IPC-TM-650 EN 2022 试验方法.pdf - 第585页

4 Apparatus 4.1 DC power supply capable of providing voltage in the range of 10 V to 100 V, with an accuracy of at least ± 10%, and capable of supplying current in the range of 0 mA to 1 mA at those voltage levels 4.2 DC…

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1
Scope
The
purpose of this test method is to quickly
assess the adequacy of a given Anisotropically Conductive
Adhesive Film (ACF) construction and bonding process for
avoiding short circuits between adjacent traces of a flex circuit
being bonded to a low profile circuit substrate.
1.1
Purpose
ACF
materials are often used to interconnect
fine-pitch flexible circuitry to substrates such as flat-panel dis-
plays. A center to center pitch range of 80 µm to 200 µm is
not uncommon in circuits for flat panel display applications. It
is critical that the particle dispersion within the ACF be of suf-
ficient quality such that there is no inherent tendency for short
circuits between adjacent traces. In addition, it is important
that a bonding process is used, which doesn’t create any
undue accumulation of particles, which will lead to short cir-
cuits.
2
Applicable Documents
None
3
Test Specimens
3.1
In
order to perform this test, a custom-designed and
fabricated flex circuit substrate will need to be produced.
A suggested flex circuit construction of a design is shown in
Figure 1. Flex circuit materials should be selected to be repre-
sentative of what is being used in the application. The traces
alternate between anodic and cathodic polarity as shown.
Trace thickness, width, and pitch, should be selected in
accordance with the application. Total trace count should be
at least 100, and total width of the pattern should be slightly
less than the thermode length. Total length of the traces
should be sufficient to allow at least four bonds to be accom-
modated as shown in Figure 2 and Figure 3.
N is the number of circuit traces (at least 100).
I is the measured leakage current in amps after 10 seconds @
50V.
g is the gap spacing between adjacent traces on the circuit in
mm (of the order 0.04 mm to 0.1 mm).
IPC-2-5-10-1-1
Figure
1 Suggested Flex Circuit Layout for Insulation
Resistance Test
IPC-2-5-10-1-2
Figure
2 Preattachment of the ACF Strips to the Flex
Circuit
The
Institute for Interconnecting and Packaging Electronic Circuits
2215 Sanders Road Northbrook, IL 60062
IPC-TM-650
TEST
METHODS MANUAL
Number
2.5.10.1
Subject
Insulation
Resistivity for Adhesive Interconnection
Bonds
Date
11/98
Revision
Originating Task Group
SMT Mounting Adhesives Task Group (5-24d)
Material
in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
P
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4
Apparatus
4.1
DC
power supply capable of providing voltage in the
range of 10 V to 100 V, with an accuracy of at least ± 10%,
and capable of supplying current in the range of 0 mA to 1 mA
at those voltage levels
4.2
DC
ammeter capable of measuring current in the range
of 0 to 1 mA, with an accuracy of ± 0.001 mA
4.3
Stopwatch
or other timing mechanism capable of
resolving ± 1 second
4.4
Hot-bar
bonds capable of producing ACF bonds
between flex circuits and flat panel displays, and outfitted with
a thermode of appropriate length and width for a given appli-
cation (Thermode width is generally in the range of 2 mm to 3
mm, and length is in the range of 25 mm to 50 mm.)
5
Procedure
5.1
Calculate
the insulation resistivity (pi) in Ohm-cm for
each of three samples. Each sample must meet the specifica-
tion requirement (see Figure 4).
pi =
(A)(B)(C)(D)(E)
(F)(G)(H)
=Ω−cm
where:
A
= voltage
B = number of bonds
C = width of bond (mm)
D = conductor thickness (mm)
E = total number of lines - 1
F = mm to µm conversion
G = current amps
H = trace to trace gap (mm)
Example A test circuit is designed with 100 total circuit
traces (50 anodic and 50 cathodic) on 100 µm pitch. The
trace thickness is 0.035 mm (1 oz Cu) and the trace to trace
gap is 0.05 mm. Suppose also that four ACF bonds are pre-
pared, with each bond being 3 mm wide. After applying a 50
VDC bias for 10 seconds, a leakage current of 0.5 mA is
measured.
pi =
(50)(4)(3)(0.035)(99)
(10)(0.0005)(0.050)
= 8.3E6 Ω−cm
IPC-2-5-10-1-3
Figure
3 Flex Circuit Containing Four ACF Bond Sites,
After Being Bonded to a Glass Slide
IPC-2-5-10-1-4
Figure
4 Schematic Diagram for Insulation Resistivity
Measurement
IPC-TM-650
Number
2.5.10.1
Subject
Insulation
Resistivity for Adhesive Interconnection Bonds
Date
11/98
Revision
P
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1
Scope
This
test method determines electrical resistance
of multilayer PWBs.
2
Applicable Documents
None
3
Test Specimen
3.1
Test
coupon ‘‘G’’
4
Equipment/Apparatus
4.1
A
four-terminal Kelvin Bridge or equivalent
5
Procedure
5.1 Test
5.1.1
Measure
the resistance between any two adjacent
holes in row A or E of Specimen G, except holes A5 & 6, E3,
4, 11, and 12 (see Figure 1).
5.1.2
Solder
leads in the selected holes for proper connec-
tion to the four terminals of the test instrument according to
diagram A.
5.1.3 Repeat
this test for each of the five pairs of holes.
5.2
Evaluation
Record
and report all electrical resistance
values.
IPC-2-5-12-1
Figure
1 Distance from Clips
The
Institute for Interconnecting and Packaging Electronic Circuits
2215 Sanders Road Northbrook, IL 60062
IPC-TM-650
TEST
METHODS MANUAL
Number
2.5.12
Subject
Interconnection
Resistance, Multilayer Printed
Wiring
Date
4/73
Revision
Originating Task Group
N/A
Material
in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.
P
age1of1
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