MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第499页

MIL-STD-883F METHOD 3010.1 15 November 1974 1 METHOD 3010.1 INPUT CURRENT, HIGH LEVEL 1. PURPOSE . This method est ablis hes the means for as suri ng cir cuit perfor mance to t he limi ts s pecif ied in the applic able a…

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MIL-STD-883F
METHOD 3009.1
15 November 1974
2
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MIL-STD-883F
METHOD 3010.1
15 November 1974
1
METHOD 3010.1
INPUT CURRENT, HIGH LEVEL
1. PURPOSE
. This method establishes the means for assuring circuit performance to the limits specified in the
applicable acquisition document in regard to HIGH level input load which may be specified as a maximum value (I
IH
max) or
a minimum value (I
IH
min). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
2. APPARATUS
. The test chamber shall be capable of maintaining the device under test at any specified temperature.
An instrument shall be provided that has the capability of applying the worst case HIGH voltage to the input terminal of the
test circuit, and worst case levels at the other inputs, and measuring the resultant current at the input terminal.
3. PROCEDURE
. The device shall be stabilized at the specified test temperature. Worst case power supply voltages and
worst case input voltages shall be applied to the test circuit and the resultant current at the input terminal shall be measured.
Inputs shall be tested individually.
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test temperature.
b. Power supply voltages.
c. Input voltage.
d. Input voltages at other input terminals which cause worst case current at the input under text.
e. I
IH
max.
MIL-STD-883F
METHOD 3010.1
15 November 1974
2
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