MIL-STD-202H.pdf - 第284页

MI L - S TD - 202 -3 10 CO NT E N T S PARAGRAPH PAG E FOREW ORD … ………………………………………………………. ii 1. SCOPE 1 1.1 Purpose …… ………………… …………………. …… .. …………. 1 2. APPLICABLE D O C U M EN T S 1 3. DEFINTIONS 1 4. GENERAL RE Q UI R E…

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MIL-STD-202-310
FOREWORD
1. This standard is approved for use by all Departments and Agencies of the Department of Defense.
2. This entire standard has been revised. This revision has resulted in many changes to the format, but the most
significant one is the splitting the document into test methods. See MIL-STD-202 for the change summary.
3. Comments, suggestions, or questions on this document should be emailed to std202@dla.mil or addressed to:
Commander, Defense Logistics Agency, DLA Land and Maritime, ATTN: VAT, P.O. Box 3990, Columbus, OH
43218–3990. Since contact information can change, you may want to verify the currency of this address
information using the ASSIST Online database at https://assist.dla.mil.
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MIL-STD-202-310
CONTENTS
PARAGRAPH PAGE
FOREWORD…………………………………………………………. ii
1. SCOPE 1
1.1 Purpose………………………………………….……..…………. 1
2. APPLICABLE DOCUMENTS 1
3. DEFINTIONS 1
4. GENERAL REQUIREMENTS 1
4.1 Test circuits ……………….………..…………….….........……. 1
4.1.1 Selection................................................................................. 1
4.1.1.1 Selection of test-circuit A….….………….……………..………. 1
4.1.1.2 Selection of test-circuit B….….………….……………..………. 1
4.2. Test systems …………….………………………..….….…..….. 2
4.2.1 Test-circuit A ………………………………..……..……………. 2
4.2.1.1 Calibration procedure for test-circuit A…..……..………..……. 2
4.2.2 Test-circuit B ………………………………..……..……………. 6
4.2.2.1 Calibration procedure for test-circuit B…..……..………..……. 6
4.3 Procedure …………………………………………………….….. 8
4.3.1 Preparation..………………………………………………….….. 8
4.3.2 Points of connection.…………………………..…………….….. 8
4.3.3 Test conditions. ………………………………..…………….….. 8
5. DETAILED REQUIREMENTS 8
5.1 Summary…………………………………………..…..…………. 8
6. NOTES 9
6.1 Supersession data………………………………………………. 9
FIGURES PAGE
1. Test-circuit A; monitor circuit for contact-opening and closing………… 3
2. Calibration circuit for test-circuit A.…………………………………..…… 4
3. Test-circuit B; monitor circuit for contact-chatter and false closures….. 5
4. Calibration circuit for test-circuit B……………………………….…..…… 7
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MIL-STD-202-310
METHOD 310
CONTACT-CHATTER MONITORING
1. SCOPE
1.1 Purpose. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic
component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it is
required that the contacts do not open or close momentarily, as applicable, for longer than a specified time-duration
(see 4.3) under environmental test conditions, such as vibration, shock, or acceleration. This test method provides
standard test procedures for monitoring such "opening of closed contacts" or "closing of open contacts".
2. APPLICABLE DOCUMENTS
This section not applicable to this standard.
3. DEFINTIONS
This section not applicable to this standard.
4. GENERAL REQUIREMENTS
4.1. Test circuits.
4.1.1 Selection. In this method there are two test-circuits: A (see 4.2.1), and B (see 4.2.2). The selection of the
test-circuit depends largely upon the type of electrical contacts to be tested. Test-circuit B is preferred, whenever
possible, to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts. The
individual specification shall specify the test-circuit and time-duration (see 4.3.3) required in connection with
monitoring of shock and vibration tests. The test-circuits listed herein are "recommended" reference circuits. Any
comparable test-circuit which meets the test requirements and the calibration procedures as stated herein, may be
used for this test.
4.1.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set of contacts, for
the opening of normally-closed contacts or false closures of normally-opened contacts (see figure 1). Test-circuit A
should not be specified for specimens whose capability includes low-level or dry-circuit ratings (10 milliamperes or
less and 2 volts or less for openings or closings less than 10 microseconds); since the current through the electrical
contacts under test from the test-circuit may cause arcing, thus damaging the contacts.
4.1.1.2 Selection of test-circuit B. Test-circuit B is for monitoring test-specimens with a single set of contacts, for
the opening of normally-closed contacts and false closures of normally-open contacts (see figure 3). Test-circuit B
should not be used for openings or closings of less than 10 microseconds. Test-circuit B does not allow current in
excess of 20 milliamperes or an open-circuit voltage in excess of 2-volts during monitoring; which insures that there
will be no arcing, which will cause damage, to low-level and dry-circuit test specimens.
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