IPC-D-859.pdf - 第82页
IPC-859-6-20 Figure 6–20 Added test circuitry—conductor test G1-14 G20-38 H3 H2 H1 I3 I2 I1 E3 E2 E1 D3 D2 D1 A3 A2 A1 C3 C2 C1 B1-19 B20-38 F1 19 F20-38 E IPC-D-859 December 1989 76
IPC-859-6-19
Figure 6–19 Added test circuitry—capacitance test
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December 1989 IPC-D-859
75
IPC-859-6-20
Figure 6–20 Added test circuitry—conductor test
G1-14 G20-38
H3
H2
H1
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B1-19 B20-38
F1 19 F20-38
E
IPC-D-859 December 1989
76
Standard Improvement Form IPC-D-859
The purpose of this form is to provide the
Technical Committee of IPC with input
from the industry regarding usage of
the subject standard.
Individuals or companies are invited to
submit comments to IPC. All comments
will be collected and dispersed to the
appropriate committee(s).
If you can provide input, please complete
this form and return to:
IPC
2215 Sanders Road
Northbrook, IL 60062-6135
Fax 847 509.9798
1. I recommend changes to the following:
Requirement, paragraph number
Test Method number , paragraph number
The referenced paragraph number has proven to be:
Unclear Too Rigid In Error
Other
2. Recommendations for correction:
3. Other suggestions for document improvement:
Submitted by:
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