00197723-12_UG_SE3.11_EN.pdf - 第56页
4 Functions Overview SMA Guide SIPLACE Explorer Edition 11/2020 EN from 3.11 (R20-2) 56 The following procedures can be performed on this p age and are described in this SMA User G uide: “How to S pecify the Gener atio…
SMA Guide SIPLACE Explorer 4 Functions Overview
from 3.11 (R20-2) Edition 11/2020 EN
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The following information categories exist: 4
– Critical Error
The problem must be fixed before data monitoring can continue. 4
– Data loss
The problem must be fixed. Data monitoring will continue before the problem is fixed but
the data will not be complete. 4
– Notification
The problem must not be fixed. However, if you ignore this problem, there may be
inconsistencies between the data in the various databases. 4
– Open Warnings - Tabular View
After fixing the problem, the warning will be removed from the Active Warnings table and the
warning will be displayed in the Warning History table. 4
An explanation of each column: 4
–Station
Shows the station the warning is related to. 4
–Time
Shows the timestamp (time and date), when the warning was generated. 4
–Description
Shows a text describing the warning. 4
– Warning History - Tabular View: An explanation of each column
–Station
Shows the station the warning is related to. 4
–Time
Shows the timestamp (time and date), when the warning was generated. 4
– Cleared at
Shows the timestamp (time and date), when the warning was fixed. 4
–Description
Shows a text describing the warning. 4
4 Functions Overview SMA Guide SIPLACE Explorer
Edition 11/2020 EN from 3.11 (R20-2)
56
The following procedures can be performed on this page and are described in this SMA
User Guide:
“How to Specify the Generation of Line Reports” on page 90
“How to Sort Tables” on page 96
“How to Enable Legends” on page 96
4.1.12 OLE / OEE Summary
This page shows a summary of the OLE/OEE values. 4
It is possible to analyze the efficiency of a production line with the OLE/OEE values. You can also
manually define a quality factor. 4
– Overall Equipment Efficiency (OEE)
This value determines the efficiency on an equipment level e.g. a SIPLACE station
– Overall Line Efficiency (OLE)
This value determines the efficiency on a line level
OEE is an all-inclusive measurement of semiconductor equipment and manufacturing productiv-
ity. OEE approaches the problem of equipment manufacturing complexity with a methodology to
deduce and implement permanent productivity improvement. Initially, these corrective action
methods are best applied to bottleneck equipment that constrain the entire factory’s productivity. 4
SMA Guide SIPLACE Explorer 4 Functions Overview
from 3.11 (R20-2) Edition 11/2020 EN
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4
Fig. 4 - 13 OLE / OEE summary
This page contains two bar charts with legends, in which the OLE/OEE values are summarized:4
– Display OLE/OEE
– Display of achieved availability during the evaluation period
– Display of achieved performance during the evaluation period
– Display of achieved quality during the evaluation period
– Display of OLE during the evaluation period
This diagram can be shown by hours, days or weeks. 4
– Display Factor
Percentage display of OEE value for each machine in the line, during the evaluation period
This diagram can be shown by OEE, availability or performance. 4