IPC-T-50F_.pdf.pdf - 第104页
92.0556 Functional T ester 92.0570 Go-No-Go T est 92.0571 Golden Assembly 92.0572 Golden Board 92.0573 Gouge 92.0576 Gray-Scale Processing 92.0582 Guarding 92.0607 Hipot T est 92.0636 In-Circuit T esting 92.1790 Individu…
91.0229 Common Cause
91.0290 Control Limits
91.1368 Control Chart
91.0307 Cpk Index (Cpk)
91.0321 Critical Operation
91.0333 Cusum Chart
91.0367 Detection
91.0465 Extraneous Metal
91.0481 Fault Localization
91.0492 Fiber Exposure
91.0511 First Article
91.0510 First-Pass Yield
91.0515 Fishbone Diagram
91.1399 Fixed-Effect Model
91.0527 Flexural Failure
91.0550 Fractional-Factorial Experiment
91.0567 Generative Process Planning
91.0608 Histogram
91.0630 Hypotheses Test
91.0632 Identical Processing
91.0649 Inspection Overlay
91.0674 Laminate Void
91.1434 Larger-the-Better Characteristic
91.0722 Long-Term Capability
91.1442 Lot Size
91.0767 Minor Defect
91.0772 Mixed-Effects Model
91.0781 Multi-Vari
91.0790 Multilevel Experiment
91.0791 Multiple Indications
91.1182 Noise (Process Control)
91.1450 Nominal-Is-Best Characteristic
91.1455 Null Hypothesis
91.1458 Orthogonal-Array Experiment
91.1228 Output Vector
91.0842 Percent Contribution
91.1478 Poisson Distribution
91.0895 Power of Experiment
91.0920 Process Average
91.0921 Process Indicator
91.0922 Process Spread
91.0927 Pure Sum of Squares
91.1311 Random Sample
91.1497 Random-Effects Model
91.1309 Randomization
91.1310 Randomness
91.1314 Reciprocity Failure
91.1498 Reciprocity Law
91.1241 Regression Analysis
91.1503 Repeatability (Accept/Reject) Decisions
91.1251 Response Variable
91.1268 Run (n.)
91.1269 Run Chart
91.1519 Sensitivity Control
91.1302 Short-Term Capability
91.0933 Signal-to-Noise Ratio (Process Control)
91.1817 Smaller-the-Better Characteristic
91.0995 Special Cause
91.0996 Specification Limits
91.1002 Spread (Values)
91.1008 Stability
91.1010 Stable Process
91.1534 Standard Deviation of a Population
91.1015 Statistical Control
91.1016 Statistical Hypothesis
91.1536 Statistical Process Control (SPC)
91.1017 Statistical Quality Control (SQC)
91.0140 Subgroup
91.1210 Sum of Squares
91.1117 Type I Error
91.1132 User Inspection Lot (Material)
91.1134 Variables Data
91.1135 Variance
91.1558 Vendor Inspection Lot (Material)
91.1136 Verification Time
91.1138 Virtual Condition
92 Inspection/Testing
92.0066 AWG Equivalent
92.0004 Acceptance Tests
92.0043 Apparent Field-of-View Angle
92.0047 Arc Resistance
92.0064 Automatic Test Equipment
92.0065 Automatic Test Generation
92.0074 Backdriving
92.0089 Base Solderability
92.0097 Baume
92.0101 Bed-of-Nails Fixture
92.0103 Benchmark, Testing
92.0109 Biochemical Oxygen Demand
92.0157 Bulk Conductance
92.0172 Camber
92.0247 Conditioning
92.0284 Continuity
92.0294 Coordinatograph
92.0296 Copper-Mirror Test
92.0302 Coupon
92.1220 Coupon (Breakaway)
92.0314 Crease
92.0324 Cross-Sectioning
92.0389 Discrepant Material
92.0403 Download, Tester
92.0411 Dual Fixture
92.0415 Edge Definition
92.0416 Edge Detection
92.0459 Exclusion Area
92.0471 False Alarm
92.0472 False Alarm Rate
92.0480 Fault Isolation
92.0482 Fault Masking
92.0483 Fault Modes
92.0484 Fault Resolution
92.0485 Fault Signature
92.1396 Fault Simulation
92.0519 Fixture, Test
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92.0556 Functional Tester
92.0570 Go-No-Go Test
92.0571 Golden Assembly
92.0572 Golden Board
92.0573 Gouge
92.0576 Gray-Scale Processing
92.0582 Guarding
92.0607 Hipot Test
92.0636 In-Circuit Testing
92.1790 Individual Test Specimen (ITS)
92.0648 Input Vector
92.1421 Inspection Facility
92.1422 Inspection Lot
92.0650 Inspection Personnel
92.0651 Inspection Rate
92.0652 Inter-Test Time (ITT)
92.0670 Known Good Assembly (KGA)
92.0671 Known Good Board (KGB)
92.0700 Learn Time
92.0714 Load Time
92.0733 Magnification Power
92.0750 Meniscus
92.0760 Microprobe
92.1447 Microsectioning
92.0792 Nail
92.0799 Neighborhood Processing
92.0812 Open, Electrical (n.)
92.0841 Peel Strength
92.0843 Percent of the Field of View
92.0234 Personality Plate
92.0863 Pinhole (Material)
92.0866 Pit
92.1476 Plated-Through Hole Structure Test
92.0901 Pregelation Particle
92.0909 Primary Stage of Manufacture
92.0919 Probe Point
92.0918 Probe, Test
92.1492 Profile Factor
92.0924 Proportional Dimensions
92.0925 Pull Strength
92.1214 Qualitative Analysis
92.1495 Quality-Conformance Test Circuitry
92.1215 Quantitative Analysis
92.1244 Repeat Set-Up Time
92.1250 Resistor Drift
92.1271 Run Time
92.0755 Scan Rate
92.1278 Scan-Dead Time
92.0693 Scanner, Test
92.1203 Scratch
92.1287 Self Test
92.1522 Set-Up Time
92.1298 Shear Strength
92.1765 Shear Test
92.1524 Sheet Capacitance
92.1525 Sheet Resistance
92.1301 Short, Electrical (n.)
92.0938 Silver Migration
92.0939 Simulated Aging
92.0940 Simulated Datum
92.1819 Solder Spread Test
92.1769 Specimens
92.1005 Spurious Metal
92.1771 Substrate Bending Test
92.1538 Surface Insulation Resistance (SIR)
92.1683 Test Board
92.1820 Test Coupon
92.1057 Test Language
92.1058 Test Master
92.1059 Test Pattern
92.1060 Test Point
92.1061 Test Program
92.1062 Test Set
92.1063 Test Step
92.1056 Testing Personnel
92.1090 Titrometry
92.1097 Touch-Up
92.1548 Treatment Transfer
92.1123 Unconditional Test
92.1124 Undercut, After Fabrication
92.1125 Undercut, In Process
92.1128 Unload Time
92.1130 Upload (Test)
92.1137 Vesical
92.1560 Vesication
92.1561 Vesicativity Ratio
92.1139 Visual Examination
92.1144 Volumetric Analysis
92.1160 Wetting Balance
92.1161 Whisker
92.1566 White Spot
93 Reliability Factors and Methodology
93.0001 Accelerated Aging
93.1324 Alternative Hypothesis
93.0096 Bathtub Curve
93.0461 Experimental Error
93.0552 F Ratio
93.1403 Forced-Field Analysis
93.0923 Producer’s Risk
94 Quality Management and Assurance
94.0062 Attributes Data
94.0077 Background Variable
94.0108 Binomial Distribution
94.0116 Blocking Variables
94.0147 Brainstorming
94.1785 Capability Test Segment
94.1784 Capability Test Board (CTB)
94.0188 Cause-and-Effect Diagram
94.1219 Check List
94.0195 Check Plot
94.0196 Check Sheet
94.1365 Confidence Interval
94.0262 Confirmation Run
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94.0264 Confounding
94.0274 Consumer’s Risk
94.0301 Cost of Quality
94.0320 Critical Defect
94.0352 Degrees of Freedom (df)
94.0448 Escape Rate
94.0449 Escapes
94.0468 F (Fisher) Test
94.0470 Factorial Experiment
94.1807 Gaussian Distribution
94.0734 Major Defect
94.1191 Normal Distribution
94.0830 Pareto Analysis
94.1212 Qualification Agency
94.1213 Qualification Testing
94.1496 Quality Conformance Testing
94.1777 Risk Management Factor (RMF)
94.0991 Scatter Diagram
94.0931 Sigma (()
94.1118 Type II Error
94.1126 Underwriters Symbol
94.1163 Window
94.1165 Window (Process)
95 Component Quality and Reliability
95.0164 Burn-In
95.0165 Burn-In, Dynamic
95.0166 Burn-In, Static
95.0504 Fine Leak
95.0580 Gross Leak
95.1750 Immersion Conditions
95.1755 Mechanical Stress
95.1024 Stress Corrosion Cracking
96 Interconnection Structure Quality and Reliability
96.0020 Adhesion Failure
96.0023 Adsorbed Contaminant
96.1340 Blister
96.1349 Circumferential Separation
96.0222 Cohesion Failure
96.0277 Contact Corrosion
96.0278 Contact Length
96.0280 Contact Retention Force
96.0474 Fatigue Life
96.0475 Fatigue Limit
96.1394 Fatigue Strength
96.1395 Fatigue-Strength Reduction Factor (Kf)
96.1445 Metal Migration
96.0754 Metal Migrativity
96.1226 Metal Surface Migration
96.0662 Metal Through Migration
96.0763 Migration Rate
96.0764 Migration Velocity
96.1510 Reversion
96.0950 Sliver
96.1000 Spotting Out
96.1208 Subsurface Corrosion
97 Electronic Assembly/Subassembly Quality and
Reliability
97.0226 Cold Solder Connection
97.0317 Crevice Corrosion
97.0370 Dewetting
97.1384 Disturbed Solder Connection
97.0563 Gas-Tight Area
97.0599 Heel Break
97.0600 Heel Crack
97.1424 Insufficient Solder Connection
97.0657 Intermittent Fault
97.1816 Pull-Out Strength
97.0928 Push-Off Strength
97.0993 Spalling ??
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