MIL-STD-202H.pdf - 第292页

MI L - S TD - 202 -3 10 4 .3 . Procedure. 4.3. 1 Prepar ation . T he m on i t or - c i r c ui t s o f f i gur e s 1 a nd 3 s hal l be c al i br at ed, i m m ed i at e l y pr ior to use, using the applicable cal ibration …

MIL-STD-202-310

NOTES:

1. The square-wave pulse generator and oscilloscope shall have an accuracy of ±3 percent or better.

2. The ratio of off-time to detection-time shall be 10:1 or better.

FIGURE 4. Calibration circuit for test-circuit B.

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MIL-STD-202-310

4.3. Procedure.

4.3.1 Preparation. The monitor-circuits of figures 1 and 3 shall be calibrated, immediately prior to use, using the

applicable calibration-circuit (see figures 2 and 4, respectively). The calibration-circuit shall then be disconnected

from the monitoring-circuit.

4.3.2 Points of connection. The contacts of the test-specimen being monitored shall be connected to points BP1

and BP2 for test circuit A for both contact-chatter and false-make contact conditions. For test circuit B, the points of

connection shall be BP1 and BP2 for contact-chatter condition and to points BP1 and BP3 for false-make contact

condition. The test specimen shall then be subjected to the shock, vibration, acceleration, or other environmental test

during which this contact-chatter monitoring test method is to be used. If specified in the individual specification, test

specimens having normally-closed contacts may be wired in series to monitor for opening of contacts, and those

having normally-open contacts may be wired in parallel to monitor for closing of contacts. In this case, if contact

opening or closing is indicated, it will then be necessary to reset each test specimen separately and monitor it

individually to determine which one is defective.

4.3.3 Test conditions. Test specimens shall be subjected to one of the following test conditions, as specified in the

individual specification:

Test condition Time duration

A 10 microseconds

B 100 microseconds

C 1 millisecond

D 5 milliseconds

E 20 milliseconds

5. DETAILED REQUIREMENTS

5.1 Summary. The following details are to be specified in the individual specification:

a. Test circuit letter (see 4.1.1, 4.2.1, and 4.2.2).

b. Test condition letter for maximum allowable time-duration of contact-opening or closing, as applicable (see

4.3.3).

c. Whether series-connection (of normally-closed contact test-specimens) or parallel-connection (of normally-

open contact test-specimens) may be allowed (see 4.3.2).

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MIL-STD-202-310

6. NOTES

(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory.)

6.1 Supersession data. The main body and 38 parts of this revision of MIL-STD-202 replace superseded MIL-STD-

202.

Custodians: Preparing activity:

Army - CR DLA – CC

Navy - EC

Air Force - 85 (Project 59GP-2015-040)

DLA - CC

Review activities:

Army - AR, AT, AV, CR4, MI, SM, TE

Navy - AS, OS, SH

Air Force - 19, 99

NSA - NS

NOTE: The activities listed above were interested in this document as of the date of this document. Since

organizations and responsibilities can change, you should verify the currency of the information above using the

ASSIST Online database at https://assist.dla.mil/

北测（上海）电子科技有限公司

联系方式：xuyj@beice-sh.com 13917165676