MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第106页
MIL-STD-883F METHOD 1016.1 18 June 2004 8 FIGURE 1016-3. Lognormal fai lure r ates . TIME = MEDIAN LIFE , (T 1 )
MIL-STD-883F
METHOD 1016.1
18 June 2004
7
FIGURE 1016-2. Arrhenius plot - high temperature operating test - accelerated life
.
MIL-STD-883F
METHOD 1016.1
18 June 2004
8
FIGURE 1016-3. Lognormal failure rates
.
TIME = MEDIAN LIFE, (T
1
)
MIL-STD-883F
METHOD 1017.2
25 August 1983
1
METHOD 1017.2
NEUTRON IRRADIATION
1. PURPOSE
. The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to
degradation in the neutron environment. The tests described herein are applicable to integrated circuits, transistors, and
diodes. This is a destructive test. Objectives of the test are: (1) to detect and measure the degradation of critical
semiconductor device parameters as a function of neutron fluence, and (2) to determine if specified semiconductor device
parameters are within specified limits after exposure to a specified level of neutron fluence (see section 4).
2. APPARATUS
.
2.1 Test instruments
. Test instrumentation to be used in the radiation test shall be standard laboratory electronic test
instruments such as power supplies, digital voltmeters, and picoammeters, etc., capable of measuring the electrical
parameters required. Parameter test methods and calibration shall be in accordance with MIL-STD-883 or MIL-STD-750,
whichever is applicable.
2.2 Radiation source
. The radiation source used in the test shall be in a TRIGA Reactor or a Fast Burst Reactor.
Operation may be in either pulse or steady-state mode as appropriate. The source shall be one that is acceptable to the
acquiring activity.
2.3 Dosimetry equipment
.
a. Fast-neutron threshold activation foils such as
32
S,
54
Fe, and
58
Ni.
b. CaF
2
thermoluminescence dosimeters (TLDs).
c. Appropriate activation foil counting and TLD readout equipment.
2.4 Dosimetry measurements
.
2.4.1 Neutron fluences
. The neutron fluence used for device irradiation shall be obtained by measuring
the amount of radioactivity induced in a fast-neutron threshold activation foil such as
32
S,
54
Fe, or
58
Ni, irradiated
simultaneously with the device.
A standard method for converting the measured radioactivity in the specific activation foil employed into a neutron fluence is
given in the following Department of Defense adopted ASTM standards:
E263 - Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of
Iron.
E264 - Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of
Nickel.
E265 - Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of
Sulfur.