IPC-TM-650 EN 2022 试验方法--.pdf - 第577页
Material in this T est M ethods Manual was voluntarily establis hed by T echni cal Committees of IPC. Thi s mat erial is a dvisory only and its use or adaptation is entirely voluntary . IPC disclaims all lia bility of an…
Table 1 Application of Initial Voltage
Breakdown voltage by
short-time method
Adjust 50% of breakdown
voltage to nearest
25 kilovolts or less 1.0 kilovolt (unless
otherwise specified)
Over 25 to 50 kilovolts.
inclusive
2.0 kilovolts
Over 50 to 100 kilovolts,
inclusive
5.0 kilovolts
Over 100 kilovolts 10.0 kilovolts
IPC-TM-650
Number
Subject Date
Revision
Page 3 of 3
2.5.6.3
Dielectric
Breakdown
Voltage
and
Dielectric
Strength
10/86
5.4.3
Test
to
Breakdown,
Step-by-Step
Test
An
initial
voltage
shall
be
applied
equal
to
50
of
the
breakdown
voltage
in
the
short-time
test,
adjusted
as
shown
in
Table
1
.
The
voltage
shall
then
be
increased
in
equal
increments
as
stated
in
the
various
material
specifications,
the
voltage
being
held
at
each
step
for
a
definite
time
as
stated
in
the
specifica¬
tions.
The
change
from
each
step
to
the
next
higher
shall
be
made
as
rapidly
as
possible
and
the
time
of
change
included
in
the
succeeding
test
interval.
5.4.4
Test
to
Breakdown,
Slow-Rate-of-T
est
An
initial
voltage
shall
be
applied
equal
to
approximately
50%
of
the
breakdown
voltage
in
the
short
time
test,
unless
otherwise
specified.
The
voltage
shall
then
be
increased
at
a
uniform
rate
up
to
the
point
of
breakdown.
Unless
otherwise
specified,
the
rate
should
be
chosen
to
give
approximately
the
same
voltage-time
exposure
of
the
test
specimen,
as
provided
in
the
step-by-step
test.
5.4.5
Determining
Rate
of
Rise
of
Voltage
The
rate
of
voltage
rise
may
be
calculated
from
measurements
of
time
required
to
raise
the
voltage
between
two
prescribed
values.
When
motord
riven
regulating
equipment
is
used,
the
speed¬
control
rheostat
may
be
calibrated
in
terms
of
voltage
rise
for
any
particular
test
transformer.
5.5
Number
of
Tests
Unless
otherwise
specified,
five
tests
shall
be
made.
If
the
average
deviation
from
the
mean
exceeds
1
0%
or
if
any
individual
test
deviates
more
than
1
5%
from
the
mean,
five
additional
tests
shall
be
made.
5.6
Report
The
report
shall
include
the
following
data:
1
.
The
average
thickness
of
the
sample
2.
Breakdown
voltage
at
each
puncture
3.
Volts
per
mil
for
each
puncture
4.
The
average,
maximum,
and
minimum
volts
per
0.0075
mm
for
each
sample
5.
The
temperature
of
the
surrounding
medium
should
be
recorded
6.
The
RH%
of
the
surrounding
air
7.
The
conditioning
treatment
8.
The
duration
of
the
test
9.
In
the
step-by-step
test,
the
value
of
the
initially
applied
voltage
and
the
voltage
increment
1
0.
In
the
slow
rate
of
rise
test,
the
value
of
the
initially
applied
voltage
and
the
rate
of
rise
of
the
voltage
1
1
.
The
size
and
type
of
electrodes
12.
The
test
medium
(air
or
type
of
oil)
6
Notes
Due
to
the
high
voltage
used
in
this
test
method,
extreme
caution
should
be
exercised.
Material in this Test Methods Manual was voluntarily established by Technical Committees of IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by IPC.
Page 1 of 2
r
ASSOCIATION
CONNECTING
/
ELECTRONICS
INDUSTRIES
®
221
5
Sanders
Road
Northbrook,
IL
60062-6135
IPC-TM-650
TEST
METHODS
MANUAL
1
Scope
The
dielectric
withstanding
voltage
test
(also
called
high-potential,
over
potential,
voltage
breakdown,
or
dielectric
strength
test)
consists
of
the
application
of
a
voltage
higher
than
rated
voltage
for
a
specific
time
between
mutually
isolated
portions
of
a
PCB
or
between
isolated
portions
and
ground.
This
is
used
to
prove
that
the
PCB
can
operate
safely
at
its
rated
voltage
and
withstand
momentary
over
potentials
due
to
switching,
surges,
and
other
similar
phenomena.
Although
this
test
is
often
called
a
voltage
breakdown
or
dielectric
strength
test,
it
is
not
intended
that
this
test
cause
insulation
breakdown
or
that
it
be
used
for
detecting
corona,
rather
it
serves
to
determine
whether
insulating
materials
and/or
conductor
spacings
are
adequate.
2
Applicable
Documents
None
3
Test
Specimen
The
test
specimen
shall
be
comprised
of
a
minimum
of
two
conductor
lines
per
conductive
layer,
suffi¬
cient
to
allow
a
voltage
to
be
applied
between
adjacent
con¬
ductor
patterns
both
between
conductive
layers
and
on
the
same
conductive
layer
(see
6.1).
4
Apparatus
or
Material
4.1
A
high
voltage
source
capable
of
supplying
the
specified
voltage
with
a
tolerance
of
土
5%
(see
6.2).
4.2
A
voltage
measuring
device
with
an
accuracy
of
5%.
If
leakage
current
measuring
capability
is
required,
the
device
shall
be
capable
of
detecting
the
leakage
current
to
within
5%
of
the
requirement.
4.3
Soft
bristle
brush
4.4
Deionized
or
distilled
water
(2
megohm-cm
minimum
resistivity
recommended)
4.5
Isopropyl
alcohol
Number
2.5.7
Subject
Dielectric
Withstanding
Voltage,
PCB
Date
Revision
05/04
D
Originating
Task
Group
Rigid
Printed
Board
Performance
Task
Group
(D-33a)
5
Procedure
5.1
Specimen
Preparation
(see
6.3)
5.1.1
Positive,
permanent,
and
noncontaminating
identifica¬
tion
of
test
specimen
is
of
paramount
importance.
5.1.2
Visually
inspect
the
test
specimens
for
any
obvious
defects,
as
described
in
the
applicable
performance
specifica¬
tion.
If
there
is
any
doubt
about
the
overall
quality
of
any
test
specimen,
the
test
specimen
should
be
replaced
and
this
replacement
noted.
5.1.3
Solder
single
stranded
(to
simulate
discrete
compo¬
nent
axial
leads)
polytetrafl
u
roet
hylene
(PTFE)
insulated
wires
in
each
of
the
connection
points
of
the
test
specimens.
These
wires
will
be
used
to
connect
the
test
patterns
of
the
test
specimens
to
the
high
voltage
source.
5.1.4
Wet
test
lead
terminals
with
deionized
or
distilled
water
and
scrub
with
a
soft
bristle
brush
for
a
minimum
of
30
seconds.
During
the
remainder
of
the
test
specimen
prepara¬
tion,
handle
test
specimens
by
the
edges
only
(see
6.4).
5.1.5
Spray
rinse
thoroughly
with
deionized
or
distilled
water.
Hold
test
specimen
at
an
approximate
30°
angle
and
spray
from
top
to
bottom.
5.1.6
Wet
test
lead
terminals
with
clean
isopropyl
alcohol
and
agitate
for
a
minimum
of
30
seconds.
Scrub
with
a
soft
bristle
brush
to
remove
flux
residue.
5.1.7
Rinse
cleaned
area
thoroughly
with
fresh
isopropyl
alcohol.
5.1.8
Dry
test
specimens
in
a
drying
oven
for
a
minimum
of
three
hours
at
an
oven
temperature
of
between
49
to
60
(120
°F
to
140
°F).
4.6
Drying
oven
5.1
.9
Allow
the
test
specimens
to
cool
to
room
temperature,
(see
6.5)
IPC-TM-650
Page 2 of 2
Number
2.5.7
Subject
Dielectric
Withstanding
Voltage,
PCB
Date
05/04
Revision
D
5.2
Test
(see
6.6)
5.2.1
Raise
the
test
voltage
from
zero
to
one
of
the
follow¬
ing
specified
test
condition
values
(see
6.2)
as
uniformly
as
possible,
at
a
rate
of
approximately
100
volts
DC
per
second.
If
the
test
condition
is
not
specified
Condition
A
shall
be
the
default.
Condition
A:
500+1
5/-0
volts
DC
Condition
B:
1
000+25/-0
volts
DC
5.2.2
Maintain
the
test
voltage
at
the
specified
value
for
a
period
of
30+3/-0
seconds.
5.2.3
Upon
completion
of
the
test,
the
test
voltage
shall
be
gradually
reduced
to
avoid
surges.
5.3
Evaluation
Examine
the
test
specimens
and
note
any
evidence
of
inadequate
insulating
materials
and/or
conductor
spacing
(i.e.,
visually
inspect
for
flashover,
sparkover
or
break¬
down
between
conductor
patterns
or
between
conductor
pat¬
terns
and
mounting
hardware).
6
Notes
6.1
Recommended
test
specimens
include
"Y''
test
pat¬
terns
(also
referred
to
as
“E”
test
coupons)
or
“comb
pat¬
terns.”
Production
printed
boards
may
also
be
used
as
test
specimens.
6.2
Performance
specifications
should
specify
the
high
volt¬
age
test
condition
and
any
deviations
to
this
test
method.
If
no
test
condition
is
specified,
use
test
condition
A.
6.3
This
test
method
may
be
performed
on
test
specimens
which
have
previously
been
prepared
and
tested
for
moisture
and
insulation
resistance.
6.4
Alternative
cleaning
procedures
may
be
implemented
if
there
is
a
concern
that
scrubbing
will
adversely
affect
test
results,
e.g.,
when
the
test
specimens
have
very
fine
spacing
and/or
are
plated
with
soft
metals
(tin/lead,
gold,
etc.).
6.5
Insulating
compound
(conformal
coating)
may
be
applied
to
the
test
specimens
following
soldering
and
clean¬
ing.
Any
coating
application
and
cure
shall
be
as
specified
by
the
coating
supplier.
6.6
The
testing
process
outlined
in
5.2
should
be
used
for
qualification
testing.
For
in-plant
quality
conformance
testing,
the
following
testing
modifications
may
be
chosen:
6.6.1
At
the
option
of
the
customer,
reduced
time
with
a
possible
correlated
higher
test
voltage
may
be
used.
6.6.2
At
the
option
of
the
customer,
an
AC
test
voltage
may
be
applied.
6.6.3
At
the
option
of
the
customer,
the
test
voltage
may
be
applied
instantaneously.