IPC-TM-650 EN 2022 试验方法--.pdf - 第800页
IPC-TM-650 Page 2 of 2 Number 3.11 Subject Thermal Shock, Connectors Date 7/75 Revision A 6.3 Thermal equilibrium shall be assumed to have been attained when three successive temperature readings taken at five-minute int…
Table 1 Thermal Shock Test Conditions (One Cycle)
Step Temperature, °C Time
WARNING:
Notes
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 2
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
2215
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
.0
Scope
1.1
To
determine
the
effects
of
exposing
connectors
to
extremes
of
high
and
low
temperature
and
of
the
mechanical
stresses
created
by
rapid
transition
between
the
temperature
extremes.
2
.0
Reference
Documents
2.1
Information
in
this
section
is
intended
to
parallel
the
test
method
described
in
El
A-RS-364/TP-32
.
3
.0
Test
Specimen
3.1
A
connector
(plug
and
receptacle)
complete
with
all
applicable
guide,
keying
and
engaging
hardware
or
a
card¬
edge
receptacle.
3.2
The
plug
and
receptacle
shall
be
tested
in
a
configura¬
tion
normal
to
its
functional
capacity
including
mounting,
ter¬
mination,
and
mating.
3.3
The
plug
and
receptacle
or
the
card-edge
receptacle
and
a
nominal
thickness
printed
circuit
board
shall
be
mated
during
this
test,
except
as
otherwise
specified.
4
.0
Apparatus
4.1
A
dual
chamber
(or
two
separate
chambers)
capable
of
maintaining
the
applicable
temperature
within
±
2
℃
at
the
geometric
center
under
no
load
conditions,
and
a
thermal
dis¬
tribution
not
greater
than
±
5
℃
of
the
temperature
at
the
geometrical
center.
5
.0
Procedure
5.1
The
chamber(s)
shall
be
adjusted
to,
and
maintained
at,
the
high
and
low
extremes
specified
in
the
individual
connec¬
tor
specification.
Thermal
equilibrium
shall
be
attained
prior
to
the
start
of
the
test.
(See
6.3)
5.2
The
mated
test
specimen
shall
be
suspended
within
the
low
temperature
chamber
and
subjected
to
the
number
of
Number
3.11
Subject
Thermal
Shock,
Connectors
Date
Revision
7/75
A
Originating
Task
Group
N/A
continuous
thermal
shock
cycles
specified
in
the
individual
connector
specification.
One
complete
cycle
of
thermal
shock
is
defined
by
Table
1
.
(See
6.4)
1
Low
extreme
(+0,
-5℃)
30
min.
(min.)
2
25℃
(+10,
-5℃)
2
min.
(max.)
3
High
extreme
(+5,
-0℃)
30
Min.
(min.)
4
25℃
(+10,
-5℃)
2
min.
(max.)
BOTH
THE
HIGH
AND
LOW
TEMPERATURE
EXTREMES
USED
DURING
THIS
TEST
WILL
CAUSE
SEVERE
BURNS.
USE
INSULATED
GLOVES
WHEN
HAN¬
DLING
THE
TEST
SPECIMEN.
5.3
After
completion
of
the
specified
number
of
cycles
and
attaining
room
ambient
temperature,
the
sample
shall
be
visu¬
ally
examined
for
evidence
of
the
following:
A.
Excessive
permanent
dimensional
changes
(distortion).
B.
Cracking
or
delamination
of
finishes
or
dielectric
materials.
C.
Opening
of
seals
or
seams.
D.
Hardening
or
softening
of
dielectric
materials.
5.4
Unless
otherwise
specified
in
the
individual
connector
specification,
the
test
specimen
shall
be
subjected
to
the
with¬
standing
voltage
test,
(3.13).
6.0
6.1
Acceptance
criteria
shall
be
established
in
terms
of
one,
or
any
combination,
of
the
following:
A.
Visible
evidence
of
damage
or
significant
material
change.
B.
A
deterioration
in
withstanding
voltage
occasioned
by
internal
fissures
in
the
dielectric
with
or
without
the
accompanying
entrapment,
of
moisture.
6.2
The
test
chambers
shall
be
of
the
forced
(circulating)
air
type
to
insure
even
temperature
distribution.
IPC-TM-650
Page 2 of 2
Number
3.11
Subject
Thermal
Shock,
Connectors
Date
7/75
Revision
A
6.3
Thermal
equilibrium
shall
be
assumed
to
have
been
attained
when
three
successive
temperature
readings
taken
at
five-minute
intervals
show
a
variation
not
greater
than
3
℃.
6.4
The
exposure
and
transfer
times
specified
in
Table
1
are
based
on
an
assumed
sample
weight
less
than
0.5
pound
(226
GMS).
Appropriate
increases
in
these
periods
shall
be
made
for
larger
samples
to
ensure
that
the
designated
test
temperature
is
attained.
Sinusoidal
Random
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page 1 of 6
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
2215
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
.0
Scope
1
.1
To
determine
the
effect
on
the
connector
of
the
stresses
produced
by
mechanical
vibration
within
the
predominant
fre¬
quency
ranges
and
of
amplitudes
that
may
be
encountered
during
field
service;
two
input
vibration
types
are
provided:
—
Used
to
determine
critical
frequencies,
modes
of
vibration,
and
other
data
necessary
for
planning
protective
steps
against
the
effects
of
undue
vibration.
The
simple
har¬
monic
motion
provided
by
this
method
is
not
representative
of
most
vibration
encountered
during
field
service.
—
Used
to
provide
a
closer
approximation
to
the
complex,
non-periodic
vibration
encountered
during
field
ser¬
vice.
2
.0
Reference
Documents
2.1
Information
in
this
section
is
intended
to
parallel
the
test
method
described
in
EIA-RS-364/TP-28.
3
.0
Test
Specimen
3.1
A
connector
(plug
and
receptacle)
complete
with
appli¬
cable
guide,
keying,
and
engaging
hardware
or
a
card
-edge
receptacle
and
mating
nominal-thickness
printed
circuit
board.
3.2
Mounting
and
Termination
3.2.1
Right
Angle,
Two-Piece
Connector
The
receptacle
shall
be
mounted
and
terminated
normally
during
this
test;
receptacles
designed
for
mounting
on
non-rigid
bases
(e.g.,
motherboards,
metal-plate
back
panels,
etc.)
shall
be
mounted
on
the
smallest
section
of
such
a
base
that
will
accommodate
the
test
specimen.
The
plug
shall
be
termi¬
nated
normally
during
this
test
and
shall
be
mounted
on
a
nominal-thickness
printed
circuit
board
extending
the
full
width
of
the
plug;
the
board
shall
extend
a
minimum
of
four
inches
from
the
receptacle
when
the
connector
is
mated.
3.2.2
Card-Edge
Receptacle
The
receptacle
shall
be
mounted
and
terminated
normally
during
this
test
(see
3.2.1
).
The
mating
printed
circuit
board
shall
extend
the
full
width
of
the
receptacle
and
shall
extend
a
minimum
of
four
inches
from
the
receptacle
when
mated.
Number
3.12
Subject
Vibration,
Connectors
Date
7/75
Revision
A
Originating
Task
Group
N/A
3.2.3
Parallel,
Two-Piece
Connector
The
receptacle
and
plug
shall
be
terminated
normally
during
this
test;
both
com¬
ponents
shall
be
mounted
on
nominal-thickness
printed
circuit
boards
extending
the
full
width
of
each.
The
printed
circuit
boards
shall
extend
a
minimum
of
four
inches
from
each
com¬
ponent
when
the
connector
is
mated.
3.3
Fixturing
3.3.1
Right
Angle
Connector
The
test
specimen
shall
be
held
in
an
adequate
resonant
free
fixture.
(Figure
1
,
Reference
example.)
3.3.2
Parallel
Connector
The
test
specimen
shall
be
held
in
an
adequate
resonant
free
fixture.
(Figure
2,
Reference
example.)
3.4
The
connector
shall
be
wired
(or
printed
circuit
boards
designed)
such
that
a
continuous
electrical
circuit
(comprising
all
contacts
in
series)
is
formed
when
the
plug
(or
board)
and
receptacle
are
mated.
4
.0
Apparatus
4.1
An
electrodynamics
vibration
system
and
associated
instrumentation
capable
of
producing
the
vibration
indicated
in
Table
1
and
Figures
3
and
4
as
specified
in
the
individual
con¬
nector
specification.
The
system
shall
be
capable
of
maintain¬
ing
the
vibratory
input
within
the
following
tolerances:
Displacement
-
土
1
0%
Acceleration
-
±
1
0%
Power
Spectral
Density
-
土
3.0
DB
(50
Hz
maximum
filter
bandwidth)
Frequency
-
±
2%
4.2
A
circuit
monitor
capable
of
supplying
a
continuous
cur¬
rent
of
1
00
milliamperes
and
of
detecting
discontinuities
in
this
current
greater
than
1
microsecond.
5
.0
Procedure
5.1
Calibration
5.1.1
The
vibration
system
shall
be
set
up
to
provide
the
sinusoidal
or
random
vibratory
input
in
accordance
with