MIL- STD-883F 2004 TEST METHOD STANDARD MICROCIRCUITS.pdf - 第180页

MIL-STD-883F METHOD 1034.1 18 June 2004 6 This page i ntenti onally lef t blank

MIL-STD-883F

METHOD 1034.1

18 June 2004

3.1.6 Crosssectioning

a. Normal crosssectioning procedures can be performed on the samples.

b. Make sure that stray particles of dye do not smear or become embedded in the cross-sectioned surfaces. This

will give you a false representation of the dye in the sample. (Smearing looks like little stars when viewed through

the ultraviolet filtering.) Be sure to clean the samples thoroughly after grinding and polishing operations to avoid

these complications.

3.1.7 Viewing crosssections on a microscope

. The exposure time will vary from sample to sample and from microscope

to microscope. The best scope for viewing dye penetration will have a bright light source (200 W mercury lamp).

a. View the crosssection under normal bright field conditions. To take a photo, use the green filter, set the proper

exposure, then take the photo using Polaroid 52 film (ASA 400).

b. Slide out the bright field mirror cube.

c. For the Olympus PMG3, slide in the blue excitation fluorescence cube (BH2-UDMB). For the Polyvar, remove the

B1 filter from the filter box and insert it into the left hand side of the Polyvar.

d. Remove the green viewing filter. The fluorescence of the dye will be difficult to see if the filter is in place.

e. Insert the Polaroid 57 film. Though the ASA for 57 film is 3200, leave the ASA at 400 to take the photo. This will

give you a good approximation for the proper exposure. Make adjustments as necessary to obtain the desired

exposure. The exposure time will vary depending upon the amount of fluorescent dye there is in frame.

3.2 Die penetrant evaluation criteria

. The following cross sections or other relevant cross sections shall be evaluated.

a. One cross section on the long axis of the package (examine tie bar)

b. Three cross sections on the short axis (examine shortest lead, die or paddle edge, and one other).

As a minimum the following criteria shall be used for evaluation and any discrepancies shall be reported:

a. Any evidence of fracture or other packaging related defects.

b. Any evidence of delamination.

c. Any evidence of dye reaching the die attach or die surface.

d. Any evidence of dye penetration of more than 50 percent at a lead egress.

e. Any evidence of dye penetration of more than 50 percent of the length of any lead in the package.

4. SUMMARY

. The following details shall be specified in the applicable acquisition document.

a. Any failure criteria different than that specified in 3.2.

b. Test sample if no sample is specified.

MIL-STD-883F

METHOD 1034.1

18 June 2004

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MIL-STD-883F

METHOD 2001.2

31 August 1977

METHOD 2001.2

CONSTANT ACCELERATION

1. PURPOSE

. This test is used to determine the effects of constant acceleration on microelectronic devices. It is an

accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and

vibration tests. It may be used as a high stress test to determine the mechanical limits of the package, internal metallization

and lead system, die or substrate attachment, and other elements of the microelectronic device. By establishing proper

stress levels, it may also be employed as an in-line 100 percent screen to detect and eliminate devices with lower than

nominal mechanical strengths in any of the structural elements.

2. APPARATUS

. Constant acceleration tests shall be made on an apparatus capable of applying the specified

acceleration for the required time.

3. PROCEDURE

. The device shall be restrained by its case, or by normal mountings, and the leads or cables secured.

Unless otherwise specified, a constant acceleration of the value specified shall then be applied to the device for 1 minute in

each of the orientations X

, X

, Y

, Z

, and Z

. For devices with internal elements mounted with the major seating plane

perpendicular to the Y axis, the Y

orientation shall be defined as that one in which the element tends to be removed from its

mount. Unless otherwise specified, test condition E shall apply.

Test condition

Stress level (g)

A 5,000

B 10,000

C 15,000

D 20,000

E 30,000

F 50,000

G 75,000

H 100,000

J 125,000

4. SUMMARY

. The following details shall be specified in the applicable acquisition document:

a. Amount of acceleration to be applied, in gravity units (g) if other than test condition E (see 3).

b. When required, measurements to be made after test.

c. Any variations in duration or limitations to orientation (e.g., Y

only) (see 3).

d. Sequence of orientations, if other than as specified (see 3).