MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第361页
MIL-STD-883F METHOD 2020.8 18 June 2004 5 NOTES: 1. Pushbut ton swi tch: Mec hanic ally quiet , fast make, gol d contac ts. E.G. T2 SM4 mic ros witch. 2. Resi stanc e toler ance 5 perc ent noninduc tive. 3. Volt age sour…
MIL-STD-883F
METHOD 2020.8
18 June 2004
4
TABLE I. Package Height vs.Test Frequency for 20g Acceleration (condition A).
Note: The shaker drive test frequency (F) for condition A (see 3.1) is determined by the package internal cavity height
using the following formula:
F =
)]0511.0()/[(20 XD
where: D = Average internal package height (in inches).
20 is a constant in this application and is equal to sinusoidal acceleration of 20g.
F is the shaker drive test frequency (in Hz)
Based on the formula above, the following table is generated:
Average Internal Cavity Height Test Frequency
Mils mm inches Hz
30 0.76 0.030 114
40 1.02 0.040 99
50 1.27 0.050 88
60 1.52 0.060 81
70 1.78 0.070 75
80 2.13 0.080 70
90 2.29 0.090 66
100 2.54 0.100 63
110 2.79 0.110 60
Example calculation:
Assume an average internal cavity height of 70 Mils.
F =
)]0511.0()/[(20 XD
D = 70 Mils converted to inches = .070 inches.
F =
])0511.0()070/[(.20 X
=
]00358/[.20
=
5586
= 75 Hz
4. SUMMARY
. The following details shall be specified in the applicable acquisition document:
a. Test condition letter A or B.
b. Lot acceptance/rejection criteria (if other than specified in 3.5).
c. The number of test cycles, if other than one.
d. Pre-test shock level and co-test shock level, if other than specified.
*
MIL-STD-883F
METHOD 2020.8
18 June 2004
5
NOTES:
1. Pushbutton switch: Mechanically quiet, fast make, gold contacts. E.G. T2 SM4 microswitch.
2. Resistance tolerance 5 percent noninductive.
3. Voltage source can be a standard dry cell.
4. The coupled transducers must be coaxial during test.
5. Voltage output to STU transducer 250 microvolts, ±20 percent.
FIGURE 2020-1 Typical sensitivity test unit
.
MIL-STD-883F
METHOD 2020.8
18 June 2004
6
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