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MI L - S TD - 202 - 30 6 M E TH O D 30 6 Q U A L I T Y F A C T O R ( Q ) 1. SCOPE 1. 1 P urpose . T he pur po s e o f t hi s t es t i s t o m ea s ur e t he qua l i t y f ac t or , c om m on l y c al l ed Q , of electr o…

MIL-STD-202-306

CONTENTS

PARAGRAPH PAGE

FOREWORD…………………………………………………………. ii

1. SCOPE 1

1.1 Purpose………………………………………….……..…………. 1

2. APPLICABLE DOCUMENTS 1

3. DEFINTIONS 1

4. GENERAL REQUIREMENTS 1

4.1 Procedure…………..…….………………………..….….…..….. 1

5. DETAILED REQUIREMENTS 1

5.1 Summary…………………………………………..…..…………. 1

6. NOTES 2

6.1 Supersession data………………………………………………. 2

iii

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MIL-STD-202-306

METHOD 306

QUALITY FACTOR (Q)

1. SCOPE

1.1 Purpose. The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such

as capacitors and inductors. By definition, the factor Q expresses the ratio of reactance to effective resistance of a

circuit element. This numerical ratio is considered a "figure of merit" for a reactive component (or a resonant circuit

utilizing such components) as it is a measure of the ability of the component (or circuit) to store energy compared to

the energy it wastes. For this reason, Q is called "storage factor". Q is thus equal to the inverse of the dissipation

factor. Relationship also exists between Q and the properties of a tuned circuit, such as the resonant rise in voltage

phenomena. Each of the relationships involving Q mentioned above can be applied to the direct or indirect

measurement of Q.

2. APPLICABLE DOCUMENTS

This section not applicable to this standard.

3. DEFINTIONS

This section not applicable to this standard.

4. GENERAL REQUIREMENTS

4.1. Procedure. The quality factor or Q of the specimen shall be measured using a suitable instrument providing

an accuracy of measurement within 10 percent of the specified value of Q. Measurements shall be made at the

specified frequency. Suitable measurement techniques shall be used to minimize errors due to the connections

between the measuring apparatus and the specimen.

5. DETAILED REQUIREMENTS

5.1. Summary. The following details are to be specified in the individual specification:

a. Test frequency (see 4.1).

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MIL-STD-202-306

6. NOTES

(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)

6.1 Supersession data. The main body and 38 parts of this revision of MIL-STD-202 replace superseded MIL-STD-

202.

Custodians: Preparing activity:

Army - CR DLA – CC

Navy - EC

Air Force - 85 (Project 59GP-2015-036)

DLA - CC

Review activities:

Army - AR, AT, AV, CR4, MI, SM, TE

Navy - AS, OS, SH

Air Force - 19, 99

NSA - NS

NOTE: The activities listed above were interested in this document as of the date of this document. Since

organizations and responsibilities can change, you should verify the currency of the information above using the

ASSIST Online database at https://assist.dla.mil/

北测（上海）电子科技有限公司

联系方式：xuyj@beice-sh.com 13917165676