IPC-TM-650 EN 2022 试验方法.pdf - 第504页
Example measurement results Figures A3 and A4 illustrate the dielectric constant measurements from 100 MHz to 12 GHz performed according to the above test method for typical low and high k materials. In the examples, the…
APPENDIX
Example
of the specimen preparation
Figure
A1 shows an example of three test specimens pre-
pared from a free standing dielectric film. The dielectric was
25 µm thick. About 242 nm thick layer of gold was sputtered
on both sides. A shadow mask with a pattern of circles hav-
ing each diameter of 2.9 mm was used to pattern the top sur-
face. The bottom surface was sputtered without masking. The
specimens were extracted from the film using a 3.0 mm
puncher.
Instrumentation
Example
Figure
A2 shows a photo of the assembled test fixture during
measurements. An APC-7 to APC-3.5 microwave adapter
(Agilent 1250-1746) is connected via a phase preserving
coaxial cable (Agilent 85131-60013) to a network analyzer. An
APC-7 short termination (Agilent 04191-85300), is attached
on top of the APC-7 to APC-3.5 adapter. The termination has
a custom machined gap to accommodate a specimen of a
particular thickness.
Figure
A1 Test specimens
Figure
A2 Test instrumentation
IPC-TM-650
Number
2.5.5.10
Subject
High
Frequency Testing to Determine Permittivity and Loss
Tangent of Embedded Passive Materials
Date
07/05
Revision
P
age7of8
电子技术应用 ｗｗｗ．ＣｈｉｎａＡＥＴ．ｃｏｍ
Example
measurement results
Figures
A3 and A4 illustrate the dielectric constant measurements from 100 MHz to 12 GHz performed according to the above
test method for typical low and high k materials. In the examples, the uncertainty increases with increasing frequency. The maxi-
mum relative uncertainty in the dielectric constant is about 5%. The standard deviation in the dielectric loss tangent is about 0.001.
Certain
equipment and instrumentation is identified in this document in order
to adequately specify the experimental procedure. This does not imply any
recommendations that these are the most suitable for that purpose.
IPC-25510-a-3
Figure
A3 Dielectric constant measured for a 25 µm thick
dielectric with a nominal dielectric constant value of 3.5.
1E8
1E9 1E10
3.50
3.52
3.54
3.56
3.58
3.60
k3.5
Dielectric Constant
Frequency / Hz
IPC-25510-4
Figure
A4 Dielectric constant measured for a 15 µm thick
dielectric with a nominal dielectric constant value of 11.
1E8
1E9 1E10
10.5
10.6
10.7
10.8
10.9
11.0
K11
Dielectric Constant
Frequency / Hz
IPC-TM-650
Number
2.5.5.10
Subject
High
Frequency Testing to Determine Permittivity and Loss
Tangent of Embedded Passive Materials
Date
07/05
Revision
P
age8of8
电子技术应用 ｗｗｗ．ＣｈｉｎａＡＥＴ．ｃｏｍ
1 Scope This method specifies time domain reflectometry
(TDR) methods for measuring and calculating the propagation
delay of uniform, controlled impedance transmission lines fab-
ricated in printed board (PB) technology. The method defines
a propagation delay per unit length t
D
by specifying how to
measure the time it takes a signal to propagate a given length
of transmission line.
This method describes methods that utilize TDR measure-
ments of multiple, unterminated test lines that are designed to
differ only in length. A TDR signal, usually a step waveform
1
,
is injected into a transmission line or lines and the reflection
response is measured some time later. This method shows
how t
D
is determined as the difference between the time it
takes a TDR pulse to reflect from the unterminated ends of
two transmission lines divided by the length difference of the
two lines.
1.1 Applicability Engineering development of high-speed
and high-frequency electronic circuits and systems requires
detailed information on the electrical performance of PBs to
assure that transmission line designs yield the expected per-
formance characteristics. Detailed analysis of the design and
fabrication variations expected throughout manufacturing
assures that a proposed design can be manufactured at a
useful quality level. Measuring and characterizing propagation
delay on transmission line test structures is a direct means of
assessing the success of the PB transmission line model.
Since transmission line measurements are affected by imped-
ance conditions at the transmission line boundaries, propaga-
tion measurements specified here may not return the actual
delay observed for a given application. The procedures test
whether uniform, impedance controlled PB transmission lines
exhibit the expected propagation delay based on an electrical
model or reference test structures.
This method is generally applicable to uniform transmission
lines fabricated with commercial PB processes (see IPC-
2141), and is also useful for various transmission lines and
material systems studied at the research and development
stages.
The method is applicable when:
• Electrical contacts (connectors or probes) are readily made
to the transmission lines test structures
• Transmission line characteristic impedance is neither
extremely high nor low compared to the instrument’s test
port impedance
• Transmission line propagation loss sets acceptable signal-
to-noise ratios for the measured signals
The current version of this method specifies singled-ended
TDR measurements of unbalanced transmission lines, though
the method is sufficiently general to be extended to differential
TDR measurements of balanced lines.
1.2 Measurement System Limitations Applying a speci-
fied test method helps assure accurate and consistent propa-
gation delay results, however measurements of propagation
delay can vary depending on equipment used. Known mea-
surement system limitations include:
a. Electrical noise of the TDR receiver, limiting propagation
delay accuracy and repeatability when signal levels are low
b. Trigger, source, and receiver jitter in the TDR instrument,
limiting temporal resolution
c. Drift in the trigger point of the TDR sources limiting, tempo-
ral resolution
d. Slow TDR pulse rise times, limiting temporal resolution
e. Waveform distortion induced by the low-quality test set-up
cables, connectors, and the signal launch points, inducing
errors in the reported propagation delay
Further measurement system considerations and notes are
provided in Section 6.
1.3 Sample Limitations The type of test sample used may
also impact propagation delay accuracy. The sample-based
limitations include:
a. Lines on a fabricated PB deviating significantly from
design. For example, microstrip lines longer than 15.0 cm
[5.91 in] on PBs with plated-through holes (PTH) often
have variations in line width due to nonuniform plating
and/or etching. This makes the uniform transmission line
1. The signals used in the TDR system are actually rectangular pulses; because the measured duration of the TDR waveform is much less than the actual pulse
duration, the TDR waveform appears to be a step function.
3000 Lakeside Drive, Suite 309S
Bannockburn, IL 60015-1249
IPC-TM-650
TEST METHODS MANUAL
Number
2.5.5.11
Subject
Propagation Delay of Lines on Printed Boards by
TDR
Date
04/2009
Revision
Originating Task Group
Propagation Delay Test Methods Task Group
(D-24a)
Material in this Test Methods Manual was voluntarily established by Technical Committees of IPC. This material is advisory only
and its use or adaptation is entirely voluntary. IPC disclaims all liability of any kind as to the use, application, or adaptation of this
material. Users are also wholly responsible for protecting themselves against all claims or liabilities for patent infringement.
Equipment referenced is for the convenience of the user and does not imply endorsement by IPC.
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