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1 - 36 S tudent Guide SIPLACE X 7 Sitest Ausgabe 02/2005 36 Note:
1 - 35
Student Guide SIPLACE X
Ausgabe 02/2005 7 Sitest
35
Axis data 7
Fig. 7.2 - 22 head modularity - axis data
(1) Here you can overwrite the Z- and star axis data from the head eprom to the machine data and
the other way round.
Function 7
Fig. 7.2 - 23 head modularity - function
(1) After the head was changed, it is possible to calibrate the changed head with help of the head
exchange menu. Of course it is also possible to calibrate the other heads with this function. Basicly
you can also calibrate the new head, and already installed heads in Sitest menu "Calibrate ma-
chine..." and then "All heads and cameras..."
(2) The same is valid here, see (1). After the head exchange you can directly do a head- map-
ping.You also find the function head- mapping in Sitest menu "Calibrate machine..." and then
"Head- Mapping".
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Student Guide SIPLACE X
Edition 02/2005 Contents
1
Chapter
Table of Contents
8 Siplace Vision . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
8.1 PCB Fiducials. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
8.1.1 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
8.1.2 Kind of illumination for fiducials. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
8.1.2.1 Fiducial arrangement on the PCB . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
8.1.3 Import fiducials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
8.1.4 Shape of fiducials for PCB position and placement position recognition. . . . . . . . . . . 5
8.1.5 Synthetic fiducials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
8.1.6 Pattern as fiducials . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
8.1.7 Bad mark recognition. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
8.1.8 Synthetic bad mark . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
8.1.9 Pattern for bad marks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
8.1.9.1 The histogram method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
8.1.9.2 The brightness method. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
8.1.9.3 Template-process for LASER-labeling. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12