MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第510页
MIL-STD-883F METHOD 3013.1 15 November 1974 6 FIGURE 3013-2. Invert ing logic gate tr ansfer charac ter ist ic defi ning tes t point s .
MIL-STD-883F
METHOD 3013.1
15 November 1974
5
FIGURE 3013-1. Definitions of noise pulse width
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MIL-STD-883F
METHOD 3013.1
15 November 1974
6
FIGURE 3013-2. Inverting logic gate transfer characteristic defining test points
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MIL-STD-883F
METHOD 3013.1
15 November 1974
7
FIGURE 3013-3. Noninverting logic gate transfer characteristic defining test points
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