufacturing capabilities. 1.…

5.1.4 Testing Requirements...................................... 39
5.1.5 Layout Concepts.............................................. 40
5.2 Substrate Geometries....................................... 42
5.2.1 Size and Shape ................................................ 42
5.2.2 Dimensions and Tolerances............................. 43
5.2.3 Datums............................................................. 43
5.2.4 Thickness Considerations................................ 43
5.2.5 Substrate Edges ............................................... 43
5.3 Circuit Features ............................................... 43
5.3.1 Conductors....................................................... 43
5.3.2 General Requirements for Lands and
Bond Lands...................................................... 45
5.3.3 Wire Bonds...................................................... 49
5.3.4 Resistors........................................................... 52
5.3.5 Vias .................................................................. 57
5.4 Coatings and Markings ................................... 58
5.4.1 Conformal Coatings ........................................ 58
5.4.2 Compatibility................................................... 58
5.4.3 Legends............................................................ 58
5.5 Artwork............................................................ 58
5.5.1 Artwork Masters.............................................. 59
5.5.2 Base Material................................................... 59
5.5.3 Accuracy.......................................................... 59
5.5.4 Pinholes............................................................ 60
5.5.5 Opaque Defects (Specks)................................ 60
5.5.6 Reproduction Conditions................................. 60
5.5.7 Packaging and Handling of Artwork
Masters............................................................. 60
5.6 Documentation................................................. 60
5.6.1 Master Drawing............................................... 60
5.6.2 Assembly Drawing.......................................... 61
5.6.3 Final Schematic/Logic..................................... 62
5.6.4 Final Bill of Material ...................................... 62
6.0 Quality Assurance................................................. 63
6.1 General............................................................. 63
6.2 Bare Board Testing.......................................... 63
6.2.1 Approaches ...................................................... 63
6.3 Design Considerations..................................... 63
6.3.1 Lands On Grid................................................. 63
6.3.2 Lands Off Grid ................................................ 63
6.3.3 Power-to-Ground Measurement...................... 63
6.4 Test Tapes ........................................................ 63
6.5 Test Circuitry................................................... 63
6.5.1 Quantity ........................................................... 63
6.5.2 Manufacturing Requirements.......................... 63
6.5.3 Identification.................................................... 63
6.5.4 Number of Layers ........................................... 64
6.5.5 Test Coupon Examples For Quality
Conformance Testing....................................... 64
6.5.6 Added Test Circuitry....................................... 65
IPC-D-859 December 1989
iv

Design Standard for Thick Film
Multilayer Hybrid Circuits
1.0 SCOPE
This standard covers the requirements and considerations
for the design of multilayer hybrid circuits based on indus-
try manufacturing capabilities.
1.1 Purpose The purpose of this standard is to establish
rules, principles, and other considerations for mechanical,
electrical, and producible properties which the designer can
use to select design features, and properties that will result
in a multilayer hybrid circuit that will meet performance
and cost requirements.
1.2 Classification When appropriate, this standard will
provide three design complexity classes of features, toler-
ances, or measurements which reflect progressive increases
in sophistication of tooling, materials, or processing and,
therefore, progressive increases in cost. These classes are:
A) Simple, B) Moderate, and C) Complex. The use of one
class for a specific feature does not mean that other fea-
tures must be of the same class. Selection should be based
on the minimum need. In the event of conflict between the
design requirements and the classes defined herein, the
former shall take precedence and be reflected on the mas-
ter drawing.
Design requirements such as precision, performance, and
conductive pattern density determine class. Class defini-
tions identify the precision needed to meet design/
performance requirements of the hybrid circuit.
Classification of design complexity requirements should
not be confused with the performance classification of end-
item use, as referenced in other IPC documentation, such
as IPC-HM-860, which refers to Class 1—consumer prod-
ucts; Class 2—general industrial; and Class 3—high reli-
ability equipment types. The need to apply certain design
concepts should depend on the complexity and precision
required to produce a particular hybrid circuit. Any design
class for any circuit characteristic may be applied to any of
the end-product equipment categories and the classes
described from each, as required. Therefore, a consumer
product designated as Class 1 could require Class A, B or
C design complexity for different attributes of the circuit.
1.2.1 Circuit Type The multilayer hybrid circuit types
defined in the IPC-HM-860 include both refractory and
nonrefractory metal co-fired types (Type I) and thick film
and thin film inorganic types (Type II).
This standard will address only Type II(a), thick film inor-
ganic multilayer hybrid circuits.
1.3 Presentation All dimensions and tolerances are
expressed in metric [and inches, shown in brackets], and
are not direct conversions. Users should employ a single
system, and not intermix millimeters and inches. Reference
information is shown in parentheses ( ).
2.0 APPLICABLE DOCUMENTS
The following documents, of the issue currently in effect,
form a part of this document to the extent specified herein.
2.1 IPC
IPC-T-50
Terms and Definitions
IPC-D-300 Dimensions and Tolerance for Printed Wiring
Applications
IPC-D-310 Guidelines for Artwork Generation and Mea-
surement Techniques
IPC-D-325 End-Product Documentation for Printed Wiring
Boards
IPC-D-350 End Product Description in Numeric Form
IPC-D-351 Printed Wiring Board Documentation in Digi-
tal Form
IPC-D-352 Electronic Design Data Base Description for
Printed Boards
IPC-D-353 Automatic Test Information Description in
Digital Form
IPC-D-354 Library Format Description for Printed Board
Digital Data Bases
IPC-TM-650 Test Methods Manual
IPC-SM-780 Guidelines for Component Packaging and
Interconnection with Emphasis on Surface Mounting
IPC-SM-782 Surface Mount Land Patterns (Configurations
and Design Rules)
IPC-CC-830 Qualification and Performance of Electrical
Insulating Compounds for Printed Board Assemblies
IPC-SM-840 Permanent Polymer Coating (Solder Mask)
for Printed Wiring Boards
IPC-HM-855 Microelectronics Design Guide
December 1989 IPC-D-859
1

IPC-HM-860 Specification for Multilayer Hybrid Circuits
2.2 Government Documents
2.2.1 Military
MIL-C-14450
Copper Plating (Electro-deposited)
MIL-M-38510 General Specification for Microelectronics
MIL-G-45204 Gold Plating (Electro-deposited)
MIL-P-81728 Plating, Tin-Lead (Electro-deposited)
MIL-STD-883 Test Methods and Procedures for Microelec-
tronics
2.2.2 Federal
QQ-N-290
Nickel Plating (Electro-deposited)
QQ-S-571 Solder; Tin Alloy; Lead-Tin Alloy; and Lead
Alloy
2.3 Other Publications
2.3.1 ASTM
F72
Gold Wire for Semiconductor Lead Bonding
F 487 Fine Aluminum—1% Silicon Wire for Semicon-
ductor Lead Bonding
F 638 Fine Aluminum—1% Magnesium Wire for Semi-
conductor Lead Bonding
2.3.2 EIA
JEDEC Publication 95
Registered and Standard Outlines
for Solid State Products
3.0 DESIGN CONSIDERATIONS
The information contained in this document describes gen-
eral and specific requirements for the design of thick film
multilayer hybrid circuits intended to meet the performance
and end product requirements of IPC- HM-860.
The success or failure of a hybrid design depends on many
interrelated considerations. The effect of the following
parameters on the design should be considered:
1. Equipment environmental conditions, such as ambient
temperature, heat generated by the components, and
ventilation.
2. Maintenance philosophy during the service life of the
equipment, especially with respect to component
placement that affects component accessibility.
3. Spacing between circuits particularly ‘‘mother board/
daughter board’’ designs that might affect placement on
interconnecting lead frames.
4. Testing/fault location requirements that might affect
component placement, conductor routing, connector
contract allocations, etc.
5. If an assembly is to be repairable, consideration must
be given to component/circuit density and the selection
of board/conformal coating materials. In general,
design should promote ease of package repair which
must be initiated by delidding.
3.1 Terms and Definitions Definitions of all terms used
herein shall be as specified in IPC-T-50 and as follows.
Abrasive trimming Trimming a film resistor to its nomi-
nal value by notching resistor with a finely adjusted stream
of an abrasive material, such as aluminum oxide, directly
against the resistor surface.
Active trim Trimming of a circuit element (usually a
resistor) in a circuit that is electrically activated and oper-
ating to obtain a specified functional output for the circuit
(see Functional trimming).
Add-on component Discrete or integrated prepackaged or
chip components that are attached to a film circuit to com-
plete the circuit functions.
Analog circuits Circuits that provide a continuous (vs.
discontinuous) relationship between the input and output.
Aspect ratio The ratio between the length of a film resis-
tor and its width; equal to the number of squares of the
resistor.
Back bonding Bonding active chips to the substrate
using the back of the chip, leaving the face, with its cir-
cuitry face up. The opposite of back bonding is face down
bonding.
Back mounting See Back bonding.
Ball bond A bond formed when a ball shaped end inter-
connecting wire is deformed by thermo-compression
against a metallized land; also called ‘‘a nail head bond’’
from the appearance of the flattened ball.
Beam lead A long structural member not supported
everywhere along its length and subject to the forces of
flexure, one end of which is permanently attached to a chip
device and the other end intended to be bonded to another
material, providing an electrical interconnection or
mechanical support or both.
Beam lead device An active or passive chip component
possessing beam leads as its primary interconnection and
mechanical attachment means to a substrate.
Bond An interconnection which performs a permanent
electrical and/or mechanical function.
Bond deformation The change in the form of the lead
produced by the bonding tool, causing plastic flow, in mak-
ing the bond.
IPC-D-859 December 1989
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