MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第104页
MIL-STD-883F METHOD 1016.1 18 June 2004 6 FIGURE 1016-1. Cumulative f ailur e distr ibuti on plot .
MIL-STD-883F
METHOD 1016.1
18 June 2004
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h. Requirements for data analysis, including:
(1) Failure analysis results.
(2) Data calculations:
(a) Log normal by temperature.
(b) Reaction rate relationships
(c) Failure rate versus time.
MIL-STD-883F
METHOD 1016.1
18 June 2004
6
FIGURE 1016-1. Cumulative failure distribution plot
.
MIL-STD-883F
METHOD 1016.1
18 June 2004
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FIGURE 1016-2. Arrhenius plot - high temperature operating test - accelerated life
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