IPC-TM-650 EN 2022 试验方法--.pdf - 第494页
IPC-TM-650 Number Subject Date Revision Page 3 of 5 2.5.5.9 Permittivity and Loss Tangent, Parallel Plate, 1 MHz to 1.5 GHz 11/98 6.6. 1.4 Place the OQ (short) calibration standard on the test head as prompted on the uni…
IPC-TM-650
Number
Subject Date
Revision
Page 2 of 5
2.5.5.9
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
11/98
Calibrations
only
last
24
hours,
so
calibration
shall
be
per¬
formed
within
24
hours
of
the
measurement.
See
6.1
for
more
calibration
notes.
5.2
Set
up
the
unit
to
sweep
the
target
frequency
土
0.5%
of
the
target.
5.3
Measure
the
sample
thickness
with
the
micrometer
and
insert
into
the
test
fixture.
The
sample
must
make
good
con¬
tact
with
the
fixture
electrodes
(see
6.1
concerning
the
proper
force
to
be
applied).
The
sample
must
not
touch
the
back
wall
of
the
fixture.
The
sample
electrode
placement
and
thickness
measurement
shall
be
obtained
from
the
same
area
of
the
sample.
5.4
Run
the
test
and
record
the
average
permittivity
and
loss
over
the
narrow
frequency
range
sweep.
The
scanned
data
may
also
be
saved
on
disk.
See
6.2
for
comments
on
expected
behavior
for
permittivity
as
a
function
of
frequency.
5.5
Repeat
5.1
through
5.4
for
all
desired
frequencies.
5.6
Report
the
average
permittivity
and
loss
at
the
frequen¬
cies
requested.
6
Notes
6.1
Correct
calibration
and
operation
of
the
test
equipment
is
required
to
obtain
accurate
measurement
of
permittivity
and
loss.
Proper
sample
preparation
is
also
very
important
for
obtaining
useful
data
from
this
test.
Calibrate
the
materials
analyzer
in
accordance
with
manufacturer's
instructions.
An
automatic
program
has
been
developed
for
the
HP
4291
A,
which
will
ease
calibration
and
setup
(see
6.6).
6.2
The
permittivity
should
decrease
slightly
with
increasing
frequency.
If
it
increases
greatly
or
decreases
more
than
0.2
units
from
approximately
20
MHz
to
1
.2
GHZ,
reposition
(reset)
the
sample
in
the
fixture
and
measure
again
(check
for
debris
between
the
electrodes;
blow
out
with
air).
6.3
Testing
at
temperatures
and
humidities
other
than
room
temperature
may
be
performed
with
this
instrument,
as
a
spe¬
cialized
fixture
can
be
placed
in
a
temperature
chamber.
A
temperature
chamber
must
be
used
when
testing
with
this
fixture
under
conditions
where
condensation
might
contami¬
nate
the
electrodes,
as
such
contamination
gives
spurious
results.
6.4
The
pressure
of
the
test
fixture
on
the
specimen
affects
the
measured
permittivity
and
loss
values,
in
particular
for
un-metallized
test
specimens.
Too
light
of
pressure
reduces
the
area
of
electrode/sample
contact,
thus
leaving
air
gaps,
which
result
in
erroneous
measurements.
If
the
pressure
is
too
high,
the
sample
can
be
reduced
in
thickness
and
the
mea¬
sured
values
would
be
incorrect
because
the
thickness
is
unknown.
Making
measurements
while
adjusting
the
force
should
lead
the
operator
to
a
force
setting
where
the
mea¬
sured
value
is
independent
of
the
force
applied.
6.5
The
HP
4291
Materials
Analyzer
and
related
fixtures
and
calibration
kits
are
available
from
Hewlett
Packard,
(800)
452-
4844.
6.6
Reference
Program
for
Automatic
Calibration
and
Operation
This
automatic
calibration
and
operation
pro¬
gram
was
developed
for
the
HP
4291A
and
is
published
in
this
method
as
a
reference.
Although
the
program
listed
in
this
section
has
been
tested
and
used,
it
is
given
here
for
^refer¬
ence
only.”
6.6.1
Procedure
Using
Automatic
Program
Turn
on
the
analyzer
with
the
program/calibration
disk
in
the
drive
and
fol¬
low
the
user
friendly
calibration
instructions,
which
appear
on
the
monitor.
The
calibration
on
the
HP4291
lasts
about
24
hours;
after
that,
it
begins
to
drift
and
provides
slightly
higher
values
as
a
function
of
time.
The
calibration
procedure
in
6.6.1
.1
through
6.6.1
.10
should
therefore
be
performed,
at
a
minimum,
on
a
daily
basis.
During
the
calibration
procedure,
the
line
traces
on
the
monitor
should
be
observed
during
each
step.
Noisy
or
erratic
traces
are
an
indication
of
external
inter¬
ference.
If
noise
is
observed,
the
calibration
procedure
should
be
aborted
and
rerun.
Clean
the
electrode
on
the
test
head,
standards,
and
fixture
connections
and
electrodes
on
a
regu¬
lar
(weekly)
basis.
Blow
dry.
6.6.1.
1
Allow
at
least
30
minutes
for
the
unit
to
warm
up
and
stabilize.
6.6.1.
2
As
the
unit
is
a
frequency
sweeping
unit,
enter
the
start
and
stop
frequency
(in
megahertz)
of
the
test
(single
fre¬
quency
tests
use
close
start/stop
frequencies,
which
should
be
±
0.5%
of
the
target
frequency).
6.6.1.
3
Place
the
OS
(open)
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
"xl”
on
the
unit.
IPC-TM-650
Number
Subject Date
Revision
Page 3 of 5
2.5.5.9
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
11/98
6.6.
1.4
Place
the
OQ
(short)
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1”
on
the
unit.
6.6.1
.5
Place
the
50Q
calibration
standard
on
the
test
head
as
prompted
on
the
unit's
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1
”
on
the
unit.
6.6.1.
6
Place
the
HP
1
6453A
test
fixture
or
equivalent
on
the
test
head
as
specified
in
accordance
with
the
manufactur¬
er^
instructions
as
prompted
on
the
unit's
monitor.
6.6.1.
7
Open
the
fixture
gap
and
lock
it
open
as
prompted
on
the
monitor
and
press
Return
on
the
unit's
keyboard
or
“x1''
on
the
unit.
6.6.
1.8
Short
the
fixture
gap
as
prompted
on
the
monitor
and
press
Return
on
the
unit's
keyboard
or
"x1
on
the
unit.
6.6.1
.9
Place
the
pure
PTFE
specimen
in
the
fixture
in
close
contact
with
electrodes
and
with
the
PTFE
specimen
not
touching
the
back
wall
of
the
fixture,
then
press
Return
on
the
unit's
keyboard
or
“x1”
on
the
unit.
Pull
out
the
PTFE
and
recheck.
Permittivity
should
be
within
±
0.01
or
±
0.02
units.
If
not,
recalibrate
starting
at
"Fixture."
If
it
is
still
off,
redo
the
calibration
from
beginning.
6.6.1.10
Test
the
sample
in
accordance
with
Section
5.
6.6.2
The
following
calibration/test
program
is
the
latest
ver¬
sion
of
what
was
developed
for
the
P
H4291
A.
Using
a
text
editor
(no
embedded
coding),
enter
this
program
on
a
DOS-
formatted
disk
and
name
it
''AUTOST.''
Place
the
disk
in
the
unit
and
turn
it
on
(If
you
have
any
improvements
PLEASE
for¬
ward
them
to
the
IPG):
The
program
disk
will
calibrate
and
configure
the
instrument's
screen.
Two
windows
will
appear.
The
top
window
should
be
permittivity
(ET)
and
the
bottom
window
should
be
loss
tangent
(8).
Both
windows
should
be
set
to
the
frequency
range
entered
in
6.3.1.
2.
If
they
are
not,
return
to
6.3.1
and
repeat
the
process.
100
!****
PLEASE
SET
PTFE
THICKNESS
ON
LINE
1610
AND
2600
****
110
!****
PLEASE
SET
PTFE
PERMITTIVITY
ON
LINE
2580
120
!****
PLEASE
SET
PTFE
LOSS
TANGENT
ON
LINE
2590
130
!****
200
!****
SAVE
THIS
PROGRAM
ON
A
DOS
FORMATTED
210
!****
DISK
USING
A
TEXT
EDITOR
(LINES
100-5000
220
!****
NAME
THE
PROGRAM
'
'AUTOST''
WITH
NO
EXTENSION
230
!****
PSCE
DISK
IN
UNITS
DRIVE
AND
TURN
UNIT
ON
240
!****
PROGRAM
WILL
AUTOMATICALLY
RUN.
TO
RESET
250
!****
UNIT
FOR
NEW
FREQUENCY
RANGE
PRESS
“STOP”
260
!****
ON
UNITS
FACE
THEN
“START''
ON
UNITS
FACE.
270
!****
IF
YOU
WANT
TO
RE-CALIBRATE
ANSWER
YES
[1]
280
!****
WHEN
PROMPTED
290
!****
WOO
!****
INITIALIZE
UNIT
FOR
TEST
***
1010
ASSIGN
@Hp4291
TO
800
1
020
Scode=8
1030
CLEAR
@Hp4291
1040
ABORT
Scode
1050
OUTPUT
@Hp4291;"DISP:ALL
BST”
1070
!
1100
!****
CALIBRATION
STATE
CHECKING
****
1110
OUTPUT
@Hp4291;,,SENS:CORR1
?”
1120
ENTER
@Hp4291
;Stat
230
IF
Stat
THEN
1130
INPUT
,(RE-CALIBRATE
NOW?
[1]
Yes;
[0]
No
[RETURN
OR
x1]'',Ans$
1140
IF
Ans$<>“1”
THEN
GOTO
Testjoop
1150
END
IF
1160
!
1200
!****
SETTING
UP
START/STOP
FREQUENCY
****
1210
INPUT
"Enter
Start
Frequency
in
MH
乙
[RETURN
OR
x1]'',A
1220
B=A*1
000000
1230
OUTPUT
@Hp4291;“SENS:FREQ:STAR
”旧
1240
INPUT
“Enter
Finish
Frequency
in
MH
乙
[RETURN
OR
1250
B=A*1
000000
1260
OUTPUT
@Hp4291;“SENS:FREQ:STOP
";B
1270
!
1300
!****
SETTING
ENABLE
REGISTER
FOR
SRQ
****
1310
OUTPUT
@Hp4291
;
11
STAT:
INST:
ENAB
256"
1320
OUTPUT
@Hp4291;“*SRE
4”
1330
!
1400
!****
SETTING
TRIGGER
SOURCE
INTERNAL,
CON¬
TINUOUS
OFF
****
1410
OUTPUT
@Hp4291;,,TRIG:SOUR
I
NT"
1420
OUTPUT
@Hp4291;llINIT:CONT
OFF"
1430
!
1500
!****
SETTING
CAL
MODE
TO
FIXED/USER
****
1510
OUTPUT
@Hp4291;“SENS:CORR1:COU_FPO
USER”
1520
OUTPUT
@Hp4291
;<<SENS:CORR2:COLL:FPO
USER"
IPC-TM-650
Number
Subject Date
Revision
Page 4 of 5
2.5.5.9
Permittivity
and
Loss
Tangent,
Parallel
Plate,
1
MHz
to
1.5
GHz
11/98
1530
!
1600
!****
SET
PTFE
STANDARD
THICKNESS
IN
METERS
ON
LINE
1610****
1610
OUTPUT
@Hp4291
;,JCALC:MATH1
:DIM1
0.00075"
1620
!
1700
!****
MEASUREMENT
TYPE
er'
AND
tan
delta
****
1710
OUTPUT
@Hp4291;“DUAM
DRLT"
1720
!
1800
!****
FORMAT
LINES
LIN
Y-AXIS
****
1810
OUTPUT
@Hp4291;“DISP:TRAC:Y:SPAC
LIN"
1820
!
1900
!****
SWEEP
SETTINGS
****
1910
OUTPUT
@Hp4291
广
SENS:SWE:SPAC
LOG"
1920
OUTPUT
@Hp4291
;“SENS:SWE:TIME:AUTO
ON"
1930
OUTPUT
@Hp4291
;1JSENS:SWE:POIN
256"
1940
OUTPUT
@Hp4291;“SENS:SWE:DWEL1
AUTO
ON”
1950
!
2000
!****
CHANNEL
1
SETUP
****
2010
OUTPUT
@Hp4291
j'INST
CH1”
2020
OUTPUT
@Hp4291
广
CALCFORM
REAL"
2030
OUTPUT
@Hp4291
;UDISP:TRAC1
:STAT
ON”
2040
OUTPUT
@Hp4291
;“DISP:TRAC1
:Y:BOTT
V’
2050
OUTPUT
@Hp4291
;“DISP:TRAC1
:Y:TOP
12”
2060
OUTPUT
@Hp4291
;''CALC:EVALON''“TR1
''''''
2070
OUTPUT
@Hp4291
CALC:
EVAL:
Y:XPOS
1MHZ"
2080
OUTPUT
@Hp4291
;UCALC:EVALMST
ON”
2090
!
2200
!****
CHANNEL
2
SETUP
****
2210
OUTPUT
@Hp4291
;"INST
CH2”
2220
OUTPUT
@Hp4291
;,jCALC:FORM
LTAN"
2230
OUTPUT
@Hp4291
;“DISP:TRAC1
:STAT
ON”
2240
OUTPUT
@Hp4291
;UDISP:TRAC1
:Y:BOTT
-05'
2250
OUTPUT
@Hp4291
;“DISP:TRAC1
:Y:TOP
1
.5"
2260
OUTPUT
@Hp4291
;“CALC:EVAL:ON''“TR1
''''''
2270
OUTPUT
@Hp4291
CALC:
EVAL:
Y:XPOS
1MHZ"
2280
OUTPUT
@Hp4291
(
CALC:
EVAL
MST
ON"
2290
OUTPUT
@Hp4291
j'INST
CH1
''
2300
!
2400
!****
SETUP
AVERAGING
****
2410
OUTPUT
@Hp4291;,,SENS:AVER1
ON”
2420
OUTPUT
@Hp4291
;“SENS:AVER1
:COUN
10;STAT
ON”
2430
!
2500
!****
SELECT
1
6453A
FIXTURE
AND
COMPENSATE
****
2510
!****
PLEASE SET
PTFE
STANDARD
PERMITTIVITY
ON
LINE
2580
****
2520
!****
PLEASE SET
PTFE
STANDARD
LOSS
TANGENT
ON
LINE
2590
****
2530
!****
PLEASE
SET
PTFE
STANDARD
THICKNESS
IN
METERS
ON
LINE
2600
****
2540
OUTPUT
@Hp4291
;41DISP:FORM
ULOW”
2550
OUTPUT
@Hp4291
;,lDISP:ALL
BST"
2560
OUTPUT
@Hp4291
;“SYST:FIXT
HP16453”
2570
OUTPUT
@Hp4291
;<,SENS:CORR2:CKIT2
TEFL"
2580
OUTPUT
@Hp4291
;4,SENS:CORR2:CKIT2:STAN6:PRE
2.1”
2590
OUTPUT
@Hp4291
;,,SENS:CORR2:CKIT2:STAN6:PLF
0.0001
M
2600
OUTPUT
@Hp4291;"SENS:CORR2:CKIT2:STAN6:
THIC
0.00075”
2610
OUTPUT
@Hp4291;<,SENS:CORR2:CKIT2:SAVE^^
2620
!
2700
!****
OPEN
STANDARD
MEASUREMENT
****
2710
ON
INTR
Scode
GOTO
Open_end
2720
OUTPUT
@Hp4291
;,^*CLS;*OPC?^^
2730
ENTER
@Hp4291
;Opc
2740
INPUT
“CONNECT
OPEN
(OS)
STANDARD,
THEN
PRESS
[RETURN
OR
x1『,A$
2750
ENABLE
INTR
Scode;2
2760
OUTPUT
@Hp4291
广
SENSQORR1
:COLL
STAN1
''
2770
Wait_open:GOTO
Wait_open
2780
Open_end:l
2790
!
2900
!****
SHORT
STANDARD
MEASUREMENT
****
2910
ON
INTR
Scode
GOTO
Short_end
2920
OUTPUT
@Hp4291
;“*CLS;*OPC?”
2930
ENTER
@Hp4291
;Opc
2940
INPUT
“CONNECT
SHORT
(0
OHM)
STANDARD,
THEN
PRESS
[RETURN
OR
x1『,A$
2950
ENABLE
INTR
Scode;2
2960
OUTPUT
@Hp4291
;4,SENS:CORR1
:COLL
STAN2”
2970
Wait_short:GOTO
Wait_short
2980
Short_end:!
2990
!
3100
!****
50
OHM
LOAD
STANDARD
MEASUREMENT
****
3110
ON
INTR
Scode
GOTO
Load_end
3120
OUTPUT
@Hp4291;^,*CLS;*OPC?^^
3130
ENTER
@Hp4291;Opc
3140
INPUT
“CONNECT
50
OHM
STANDARD,
THEN
PRESS
[RETURN
OR
x1]”,A$
3150
ENABLE
INTR
Scode;2
3160
OUTPUT
@Hp4291
;4,SENS:CORR1
:COLL
STAN3"
3170
Wait_load:GOTO
Wait_load
3180
Load_end:!
3190
!
3300
!****
SAVE
UNIT
CALIBRATION
****
3310
OUTPUT
@Hp4291;“SENS:CORR1:COLLSAVE''
3320
!