IPC-TM-650 EN 2022 试验方法--.pdf - 第198页
A Certified Reference M aterial ( C RM) covering the measuring range of the applic ation as described in 5.2. A typical instrument layout is shown in Figure 1 . IPC-2344-1 Number 2.3.44 Subject Determination of Thickness…
IPC J-STD-004
Material in this Test Methods Manual was voluntarily established by Technical Committees of IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by IPC.
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ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
®
221
5
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
Scope
This
qualitative
test
method
is
designed
to
deter¬
mine
the
presence
of
chlorides
and
bromides
in
soldering
flux
by
visual
examination
after
placement
on
test
paper.
2
Applicable
Documents
Requirements
for
Soldering
Fluxes
3
Test
Specimen
A
minimum
of
1
0
ml
of
liquid
flux,
a
rep¬
resentative
container
of
solder
paste,
reflowed
solder
paste
flux,
extracted
solder
preform
flux
or
extracted
cored
wire
flux.
The
reflow/extraction
process
should
be
carried
out
in
accor¬
dance
with
J
-STD-004.
4
Apparatus
and
Reagents
4.1
Six
pieces
of
silver
chromate
test
paper
51
mm
x
51
mm.
4.2
250
ml
of
reagent
grade
2-propanoL
4.3
Six
glass
microscope
slides.
4.4
Spatula.
5
Procedures
5.1
Preparation
5.1.1
The
silver
chromate
paper
is
extremely
light
sensitive
and
must
be
stored
in
a
closed
container
away
from
light
until
used
for
testing.
5.1.2
To
avoid
contamination,
the
paper
must
be
handled
with
forceps
and
must
never
be
touched
with
bare
hands.
5.2
Test
for
Liquid
Flux
or
Flux
Extract
Solution
5.2.1
Place
one
drop
of
test
flux
or
flux
extract
(approxi¬
mately
0.05
ml)
on
each
piece
of
silver
chromate
test
paper.
Allow
the
droplet
to
remain
on
each
test
paper
for
a
minimum
of
1
5
seconds.
5.2.2
After
the
15
seconds,
immediately
immerse
each
test
paper
in
clean
2-propanol
to
remove
the
residual
organic
materials.
Number
2.3.33
Subject
Presence
of
Halides
in
Flux,
Silver
Chromate
Method
Date
Revision
06/04
D
Originating
Task
Group
Flux
Specifications
Task
Group
(5-24a)
5.2.3
Allow
each
test
paper
to
dry
and
examine
for
color
change.
5.3
Test
for
Paste
Flux
or
Solder
Paste
Flux
as
Obtained
from
the
Supplier
5.3.1
Clean
six
glass
microscope
slides
with
2-propanol
and
air
dry.
5.3.2
Moisten
each
piece
of
silver
chromate
reagent
paper
with
deionized
water.
5.3.3
Apply
a
wet
paper
to
each
glass
slide
and
remove
the
excess
water
with
blotting
paper.
5.3.4
Using
a
spatula,
apply
a
thin
coating
of
the
paste
flux
or
solder
paste
directly
onto
each
moist
reagent
paper.
5.3.5
Allow
the
paste
flux
or
solder
paste
to
remain
in
con¬
tact
with
the
paper
for
1
5
seconds,
then
remove
the
flux
with
2-propanol
or
other
appropriate
solvent
without
disturbing
the
paper.
5.3.6
Allow
each
test
paper
to
dry
and
examine
for
color
change.
5.4
Evaluation
Carefully
examine
each
test
sheet
for
pos¬
sible
color
change.
A
change
to
off-white
or
yellow-white
indi¬
cates
the
presence
of
chlorides
or
bromides
(see
Figure
1).
5.4.1
Interferences
A
number
of
chemicals
besides
free
halides
may
cause
test
failures.
(Representative
examples
are,
but
are
not
limited
to,
amines,
cyanides,
and
isocyanates.)
5.4.2
Certain
acidic
solutions
may
react
with
the
reagent
paper
to
produce
a
color
change
similar
to
that
obtained
with
chlorides
and
bromides.
When
a
color
change
is
observed,
it
is
advisable
to
check
the
acidity
of
the
affected
area
by
means
of
a
pH
indicating
paper.
If
pH
values
of
less
than
3
are
obtained,
the
presence
of
chlorides
and
bromides
should
be
verified
by
other
analytical
means.
5.4.3
It
is
possible
that
the
metal
present
in
a
solder
paste
sample
may
leave
a
white
residue
that
is
difficult
to
distinguish
A Certified Reference Material (CRM) covering the measuring
range of the application as described in 5.2.
A typical instrument layout is shown in Figure 1.
IPC-2344-1
Number
2.3.44
Subject
Determination of Thickness and Phosphorus Content in
Electroless Nickel (EN) Layers by X-Ray Fluorescence (XRF)
Spectrometry
Date
03/16
Revision
IPC-TM-650
—
Anode
Primary
filter
Shutter
3749
Primary
x-radiation
Spectrum
Mirror
Detector
Aperture
(Collimator)
Primary
X-rodiation
Coating
laye
Electron
Base
material
X-ray
tube
Cathode
Video
camera
X<ay
fluorescence
radiation
WinFTM
main
window
Figure
1
XRF
Instrument
Layout
Page
2
of
4
5 Procedure
5.1 Instrument Setup
Prior to the purchase of the Certi-
fied Reference Materials (CRMs), confirm with the XRF
manufacturer that the instrument is capable of measuring
phosphorus content and obtain details of the recommended
machine set-up and operational procedures.
Instrument setups usually contain a product file that contains
the required measurement specific hardware and software
settings for the application. In addition, the product file con-
tains a calibration file which defines the calibration settings
and certified reference material to be used.
5.2
Typical Instrument setup conditions and measuring
ranges are as follows:
• Aperture Size: 1 mm for both 10kV and 50kV applications.
• Anode Current (I): I=1 mA for 10kV and I=0.15 mA for 50kV
(Anode current setup maximizing achievable instrument
count rates will yield best instrument repeatability, reference
5.3).
• Primary Beam Filter: NO filter for 10 kV and Ni Filter for
50 kV.
• Measurement Time: 120 s for 10kV and 20 s for 50kV.
5.3 Instrument Calibration
Calibration be per-
formed with CRM’s according to the instrument manufacturer
instructions. The CRM’s
be traceable to national labora-
tories. The structure of the reference material
be similar
to the samples under investigation, i.e., NiP/Cu/PCB, Au/NiP/
Cu/PCB or Au/Pd/NiP/Cu/PCB. Individual calibration foils
be used for multilayer coatings. The certified refer-
ence standards
have compositions and thicknesses
similar to the samples to be measured. If desired, it is possible
to calibrate an instrument over the full (low to high) phospho-
rous range. However, optimum accuracy can be achieved by
calibrating each phosphorous range (low, mid, and high)
separately. Each phosphorous content range should be cali-
brated with no less than 4 standards per range. No less than
3 measurements per calibration standard
be performed.
Calibration checks should be performed after each calibration
and periodically by re-measuring the calibration standards. If
the results are within the measurement uncertainty of the
standards and the uncertainty of the measurement itself, no
action is required. If not, a recalibration of the instrument is
required. Typical CRM standards used and results obtained
are summarized in Table 1.
5.4 Sample Placement
There are some basic rules for
positioning specimens. For each measurement, it
be
ensured that the X-ray fluorescence radiation can reach the
detector without obstruction. For flat, unpopulated PCB
boards, this is not a problem.
If populated boards are being measured, the operator
note the position of the detector and position the sample such
that no components are present in locations that would
prevent the radiation emanating from the measurement loca-
tion from reaching the detector, as illustrated schematically in
Figure 2.
The area measured should be flat and not tilted.
5.5 Measurement
XRF equipment operation is instrument
specific and
be in accordance with the instrument
manufacturer’s instructions. Always ensure that the correct
measurement file is selected for the application to be mea-
sured. Typically, instruments will slide the measuring stage out
of the instrument when the measurement chamber is opened.
The test sample is then positioned on the programmable X-Y
stage such that the laser pointer points at the measurement
location. When the measurement chamber is closed, the
stage will automatically retract into the chamber.
IPC-2344-2
Number
2.3.44
Subject
Determination of Thickness and Phosphorus Content in
Electroless Nickel (EN) Layers by X-Ray Fluorescence (XRF)
Spectrometry
Date
03/16
Revision
IPC-TM-650
shall
shall
shall
shall
not
shall
shall
Figure
2
Sample
Placement
with
Respect
to
Detector
shall
Page
3
of
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