MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第580页
MIL-STD-883F METHOD 5001 20 November 1969 2 This page i ntenti onally lef t blank
MIL-STD-883F
METHOD 5001
20 November 1969
1
METHOD 5001
PARAMETER MEAN VALUE CONTROL
1. PURPOSE
. The purpose of this method is to define a technique for assuring a conformance to a maximum or
minimum mean of a parameter measured in any test method listed in section 3000 and 4000 of this standard. This method
is not intended for general application to acquisitions where it is important only to assure that device parameters are
between specified limits. It is intended for use only where it is necessary to control the average or mean value for a given
parameter throughout a lot of shipment of devices. When this method is employed, it is expected that the specified group of
devices tested will be packaged for shipment as a group together with the required data. It is also expected that some
provisions will be required for special marking of devices subjected to this method to identify that they have met the selection
criteria involved and that they are therefore not directly interchangeable with identical devices which have not been
controlled or selected in this manner.
2. APPARATUS
. For distribution control, it is desirable for the measuring equipment to have data logging capability in
addition to the capabilities listed in section 3000 and 4000. The data shall be recorded and analyzed to compute the
average value of a group of microelectronic devices. The size of the group shall be specified in the applicable acquisition
document.
3. PROCEDURE
. Microelectronic devices shall be separated into groups. Each group will be tested in accordance with
the specified test method. The reading from each device will be recorded. When all devices in the group have been tested,
the recorded data shall be averaged (or the mean value computed) and compared against a maximum or minimum limit
specified in the applicable acquisition document.
4. SUMMARY
. The following details must be specified in the applicable acquisition document:
a. Absolute maximum and minimum limits.
b. Maximum or minimum limits on the average or mean.
c. Group size.
d. Requirements for data logging, special marking, and special provisions for group packaging and shipment, where
applicable.
MIL-STD-883F
METHOD 5001
20 November 1969
2
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MIL-STD-883F
METHOD 5002.1
15 August 1984
1
METHOD 5002.1
PARAMETER DISTRIBUTION CONTROL
1. PURPOSE
. The purpose of this method is to define a technique for assuring a normal distribution for any test method
listed in the 3000 or 4000 series of this standard. This method is not intended for general application to acquisitions where it
is important only to assure that device parameters are between specified limits. It is intended for use only where it is
necessary to control the distribution of parameter values within the specified group. When this method is employed, it is
expected that the specified group of devices tested will be packaged for shipment as a group together with the required data.
It is also expected that some provisions will be required for special marking of devices subjected to this method to identify
that they have met the selection criteria involved and that they are therefore not directly interchangeable with identical
devices which have not been controlled or selected in this manner.
2. APPARATUS
. For distribution control, it is desirable for the measuring equipment, in addition to the capabilities listed
in section 3000 and 4000, to have the capability of rejecting and counting the devices above or below the specified extreme
limits, and to also separate and count the devices that fall above or below the sigma limits. If the equipment does not have
this capability, the units shall be read to the specified parameter conditions and the data recorded. Identification of units to
the data shall also be required. Data analysis and unit separation shall be hand performed in the case where automatic
equipment is not used.
3. PROCEDURE
. Microelectronic devices shall be separated into groups. Each group will be tested, in accordance with
the specific method for the maximum and minimum limits specified in the applicable acquisition document. All failures will
be removed from the original group. The remaining units will be tested for the following: Not less than 12 percent but not
greater than 18 percent of units tested will fall below the mean -1σ limit. Not greater than 18 percent but not less than 12
percent of units tested will fall above the mean +1σ limit.
4. SUMMARY
. The following details must be specified in the applicable acquisition document:
a. Absolute maximum and minimum limits.
b. Mean value.
c. +1σ and -1σ value.
d. Group size.
e. Requirements for data logging, special markings, and special provisions for packaging and shipment, where
applicable.