Smart Gui - Algorithm Training Material_rev1.pdf - 第265页
Copyright © ViT rox All Rights Reserved . Inspection Results 265
Copyright © ViTrox All Rights Reserved.
Analysis Mode Curve
Length Threshold (um) 255
Width Threshold (um) 255
Criteria Relationship AND/ OR
Bright Defect Count 255
Dark Defect Count 255
Bright Defect Fail As: Off
Dark Defect Fail As: Off
Inspect and Analysis (Analysis Tab)
1. Analysis Mode: Curve is used to classify or detect a scratch on surface
2. Length/ Width Threshold (micron)
a. The defect would need to have the length or width of the micron set by user to classify as defect
3. Criteria Relationship: (AND / OR) => Length (AND / OR) width to classify as defect
4. Bright/ Dark Defect Count (Same as Blob)
5. Bright/ Dark Fail As (Same as Blob)
264
Copyright © ViTrox All Rights Reserved.
Inspection Results
265
Copyright © ViTrox All Rights Reserved.
266
Common Algorithm in CR, B, S, U Algorithm