IPC-TM-650 EN 2022 试验方法.pdf - 第811页

1 Scope This test method is used to determine if the dielectric materials are nutrient to specific fungus microorgan- isms. 2 Applicable Documents None 3 Test Specimen 3.1 The test specimen must be at least one end produ…

6 Notes

6.1

Acceptance criteria shall be established in terms of one

or any combination of the following:

A. Visible evidence of damage or significant material change

B. Deterioration of low level circuit or insulation resistance

beyond allowable specified limits, or other requirements

called out in an individual specification

6.2 The test chambers shall be of the forced- (circulating) air

type to ensure temperature distribution.

6.3 Thermal equilibrium shall be assumed, when three suc-

cessive thermocouple readings taken at five-minute intervals

indicate variations of 30°C or less.

6.4 Information in this test method is intended to parallel the

test method described in EIA-RS-364/TP-17.

IPC-TM-650

Number

3.14

Subject

High Temperature Life, Connectors

Date

7/75

Revision

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1 Scope This test method is used to determine if the

dielectric materials are nutrient to specific fungus microorgan-

isms.

2 Applicable Documents None

3 Test Specimen

3.1

The test specimen must be at least one end product

connector.

4 Equipment/Apparatus

4.1

Autoclave capable of maintaining 30°C and 95% RH

and an ultraviolet (3600 angstroms) source for subsequent

decontamination

4.2 Microorganisms

4.2.1

Choetomium globosum No. 6205

4.2.2 Memnoniella flavus No. 11973

4.2.3 Aspergillus flavus No. 10836

4.2.4 Penicillum citrinum No. 9849

4.3 Microscope capable of 18X

5 Procedure

5.1 Preparation

5.1.1

All glassware, inoculating loops, pipettes, etc., must

be sterilized at 117 Kp and 135°C prior to commencing any

phase of the test.

5.1.2 Use each one of the fungus microorganisms for a

composite spore suspension.

5.1.3 The spore suspension must be used within 24 hours

at temperatures between 22°C to 32°C and can be stored for

a maximum of 48 hours at 1.67°C to 7.22°C.

5.1.4 Prepare 25 ml of distilled water having a pH value from

5.8 to 7.2 at temperatures between 22°C to 32°C.

5.1.5 Introduce 1.0 ml of distilled water into each tube of

fungi and gently rub the spore layer with a sterilized inoculat-

ing loop without disturbing the agar surface.

5.1.6 Pour the four solutions in a sterilized Florence flask

containing 100 ml of distilled water and mix the suspension

thoroughly.

5.2 Test

5.2.1

Set the autoclave at 30°C and 95% RH and stabilize

for a minimum of two hours.

5.2.2 Place the specimen in the chamber and spray all of

the test surfaces thoroughly, using the 250 ml Florence flask

and atomizer attachment.

5.2.3 Operate the chamber for 28 days, observe and note

fungus growth daily. (Do not remove the specimen from the

chamber for prolonged periods.)

5.2.4 After exposure, examine all surfaces through an 18X

microscope.

5.3 Evaluation

5.3.1

Report the specimens that were found to be nutrient

to fungus growth.

5.3.2 Corrosion should be noted separately from the fungus

test results.

6 Notes

6.1

After exposure and subsequent examinations, the mate-

rials, equipment, component or part, and the test chamber

must be decontaminated by exposure on all sides to ultravio-

let rays (3600 angstroms) for a minimum of two hours, or

sprayed with a solution of 1:750 zephiran chloride. (One part

zephiran chloride to 750 parts distilled water.)

6.2 Microorganisms available from:

AMERICAN TYPE CULTURE

2301 Parklawn Drive

Rockville, MD 20852

2215 Sanders Road

Northbrook, IL 60062-6135

IPC-TM-650

TEST METHODS MANUAL

Number

3.15

Subject

Fungus Resistance, Connectors

Date

3/79

Revision

Originating Task Group

Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only

and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this

material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.

Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.

Page1of1

ASSOCIATION CONNECTING

ELECTRONICS INDUSTRIES

1 Scope The purpose of this test method is to determine

the susceptibility of non-noble metal contact interfaces to the

phenomena of fretting corrosion. Fretting corrosion is an

accelerated oxidation of contact surfaces brought about by

small amplitude cyclic relative motions between mating con-

tacts. In this test, a driving motion is imposed, which tends to

cause relative motion at the contact surfaces. From contact

resistance measurements, one determines whether the result-

ing contact motion, if any, generates significant or detrimental

films in the contact interface.

2 Applicable Documents None

3 Test Specimens

3.1

Any pre-production or production connectors

4 Equipment/Apparatus

4.1

Clamping fixture for test connector(s) and test boards to

mate with test connectors or, in the case of post receptacles,

postheaders

4.2 A motorized cam, crank, or other mechanism, with

appropriate linkage, must be provided to physically attach to

the movable connector, test board, or post and rock this half

back and forth as illustrated in Figure 1. The rocking motion

shall be approximately 10 cycles per minute, but no faster

than 30 cycles per minute.

4.3 The mechanism must be adjustable so as to restrict the

amplitude of motion to one, which, in the case of a PCB sys-

tem, just lets the board touch the card slot in the connector

on each side.

4.4 A counter to record the number of rocking cycles should

be provided.

4.5 A means of measuring contact resistance must be pro-

vided. Dry circuit measuring conditions are to be maintained,

with open-circuit voltages of 50mv or less and test currents of

100 ma or less. A Keithley Model 503 milliohmmeter or its

equivalent may be used.

5 Procedure

5.1 Test

5.1.1

Contacts are to be assembled in their housings as in

normal intended usage.

5.1.2 New test connectors, boards, or posts are to be used

in each test.

5.1.3 Measure and record initial resistance after inserting

test connector(s), board(s), or post(s).

5.1.4 Attach and adjust rocking mechanism, then begin

rocking cycles.

5.1.5 Stop the rocking motion and measure contact resis-

tance after 10, 20, 50, 100, 200, 300, 400, and 500 cycles.

Individual contacts are to be measured separately (see Figure

2).

Note: A millohmmeter having separate current and voltage

leads may be used instead, with leads positioned as shown in

Figure 2.

IPC-3-16-1

Figure 1 Fretting Motion to be Applied to PCB

Connectors

2215 Sanders Road

Northbrook, IL 60062-6135

IPC-TM-650

TEST METHODS MANUAL

Number

3.16

Subject

Fretting Corrosion, Connectors

Date

2/78

Revision

Originating Task Group

Material in this Test Methods Manual was voluntarily established by Technical Committees of the IPC. This material is advisory only

and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this

material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.

Equipment referenced is for the convenience of the user and does not imply endorsement by the IPC.

Page1of2

ASSOCIATION CONNECTING

ELECTRONICS INDUSTRIES