IPC-TM-650 EN 2022 试验方法--.pdf - 第388页

Complex Relative Permittivity Permittivity Relative Permittivity Loss T angent IPC-T -50 IPC-MF-150 IPC-TM-650 IPC -TM -65 0 ASTM D3380-75 Material in this T est M ethods Manual was voluntarily establis hed by T echni ca…

100%1 / 824
IPC-TM-650
Number
Subject Date
Revision
Page 3 of 2
2.4.47
Flux
Residue
Dryness
1/95
6.0
Notes
6.1
Safety
Observe
all
appropriate
precautions
on
MSDS
for
chemicals
involved
in
this
test
method.
Complex Relative Permittivity
Permittivity
Relative Permittivity
Loss Tangent
IPC-T-50
IPC-MF-150
IPC-TM-650
IPC-TM-650
ASTM
D3380-75
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 25
Number
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
221
5
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
.0
Scope
1.1
Summary
This
method
is
intended
for
the
rapid
mea¬
surement
of
the
X-band
(8.00
to
12.40
GHz)
apparent
relative
stripline
permittivity
(see
9.1)
and
loss
tangent
of
metal
clad
substrates.
Measurements
are
made
under
stripline
condi¬
tions
using
a
resonant
element
pattern
card,
which
is
sepa¬
rated
from
the
ground
planes
by
sheets
of
the
material
to
be
tested.
Further
information
about
this
method
may
be
found
in
ASTM
D3380-75.
1.2
Definitions
Terms
used
in
this
method
include:
The
values
for
relative
per¬
mittivity
and
dissipation
factor
considered
as
a
complex
num¬
ber.
Dielectric
constant
(see
IPC-T-50)
or
relative
per¬
mittivity.
The
symbol
used
in
this
document
is
er.
K'
or
k'
are
sometimes
used.
A
dimensionless
ratio
of
absolute
per¬
mittivity
of
a
dielectric
to
the
absolute
permittivity
of
a
vacuum.
Dissipation
factor
(see
IPC-T-50),
dielectric
loss
tangent.
The
symbol
used
in
this
document
is
tan
8
(see
9.2).
1.3
Limitations
The
following
limitations
in
the
method
should
be
noted.
Users
are
cautioned
against
assuming
the
method
yields
permittivity
and
loss
tangent
values
that
directly
correspond
to
applications.
The
value
of
the
method
is
for
assuring
consistency
of
product,
thus
reproducibility
of
results
in
fabricated
boards.
1.3.1
The
measured
effective
permittivity
for
the
resonator
element
can
differ
from
that
observed
in
an
application.
Where
the
application
is
in
stripline
and
the
line
width
to
groundplane
spacing
is
less
than
that
of
the
resonator
ele¬
ment
in
the
test,
the
application
will
exhibit
a
greater
compo¬
nent
of
the
electric
field
in
the
X,
Y
plane.
Heterogeneous
dielectric
composites
are
anisotropic
to
some
degree,
result¬
ing
in
a
higher
observed
er
for
narrower
lines.
Microstrip
lines
in
an
application
may
also
differ
from
the
test
in
the
fraction
of
substrate
electric
field
component
in
the
X,
Y
plane.
2.5.5.5
Subject
Stripline
Test
for
Permittivity
and
Loss
Tangent
(Dielectric
Constant
and
Dissipation
Factor)
at
X-Band
Date
Revision
3/98
C
Originating
Task
Group
High
Speed/High
Frequency
Test
Methods
Subcommittee
(D-24)
Bonded
stripline
assemblies
have
air
excluded
between
boards,
thus
tend
to
show
greater
er
values.
1.3.2
High
degrees
of
anisotropy
of
some
composites
can
result
in
an
increased
degree
of
coupling
of
the
resonant
ele¬
ment,
resulting
in
a
falsely
lower
Q
value.
If
a
correction
is
not
applied
either
mathematically
as
in
7.2.2
or
by
deviating
from
the
probe
gaps
specified
for
the
test
pattern,
an
upward
bias
in
the
calculated
loss
tangent
will
result.
1.3.3
The
sensitivity
of
the
method
to
differences
in
er
of
specimens
is
impaired
by
the
fact
that
the
resonator
pattern
card
remains
as
part
of
the
fixture
and
at
the
same
time
con¬
stitutes
a
significant
part
of
the
dielectric
involved
in
measure¬
ments.
1
.3.4
The
method
does
not
lend
itself
to
use
of
stable
ref¬
eree
specimens
of
known
electric
properties
traceable
to
The
National
Institute
of
Standards
and
Technology
(NIST).
2
.0
Applicable
Documents
2.1
IPC
Terms
and
Definitions
Metal
foil
for
Printed
Wiring
Application
Method
2.3.7.
1
,
Cupric
Chloride
Etching
Method
2.
5.5.
3,
Permittivity
(Dielectric
Con¬
stant)
and
Loss
Tangent
(Dissipation
Factor)
of
Materials
(Two
Fluid
Cell
Method)
Standard
Method
of
Test
for
Permittivity
(Dielectric
Constant)
and
Dissipation
Factor
of
Plastic-
Based
Microwave
Circuit
Substrates
3
.0
Test
Specimen
All
metal
cladding
shall
be
removed
from
the
material
to
be
tested
by
any
standard
etching
pro¬
cess,
including
rinsing
and
drying;
however,
IPC-TM-650,
Method
2.3.7.
1
,
shall
be
used
as
a
referee
procedure.
The
test
specimen
shall
consist
of
a
set
of
two
sheets
(or
two
packets
of
sheets)
of
a
preferred
size
of
at
least
51
mm
x
69
mm.
3.1
A
smaller
size
may
be
used
if
it
has
been
shown
not
to
affect
results.
The
minimum
vertical
dimension
must
extend
NOTE:
IPC-TM-650
Page 2 of 25
Number
2.5.5.5
Subject
Stripline
Test
for
Permittivity
and
Loss
Tangent
(Dielectric
Constant
and
Dissipation
Factor)
at
X-Band
Date
3/98
Revision
C
from
the
base
boards
to
the
top
of
the
25.4
mm
x
51
mm
area
to
which
clamping
pressure
is
applied.
The
minimum
horizon¬
tal
dimension
must
be
enough
to
extend
at
least
6.5
mm
beyond
the
center
line
of
the
vertical
portion
of
the
probe
line
on
either
side.
For
the
pattern
card
of
Figure
4
and
fixture
of
Figure
12,
these
minimums
are
38.1
mm
x
68.6
mm.
For
the
smaller
size,
the
clamp
force
in
6.1
or
Table
1
is
not
changed
because
the
effective
area
over
which
the
force
is
applied
is
not
reduced.
The
test
fixture
is
designed
to
accommodate
a
total
specimen
thickness
of
either
3.18
mm
±
0.22
mm
or
2.54
mm
土
0.18
mm
from
an
even
number
of
layers.
Testing
of
built-up
specimens
introduces
error,
which
can
exceed
5%
due
to
air
gaps.
Exact
correlation
factors
and
techniques
must
be
agreed
upon
or
other
methods
of
test
used.
The
1
MHz
method
of
IPC-TM-650,
Method
2.
5.
5.3,
can
be
used
with
a
correction
factor
based
on
tests
of
samples
of
the
nominal
thickness
of
Table
1
using
both
tech¬
niques.
With
some
material
types
not
based
on
woven
fabric
rein¬
forcement,
it
is
possible
to
machine
specimens
to
achieve
the
nominal
thickness
for
test.
4.0
Suggested
Electronic
Apparatus
The
principal
com¬
ponents
required
for
the
test
setup
consist
of
the
test
fixture
described
in
5.0,
a
microwave
signal
source,
an
accurate
means
of
measuring
the
signal
frequency,
an
accurate
means
for
detecting
power
level,
and
an
accurate
method
of
deter¬
mining
frequency
values
above
and
below
the
resonant
fre¬
quency
at
the
half-
power
level
for
the
test
fixture
loaded
with
the
specimen.
The
microwave
signal
source
must
be
capable
of
providing
an
accurate
signal.
During
the
required
time
period
and
range
of
frequency
needed
to
make
a
permittivity
and
loss
tangent
measurement,
the
source
must
provide
a
leveled
power
out¬
put
that
falls
within
a
0.1
dB
range.
When
the
source
is
set
for
a
particular
frequency,
the
output
must
be
capable
of
remain¬
ing
within
5
MHz
of
the
set
value
for
the
time
required
to
make
a
measurement.
The
means
for
measuring
frequency
shall
have
a
resolution
of
5
MHz
or
less
and
an
accuracy
of
8
MHz
or
less.
An
error
of
+8
MHz
in
measurement
of
a
resonant
frequency
for
a
mate¬
rial
with
nominal
permittivity
of
2.50
represents
a
-0.004
error
in
permittivity.
The
means
for
detecting
the
power
level
shall
have
a
resolu¬
tion
of
0.1
dB
or
less
and
be
capable
of
comparing
power
levels
within
a
3
dB
range
with
an
accuracy
of
0.1
dB.
An
error
of
0.1
dB
in
estimating
half
power
frequency
points
can
result
in
an
error
in
the
loss
tangent
of
about
0.0001
for
a
material
with
2.5
permittivity.
See
7.2,
equation
5.
4.1
Manual
Test
Setup
The
method
of
determining
the
half-power
points
depends
partly
on
the
type
of
signal
source
used.
If
the
power
input
to
the
test
fixture
is
maintained
con¬
stant
as
the
frequency
is
varied,
then
an
SWR
meter
may
be
used
to
determine
the
half-power
points
at
the
output
of
the
test
fixture.
This
may
be
accomplished
by
using
a
leveled
sweep
generator
or
by
using
a
tunable
klystron
(at
a
consid¬
erable
savings)
and
manually
adjusting
the
power
input
to
the
test
fixture
to
a
prescribed
level
by
use
of
a
variable
attenua¬
tor.
A
typical
equipment
list
is
shown
below.
Equivalent
makes
and
models
of
equipment
may
be
substituted
where
it
can
be
shown
that
equivalent
results
are
obtained.
For
example,
if
a
leveling
system
is
not
used
and
the
power
output
of
the
source
varies
widely
with
frequency,
a
ratiometer
may
be
sub¬
stituted
for
the
two
SWR
meters.
If
only
permittivity
is
desired,
it
is
not
necessary
to
level
the
input.
The
following
equipment,
or
equivalent,
may
be
used.
•
Sweep
Frequency
Generator
H.P.
8350B
or
8620C
•
X-Band
Frequency
Plug
in
Unit
H.P.
83545A
or
86251
A
•
Frequency
Meter
H.P.
X532B
•
Crystal
Detector
(2)
H.P.
423B
(Neg)
•
Matched
Load
Resistor
for
one
Crystal
Detector
H.P.
11523A,
opt.
001
•
SWR
Meter
(2)
H.P.
41
5E
•
Directional
Coupler
HP
779D
•
10
dB
Attenuator
H.P.
8491
B
•
8.9
kN
Dillon
Force
Gauge,
Compression
Model
X,
Part
Number
381612301
,
with
土
1%
full
scale
accuracy
•
Vise
or
press
that
is
able
to
exert
controlled
4.45
kN
force
on
the
test
fixture
and
that
opens
at
least
1
27
mm
to
accept
the
force
gauge
and
test
fixture
•
Semi-rigid
Coaxial
Cable
and
Connectors
•
Waveguide
to
Coaxial
Adapters
(2)
H.P.
X281A
•
The
measuring
equipment
shall
be
connected
as
shown
on
Figure
1
.
4.2
A
Test
Setup
for
Computer
Automation
of
Data
The
following
components
or
equivalent,
properly
interconnected,
can
be
used
most
effectively
with
a
computer
control
program
for
automated
testing.