IPC-TM-650 EN 2022 试验方法.pdf - 第109页

NIST Certified Standards 5.5 The test settings used for measuring the metallic foil samples shall be the same as used for measuring the NIST- certified standards. 6 Measurement Parameters and Machine setup 6.1 All measur…

1 Purpose This procedure establishes proper methods and

practices for quantifying the surface topography/texture of

metallic foil using a noncontact, optical or laser, 3-D surface

measurement device. The primary reported values will include

Sa, Sq and Sz (see 6.3 for further information on these param-

eters) where S values are 3-D measures.

2 Applicable Documents

2.1 IPC

IPC-4562 Metal Foil for Printed Board Applications

2.2 International Standards

ISO 16610 Geometrical Product Specifications (GPS) –

Filtration

ISO 25178-2 Surface Texture: Areal – Part 2: Terms, Defini-

tions and Surface Texture Parameters

3 Metallic Foil Sample Preparation

3.1

The samples tested will be a single-layer material taken

from a representative location of metallic foil. The size of the

physical sample will be determined based on the easiest

method for obtaining a representative sample, but should be

no larger than 50 mm x 50 mm [nominally 2 in x 2 in]. Opera-

tors of the measurement tool will orient the sample so the

measurements are across the machine direction of the foil

sample or the surface of the Physical NIST Traceable

Standards.

3.2 The samples will be tested as received, but proper care

must be taken to prevent scratches, dents or bending to

insure the integrity of the surface. Operators of the measure-

ment tool will orient the sample so that the measurements are

across the machine direction of the foil sample.

4 Equipment / Environment

4.1

A noncontact 3-D tool will be used for this procedure

and it will be calibrated according to the machine manufactur-

er’s instructions.

Examples: Wyko-NT-1100, Zygo 5000, Zygo 600, Veeco

NT-9300, Keyence VK-9700 or equivalent.

4.2 The tool will be placed on a lab bench or other sturdy

table top and should be placed in an area away from

machines that produce large amounts of noise/vibration.

Follow test device manufacturer’s recommendations for envi-

ronmental conditions, including for vibration.

5 Procedure for testing upon metallic foil and physical

NIST Traceable Standards

5.1

The operator will set up the measurement tool program

to scan a minimum area of 200,000 square microns having a

maximum length to width aspect ratio of 5:1 with an objective

magnification of 50X for measuring the surface roughness of

either a physical standard or a foil sample. Such specification

requirements may necessitate stitching or ‘‘step and repeat-

ing’’ multiple images so as to obtain data from a properly

sized area.

5.2 No filters shall be used with this test method.

5.3 Prior to measurement of metallic foil samples the tool

operator will assure the 3-D tool is currently properly cali-

brated. Verification needs to be performed by testing the

actual physical NIST Traceable Standards at least monthly on

the 3-D measurement tool.

5.4 Physical Standards will be oriented so the measurement

is perpendicular to the grain of the Standards. Operator will

locate the measurement center point in the XY axis to match

the XY center point of the specific patch being measured on

the Standard set. This is done to assure the measurement

always takes place in the same location upon the Standard

surface.

1. www.ipc.org

2. www.iso.org

3000 Lakeside Drive, Suite 105N

Bannockburn, IL 60015-1249

IPC-TM-650

TEST METHODS MANUAL

Number

2.2.22

Subject

Noncontact Metallic Foil Surface Topography/

Texture

Date

5/20

Revision

Originating Task Group

Metallic Foil Task Group (3-12a)

Material in this Test Methods Manual was voluntarily established by Technical Committees of IPC. This material is advisory only

and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this

material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.

Equipment referenced is for the convenience of the user and does not imply endorsement by IPC.

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NIST Certified Standards

5.5 The test settings used for measuring the metallic foil

samples shall be the same as used for measuring the NIST-

certified standards.

6 Measurement Parameters and Machine setup

6.1

All measurements will be done using a saved set-up and

measurement parameters (commonly termed ‘‘a template’’) to

insure that all measurements are done using the exact same

test method. Programs and procedures for each piece of spe-

cific equipment shall be saved and distributed to colleagues

across the country so all facilities are taking the exact same

measurements using the exact same test procedure. For

example, procedures for laser or white light techniques will be

different.

6.2 The equipment manufacturer should be consulted to

define the specific measurement machine template needed to

assure compliance with this measurement procedure.

6.3 The specifics of the surface measurements are listed

below.

Primary Measurement Values: Sa, Sq, Sz

• Sa is defined as the average absolute value height in refer-

ence to the mean plane.

• Sq is defined as the root mean square (RMS) height in ref-

erence to the mean plane.

• Sz is defined as the absolute vertical distance between the

highest peak and deepest valley.

7 Measurement Results

7.1

The values for Sq, Sa and Sz will be used to quantify the

overall surface texture/topography of various metallic foils and

will be reported. These values were chosen as they provide

the most up-to-date surface measurement capabilities using a

noncontact 3-D surface measurement tool.

Height 9 mm

x 200 µm (width); centered on the xy axis

Center point of Measurement spot and Standard

Grain direction of the standard is across the width

Measurement standard minimum size 1000 µm (height)

Width 3 mm

IPC-TM-650

Number

2.2.22

Subject

Noncontact Metallic Foil Surface Topography/Texture

Date

5/20

Revision

Page2of5

APPENDIX A

A.1 Surface Roughness Standard: ISO 25178-2 This

ISO standard is grouped into six different categories and each

of these values are reported in the ‘‘Height Parameters’’ sec-

tion. The conventional ISO 4287:2001 was defined for

contact-type tools and does not provide as much detail as the

ISO 25178-2 standard.

A.1.1 Filter Type: Gaussian Filter This is used for deter-

mining the mean plane in surface metrology. This is defined by

ISO 1661 and is applied to areal surface roughness measure-

ments.

A.1.2 Surface Type: S-L Surface Defines a surface

obtained after using the L-Filter. This filter removes undula-

tions and other surface variations, allowing for the measure-

ment of only the surface topography/texture without

geometric influence.

A.1.3 S-Filter This is chosen based on the specifications of

the objective lens used to capture the data. This filter elimi-

nates the smallest scale elements from the surface, shortest

wavelength filter. S-filter should be no smaller than the spot

size multiplied by 2.5.

A.1.4 F-Operation: Plane Correction Chosen based on

the planar features of the surface of metallic foils.

A.1.5 L-Filter This is chosen based on the area of the total

minimum scanned section (1000 µm X 200 µm). This filter

eliminates the largest scale elements from the surface, longest

wavelength filter. L-filter should be no larger than entire scan

length divided by 5.

A.2 Filter Selection and Filter Explanations

A.2.1

The main differentiator between the ISO 4287 and ISO

25178 is how the acquired data set is processed to maximize

the accuracy of the calculated roughness values. The old

standard used terms like λs and λc to account for the stylus

tip size and total evaluation length, which are specific towards

contact profilers. The newest standard uses filters to account

for similar features of noncontact 3-D profilers: the objective

lens used for analysis and total XYZ coverage area. Listed

below is additional detail to describe how the S-filter,

F-operation and L-filter are defined.

S-Filter:

• Commonly known as a low-pass filter.

• This filter is equivalent to λs for line roughness defined by

ISO 4287.

• Eliminates noisy data that varies based on the size of beam

spot. This will vary based on the objective lens chosen for

the analysis. (see below for explanation)

Low mag lens, larger beam spot, high

S-filter value

High mag lens, smaller beam spot, low

S-filter value

Vs.

IPC-TM-650

Number

2.2.22

Subject

Noncontact Metallic Foil Surface Topography/Texture

Date

5/20

Revision

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