IPC-T-50F_.pdf.pdf - 第102页

76.1 188 Nonpolar Matter 76.1454 Nonpolar Solvent 76.0802 Occluded Contaminant 76.0803 Occlusion 76.1 196 Organic Contamination 76.0815 Overcoat 76.0820 Oxygen Concentration Cell 76.0833 Passive-Active Cell 76.0883 Polar…

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75.0959 Solder Ball
75.1767 Solder Bath
75.0960 Solder Bridging
75.0963 Solder Connection
75.0964 Solder Connection Pinhole
75.0966 Solder Embrittlement
75.0967 Solder Fillet
75.1766 Solder Meniscus
75.0974 Solder Plug
75.0975 Solder Projection
75.0979 Solder Spatter
75.0981 Solder Webbing
75.0982 Solder Wicking
75.0957 Solder-Paste Flux
75.0958 Solderability
75.0968 Soldering
75.0970 Soldering Flux
75.1768 Soldering Iron
75.0971 Soldering Iron Tip
75.1529 Soldering Oil (Blanket)
75.0969 Soldering-Ability
75.1530 Solderless Wrap
75.0997 Specific Solderability
75.1533 Staking, Mechanical
75.1019 Step Soldering
75.1036 Surface Tension
75.1038 Synthetic Activated Flux
75.1039 Synthetic Resin
75.1041 TAB
75.1044 Tail Pull
75.1043 Tail, Bonding
75.1045 Tape
75.1046 Tape Automated Bonding
75.1048 Temperature Profile
75.1064 Tetrafunctional Resins
75.1070 Thermode
75.1101 Transfer Soldering
75.1121 Ultrasonic Soldering
75.1557 Vapor-Phase Soldering
75.1150 Water-Soluble Organic Flux
75.1152 Wave Soldering
75.1159 Wetting, Solder
75.1162 Wicking
75.1166 Wipe Soldering
75.1170 Wire Wrap
75.1568 Working Time
76 Cleaning and Conformal Coating Processes
76.0031 Aliphatic Solvents
76.0032 Alkaline Cleaner
76.0110 Biocide
76.0153 Bubble Effect
76.0154 Buffer Material
76.0197 Chelate Compound
76.0198 Chelating Agent
76.0224 Cold Hand Cleaning
76.0225 Cold Machine Cleaning
76.0233 Complex Ion
76.0263 Conformal Coating
76.0283 Contamination Host Material
76.0299 Corrosion (Chemical/Electrolytic)
76.0313 Crazing (Conformal Coating)
76.1371 Critical Humidity
76.0322 Critical Solution Temperature
76.0372 Dibasic Acid
76.1221 Dilution Ratio
76.0384 Diphase Cleaning
76.0386 Direct Cleaning
76.0387 Direct Current Cleaning
76.0429 Electrolytic Cleaning
76.0437 Emulsifying Agent
76.0438 Emulsifying Oil
76.0439 Emulsion
76.0440 Encapsulant
76.1744 Ethanol
76.0455 Eutrophication
76.1317 Exchange Reaction
76.0460 Exfoliation
76.0463 Extraction, Liquid-Liquid
76.0476 Fatty Acid
76.0477 Fatty Ester
76.0495 Filiform Corrosion
76.1397 Final Seal
76.1401 Flash Distillation
76.0534 Flocculant
76.0535 Flocculation
76.0542 Flux Characterization
76.0543 Flux Residue
76.1402 Flux-Spatter Test
76.1410 Galvanic Corrosion
76.0584 Halide Content
76.0603 Heterocyclic
76.0615 Homocyclic
76.0616 Homologous Series
76.0617 Homopolymer
76.0621 Hydrocarbon Tolerance
76.0622 Hydrolytic Stability
76.0623 Hydrophilic Matter
76.0624 Hydrophilic Solvent
76.0625 Hydrophobic Matter
76.0626 Hydrophobic Solvent
76.0627 Hydrotrope
76.0628 Hydrotrophe
76.0629 Hypersorption
76.0655 Intergranular Corrosion
76.0661 Ion Exchange
76.0663 Ionic Cleanliness
76.1222 Ionizable (Ionic) Contamination
76.0725 Loop Height
76.0724 Loop Wire
76.1225 Lyophilic
76.0730 Lyophobic
76.1814 Mealing
76.1758 Montreal Protocol
76.1187 Nonionic Contaminant
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76.1188 Nonpolar Matter
76.1454 Nonpolar Solvent
76.0802 Occluded Contaminant
76.0803 Occlusion
76.1196 Organic Contamination
76.0815 Overcoat
76.0820 Oxygen Concentration Cell
76.0833 Passive-Active Cell
76.0883 Polar Matter
76.1815 Polar Solvent
76.1480 Polymer Reversion
76.0885 Polymerized Rosin
76.1245 Residue
76.1253 Reverse Current Cleaning
76.1276 Saponifier
76.0985 Solvent
76.0986 Solvent Cleaning
76.1531 Solvent Extraction
76.0987 Solvent Pop
76.0988 Solvent Release
76.0989 Solvent Wash
76.1011 Stain Proofing
76.1535 Standard (Electrode) Potential
76.1774 Terpenes
76.1081 Thinner (Liquid)
76.1113 Tuberculation
76.1120 Ultrasonic Cleaning
76.1569 Wrinkles
77 Rework, Repair and Modification
77.0464 Extraction Tool
77.0494 Field Trimming
77.0667 Kerf
77.1433 L Cut
77.0682 Laser Trimming
77.0774 Modification
77.1502 Repair(ing)
77.1511 Rework
77.1293 Serpentine Cut
77.1108 Trimming
77.1109 Trimming Notch
79 Other (Assembly Process Issues)
79.1806 Capability Performance Index (Cp)
8 Types and Performance of Assemblies
80 General (Assembly Type and Performance Issues)
80.1327 Assembly
80.0057 Assembled Board
80.0401 Double-Sided Assembly
80.0503 Fine-Pitch Technology (FPT)
80.0775 Module
80.0787 Multilayer Printed Circuit Board Assembly
80.0789 Multilayer Printed Wiring Board Assembly
80.0911 Printed Board Assembly
80.0913 Printed Circuit Board Assembly
80.0917 Printed Wiring Board Assembly
80.0944 Single-sided Assembly
83 Inorganic (Ceramic, Metal Core etc.) Printed Board
Assemblies
83.1417 Hybrid Circuit
83.1418 Hybrid Integrated Circuit
83.1419 Hybrid Microcircuit
83.1073 Thick-Film Circuit
83.1074 Thick-Film Hybrid Circuit
83.1075 Thick-Film Network
83.1076 Thin-Film Hybrid Circuit
83.1077 Thin-Film Integrated Circuit
83.1078 Thin-Film Network
85 Backplanes
85.0080 Backpanel
85.1331 Backplane
85.0778 Mother Board
86 Multichip Modules
86.0207 Chip-on-Board (COB)
86.1446 Microcircuit Module
86.0782 Multichip Integrated Circuit
86.0783 Multichip Microcircuit
86.0784 Multichip Module (MCM)
9 Quality and Reliability, Fabrication and Assembly
90 General (Quality and Reliability Issues)
90.0003 Acceptable Quality Level (AQL)
90.0007 Accuracy
90.0018 Actual Size
90.0025 Aging
90.0308 Crack, Foil
90.0309 Crack, Plating
90.0310 Cracking
90.0348 Defect
90.0349 Defect Identification
90.0351 Degradation
90.0353 Dendritic Growth
90.0354 Dendritic Migration
90.0359 Dentrices
90.0478 Fault
90.0479 Fault Dictionary
90.0637 Inclusions
90.1501 Reliability
90.1526 Shelf Life
90.1029 Structurally-Similar Construction
90.1087 Through Migration
90.1140 Void
91 Process Control/SPC
91.0024 Advanced Statistical Method
91.0033 Alpha Error
91.0038 Analysis of Variance (ANOVA)
91.0059 Assignable Cause
91.1336 Basic Statistical Method
91.0104 Beta Error
91.1344 Capability Performance, Upper (Cpku)
91.1367 Capability Performance, Lower (Cpkl)
91.0306 Capability Index (Cp)
91.0190 Central Line
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91.0229 Common Cause
91.0290 Control Limits
91.1368 Control Chart
91.0307 Cpk Index (Cpk)
91.0321 Critical Operation
91.0333 Cusum Chart
91.0367 Detection
91.0465 Extraneous Metal
91.0481 Fault Localization
91.0492 Fiber Exposure
91.0511 First Article
91.0510 First-Pass Yield
91.0515 Fishbone Diagram
91.1399 Fixed-Effect Model
91.0527 Flexural Failure
91.0550 Fractional-Factorial Experiment
91.0567 Generative Process Planning
91.0608 Histogram
91.0630 Hypotheses Test
91.0632 Identical Processing
91.0649 Inspection Overlay
91.0674 Laminate Void
91.1434 Larger-the-Better Characteristic
91.0722 Long-Term Capability
91.1442 Lot Size
91.0767 Minor Defect
91.0772 Mixed-Effects Model
91.0781 Multi-Vari
91.0790 Multilevel Experiment
91.0791 Multiple Indications
91.1182 Noise (Process Control)
91.1450 Nominal-Is-Best Characteristic
91.1455 Null Hypothesis
91.1458 Orthogonal-Array Experiment
91.1228 Output Vector
91.0842 Percent Contribution
91.1478 Poisson Distribution
91.0895 Power of Experiment
91.0920 Process Average
91.0921 Process Indicator
91.0922 Process Spread
91.0927 Pure Sum of Squares
91.1311 Random Sample
91.1497 Random-Effects Model
91.1309 Randomization
91.1310 Randomness
91.1314 Reciprocity Failure
91.1498 Reciprocity Law
91.1241 Regression Analysis
91.1503 Repeatability (Accept/Reject) Decisions
91.1251 Response Variable
91.1268 Run (n.)
91.1269 Run Chart
91.1519 Sensitivity Control
91.1302 Short-Term Capability
91.0933 Signal-to-Noise Ratio (Process Control)
91.1817 Smaller-the-Better Characteristic
91.0995 Special Cause
91.0996 Specification Limits
91.1002 Spread (Values)
91.1008 Stability
91.1010 Stable Process
91.1534 Standard Deviation of a Population
91.1015 Statistical Control
91.1016 Statistical Hypothesis
91.1536 Statistical Process Control (SPC)
91.1017 Statistical Quality Control (SQC)
91.0140 Subgroup
91.1210 Sum of Squares
91.1117 Type I Error
91.1132 User Inspection Lot (Material)
91.1134 Variables Data
91.1135 Variance
91.1558 Vendor Inspection Lot (Material)
91.1136 Verification Time
91.1138 Virtual Condition
92 Inspection/Testing
92.0066 AWG Equivalent
92.0004 Acceptance Tests
92.0043 Apparent Field-of-View Angle
92.0047 Arc Resistance
92.0064 Automatic Test Equipment
92.0065 Automatic Test Generation
92.0074 Backdriving
92.0089 Base Solderability
92.0097 Baume
92.0101 Bed-of-Nails Fixture
92.0103 Benchmark, Testing
92.0109 Biochemical Oxygen Demand
92.0157 Bulk Conductance
92.0172 Camber
92.0247 Conditioning
92.0284 Continuity
92.0294 Coordinatograph
92.0296 Copper-Mirror Test
92.0302 Coupon
92.1220 Coupon (Breakaway)
92.0314 Crease
92.0324 Cross-Sectioning
92.0389 Discrepant Material
92.0403 Download, Tester
92.0411 Dual Fixture
92.0415 Edge Definition
92.0416 Edge Detection
92.0459 Exclusion Area
92.0471 False Alarm
92.0472 False Alarm Rate
92.0480 Fault Isolation
92.0482 Fault Masking
92.0483 Fault Modes
92.0484 Fault Resolution
92.0485 Fault Signature
92.1396 Fault Simulation
92.0519 Fixture, Test
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