Smart Gui - Algorithm Training Material_rev1.pdf - 第264页

Copyright © ViT rox All Rights Reserved . Analysis Mode Curve Length Threshold (um) 255 Width Threshold (um) 255 Criteria Relationship AND/ OR Bright Defect Count 255 Dark Defect Count 255 Bright Defect Fail As: Off Dark…

Analysis Mode Blob

Bright Min Size (px) 255

Dark Min Size (px) 255

Bright Defect Count 255

Dark Defect Count 255

Bright Defect Fail As: Off

Dark Defect Fail As: Off

Inspect and Analysis (Analysis Tab)

1. Analysis Mode: Blob is used when inspected defect is a chunk or a blob, please refer to the example

given in the slide

2. Bright Min Size (px)/ Dark Min Size (px)

a. The defect should be equal or higher than the pixel set in the tab to classify it as defect set by user.

3. Bright / Dark Defect Fail As:

a. This would prompt the defect set by users

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Analysis Mode Curve

Length Threshold (um) 255

Width Threshold (um) 255

Criteria Relationship AND/ OR

Bright Defect Count 255

Dark Defect Count 255

Bright Defect Fail As: Off

Dark Defect Fail As: Off

Inspect and Analysis (Analysis Tab)

1. Analysis Mode: Curve is used to classify or detect a scratch on surface

2. Length/ Width Threshold (micron)

a. The defect would need to have the length or width of the micron set by user to classify as defect

3. Criteria Relationship: (AND / OR) => Length (AND / OR) width to classify as defect

4. Bright/ Dark Defect Count (Same as Blob)

5. Bright/ Dark Fail As (Same as Blob)

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Inspection Results

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