IPC-TM-650 EN 2022 试验方法.pdf - 第787页
1.0 Scope 1.1 To determine the resistance to current leakage offered by the insulation materials and the various seals of a connec- tor to a DC potential tending to produce such leakage through or on the surface of these…
variations shown in Figure 1 for a period of time correspond-
ing to one of the test conditions shown in Table 1. Unless
otherwise specified, Test Condition B shall apply.
5.3.2 Sub-Cycle (See 6.3) During any five of the first nine
humidity temperature cycles, the test specimen shall be sub-
jected to the following sub-cycle, if specified.
5.3.2.1 Step 7a Within one to four hours after the begin-
ning of Step 7, the test specimen shall be exposed to a tem-
perature of -10°C ± 2°C for a minimum period of three hours.
5.3.2.2 Step 7b Within fifteen minutes after completion of
Step 7a, the test specimen shall be subjected to the following
vibration along any one axis.
Motion — Simple Harmonic (approx.)
Amplitude — 0.60 inch DA
Frequency Range — 10 to 55 Hz
Sweep Rate — 10 to 55 to 10 Hz in 60 seconds (approx.)
Test Duration — 15 minutes
5.3.3 Final Measurements
5.3.3.1 At High Humidity (See 6.2)
Upon completion of
Step 6 of the final cycle, the test specimen shall be maintained
at a temperature of 25°C ± 2°C and a relative humidity of
90-98% for a period of 1-1/2 to 3-1/2 hours, after which the
measurements specified in the individual connector specifica-
tion shall be performed.
5.3.3.2 During Recovery Period After removal from the
test chamber, and while maintained at room ambient condi-
tions, the test specimen shall be subjected to the specified
measurements during the specified recovery period.
5.3.3.3 After Recovery Period Upon completion of Step
6 of the final cycle, or following the specified measurements at
high humidity and/or during a recovery period, the test speci-
men shall be maintained at room ambient conditions for
twenty-four hours (or as otherwise specified); the required
measurements shall then be performed.
6.0 Notes
6.1
Acceptance criteria shall be established in terms of one,
or any combination, of the following:
A. The minimum insulation resistance during or after the test.
B. Dimensional changes affecting the functionality of the test
specimen.
C. Corrosion of metals.
D. Structural damage or deterioration.
6.2 Due to the difficulty in making measurements under high
humidity conditions, the individual connector specification
shall specify the particular precautions to be followed in mak-
ing measurements under such conditions.
IPC-TM-650
Number
3.5
Subject
Humidity, Connectors
Date
7/75
Revision
A
Page3of3
1.0 Scope
1.1
To determine the resistance to current leakage offered
by the insulation materials and the various seals of a connec-
tor to a DC potential tending to produce such leakage through
or on the surface of these members. The test is especially
useful in determining the extent to which insulating properties
are affected by deteriorative influences, such as heat, mois-
ture, contamination, or loss of volatile materials.
2.0 Reference Documents
2.1
Information in this section is intended to parallel the test
method described in EIA-RS-364/TP-21.
3.0 Test Specimen
3.1
A plug, receptacle, or mated connector as specified in
the individual connector specification.
4.0 Apparatus
4.1 Megohmmeter
4.1.1
Resistance measurement accuracy shall be such that
the value being measured is accurate to 5 percent.
4.1.2 Test voltage shall be adjustable to within ± 2 percent
of required value.
5.0 Procedure
WARNING:
POTENTIALS USED DURING THIS TEST MAY
PROVE HAZARDOUS TO PERSONNEL. TAKE PRECAU-
TIONS TO PROTECT PERSONNEL FROM ACCIDENTAL
EXPOSURE TO THESE TEST POTENTIALS.
5.1 If, required by the individual connector specification, the
plug and/or receptacle shall be cleaned prior to the test to
insure that it is free from excess dust, oil, moisture, or other
surface contaminants; all observed conditions shall be
recorded.
5.2 Samples that have been subjected to environmental
conditions shall be measured within 1/2 to 3 hours after
removal from the chamber, unless otherwise specified.
5.3 The insulation resistance shall be measured between
individual pairs of immediately adjacent contacts and between
the shell and/or engaging hardware (if they exist) and the clos-
est individual contact(s).
NOTE: The same contact locations for a given connector
shall be used each time the insulation resistance test is per-
formed.
5.4 The specified test potential (or 500 volts DC if no poten-
tial is specified) shall be applied for a two-minute period.
Immediately after this electrification period, the insulation
resistance shall be measured. If, during the two-minute period
the instrument indicates that the insulation resistance meets
the specified minimum and is steady or increasing, the test
may be terminated before the end of the electrification period.
CAUTION:
EXERCISE CARE TO AVOID A DIRECT SHORT
CIRCUIT OF THE TESTING APPARATUS SINCE DAMAGE
TO THE INSTRUMENT MAY RESULT.
6.0 Notes
6.1
Acceptance criteria shall be established as the minimum
level of insulation resistance compatible with end-item usage
of the connector. This resistance is an inherent characteristic
of connector geometry (e.g., contact spacing) and materials.
2215 Sanders Road
Northbrook, IL 60062-6135
IPC-TM-650
TEST METHODS MANUAL
Number
3.6
Subject
Insulation Resistance, Connectors
Date
7/75
Revision
A
Originating Task Group
N/A
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page1of1
ASSOCIATION CONNECTING
ELECTRONICS INDUSTRIES
1.0 Scope
1.1
To evaluate the contact resistance of electrical contacts
where the applied voltage and current are low.
2.0 Reference Documents
2.1
Information in this section is intended to parallel the test
method described in EIA-RS-364/TP-23.
3.0 Test Specimen
3.1
The mated contacts of a connector mounted and, when
required, terminated in its normal manner or a mated pair of
individual contacts.
NOTE:
When mated contact pairs, not requiring housings,
are tested, they shall be rigidly mounted in a fixture to provide
mechanical stability and to insure proper mating and orienta-
tion.
3.2 Voltage connections shall be attached permanently by
soldering, crimping, or wire-wrapping as appropriate and shall
be positioned as follows:
A. Wire Hole — On the contact within 1/8 inch of insulator.
B. WrapPost — On the wrap-post adjacent to the outer turn
of wire.
C. Crimp — Crimped to the contact simultaneously with the
current lead.
D. Solder Tab — On the printed wiring traces as close to the
termination as practicable.
E. Press-Fit — On the pad of the plated-through hole as
close to the termination as practicable.
If the pad of the printed wiring board constitutes one-half of
the mated contact pair, the voltage connection shall be sol-
dered to the pad immediately adjacent to, but not touching,
the mating contact.
NOTE:
In case of environment resistant (sealed) connector,
the voltage connections shall be attached as close to the seal-
ing grommets as practicable.
3.3 Unless otherwise specified in the individual contact or
connector specification, the test samples shall not be cleaned
by any means prior to the test nor shall any lubricants or other
coatings be applied.
4.0 Apparatus
4.1 Microvoltmeter
The meter accuracy shall be such that
the voltage value is measured within 2 percent.
4.2 Milliammeter (optional) The meter accuracy shall be
such that the current value is measured within 2 percent.
4.3 0.001 OHM resistor accurate to ± 1 percent.
4.4 Power supply capable of delivering 1 milliampere at 1.35
volts DC potential.
5.0 Procedure
CAUTION:
THE CONTACTS UNDER TEST SHALL NOT BE
SUBJECTED TO A POTENTIAL GREATER THAN 20 MILLI-
VOLTS DC (OR 20 MILLIVOLTS PEAK AC) EITHER PRIOR TO
OR DURING THE TEST.
5.1 The low level test shall be conducted using a circuit
comparable to that shown in Figure 1, which will deliver a one
(1) milliampere sample current when the variable resistor is
adjusted to provide a 20 millivolt open circuit potential
between TI and T2. The 3-position switch shown in Figure 1
shall be opened before each measurement to zero the voltme-
ter.
NOTE:
The total resistance between points T1 and T2 shall
be less than 100 milliohms.
5.2 The voltage drop across each pair of mated contacts
with the current successively in both directions through the
test specimen shall be measured. The contact resistance shall
be calculated, in both the forward and reverse direction, by
dividing the voltage drop reading by the current reading. The
average of the two resistance values thus obtained for each
contact shall not exceed the maximum allowable contact
resistance as defined in the individual contact or connector
specification.
2215 Sanders Road
Northbrook, IL 60062-6135
IPC-TM-650
TEST METHODS MANUAL
Number
3.7
Subject
Low Level Circuit Connectors
Date
7/75
Revision
A
Originating Task Group
N/A
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page1of2
ASSOCIATION CONNECTING
ELECTRONICS INDUSTRIES