IPC-TM-650 EN 2022 试验方法.pdf - 第809页
1 Scope This test method is used to determine the effects of exposure to elevated ambient temperature on the electrical and mechanical characteristics of a connector. 2 Applicable Documents None 3 Test Specimen 3.1 A mat…
Table 1
Barometric Pressure* Altitude**
In. of
Mercury
MM of
Mercury Feet Meters
27 to 31 685 to 785 Seal Level Seal Level
17.4 442 15,000 4,572
3.44 87.4 50,000 15,240
1.40 35.6 70,000 21,336
0.35 8.9 100,000 30,480
0.045 1.14 150,000 45,720
*Source-U.S. Standard Atmosphere 1966.
**Altitude is given as a reference only and should not be specified without
barometric pressure as a test requirement.
IPC-TM-650
Number
3.13
Subject
Withstanding Voltage, Connectors
Date
7/75
Revision
A
Page2of2
1 Scope This test method is used to determine the effects
of exposure to elevated ambient temperature on the electrical
and mechanical characteristics of a connector.
2 Applicable Documents None
3 Test Specimen
3.1
A mated connector (plug and receptacle) complete with
all applicable guide, keying, and engaging hardware shall be
terminated and mounted in its normal manner during this test.
3.2 The card-edge receptacle and an applicable PCB of
minimum thickness shall be mated during this test, except as
otherwise specified.
4 Equipment/Apparatus
4.1
A suitable chamber capable of maintaining the appli-
cable temperatures within ± 20°C at the geometric center
under no load conditions. Thermal distribution shall not
exceed ± 50°C of the temperature at the geometric center.
4.2 A thermocouple bridge, potentiometer, or resistance
bridge of suitable range for the specified test conditions
5 Procedure
5.1
The chamber shall be adjusted to, and maintained at,
the temperature specified in the individual connector specifi-
cation. Thermal equilibrium shall be attained prior to the start
of the test (see 6.3).
5.2 The mated test specimen shall be suspended within the
test chamber and subjected to the specified temperature for
the required time duration called out in the individual specifi-
cation.
Note: Table 1 and Table 2 may be used as a reference for
test temperatures and test times, however, the individual con-
nector specification shall take precedence.
5.3 If groups of samples are tested, they shall be mounted
in a manner, such that the normal heat dissipation, absorp-
tion, conduction, or reflection characteristics inherent in the
connector are not infringed.
5.4 The connector test potentials, duty cycle load, and other
operating conditions during exposure shall be specified in the
applicable connector specifications
5.5 At the completion of the specified exposure time, the
conductors shall be stabilized at ambient temperature and
checked for low level circuit and insulation resistance, unless
otherwise specified in the individual connector specification.
5.6 Visual examination shall be for evidence of the following:
A. Permanent dimensional changes or distortion
B. Cracking or delamination of finishes or dielectric materials
C. Opening of seals or seams
D. Hardening or softening of dielectric materials
E. Fusing or seizure of mating connectors or components
Table 1 Test Temperatures
Test Condition Chamber Temperature (°C)
155
270
385
4 105
5 125
6 150
7 200
Table 2 Length of Test
Test Time Condition Hours
A96
B 300
C 500
D 1000
E 1500
F 2000
G 3000
H 5000
2215 Sanders Road
Northbrook, IL 60062-6135
IPC-TM-650
TEST METHODS MANUAL
Number
3.14
Subject
High Temperature Life, Connectors
Date
7/75
Revision
Originating Task Group
Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
Page1of2
ASSOCIATION CONNECTING
ELECTRONICS INDUSTRIES
6 Notes
6.1
Acceptance criteria shall be established in terms of one
or any combination of the following:
A. Visible evidence of damage or significant material change
B. Deterioration of low level circuit or insulation resistance
beyond allowable specified limits, or other requirements
called out in an individual specification
6.2 The test chambers shall be of the forced- (circulating) air
type to ensure temperature distribution.
6.3 Thermal equilibrium shall be assumed, when three suc-
cessive thermocouple readings taken at five-minute intervals
indicate variations of 30°C or less.
6.4 Information in this test method is intended to parallel the
test method described in EIA-RS-364/TP-17.
IPC-TM-650
Number
3.14
Subject
High Temperature Life, Connectors
Date
7/75
Revision
Page2of2