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SEMI E122.1-0703 © SEMI 2003 8 Variable Name Description SECS-II Type Class Comments EnabledSites List of test-sites initially enabled at process program download. L, n 1. U4 2. U4 : n. U4 SV n = # of enabled sites Equip…

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SEMI E122.1-0703 © SEMI 2003 7
• Setting the configuration of the equipment to allow for different material specifications, equipment options,
material flows, frequency of automatic functions, etc. An example is yield check frequency.
• Managing optional machine features. Examples are constants that indicate whether optional features such as
automated media stackers are present and control the configuration and function of these optional subsystems
when they are present.
6.3.3 Status Variables (SVs) are valid at all times. An SV may not be changed by the host but may be changed by
the equipment or operator. The value of status variables may be queried by the host at anytime using the S1,F3/4 or
S6,F19/20 transactions.
6.3.4 DVVALs are variables that are valid only upon the occurrence of specific collection events. An attempt to
read a variable item at the wrong time does not generate an error, but the data reported may not have relevant
meaning.
6.3.5 Data Item Requirements for Multi-Head, Multi-Site Equipment — The identification for multi-head and multi-
site data (variable items, status variables, events, etc.) is addressed in this specification through the use of status
variables. In Table 5, the subscript “v” is used to denote the number of virtual testers, “h” is used to denote the
number of tester heads, “s” to denote the number of tester head sites, and “b” to denote the number of bins or
classes.
6.3.6 class, hard-bin, and soft-bin — Equipment is to maintain DVVALs which provide three levels of granularity
for test results: class, hard-bin, and soft-bin. Classes, hard-bins, and soft-bins are expected to be defined within a
process program, and their names are made available as DVVALs. When device testing has completed, the process
program is to determine the class, hard-bin, and soft-bin with which the device is to be associated, based on the
results of the testing. Finally, a summation of the number of devices associated with each class, hard-bin, and soft-
bin is also maintained throughout the execution of a process program, and these are also made available as
DVVALs.
6.4 For multiple sites scenarios, if a variable is described as List by number of sites, then a list is expected, one
value for each site.
Table 5 Variable Item Mapping Table
Variable Name Description SECS-II Type Class Comments
ActiveSites List of test-sites that are to be tested. L, n
1. U4
2. U4
:
n. U4
SV n = # of active sites
Address Address of the reported vector. U4 DVVAL Valid only in Datalog
reports.
Channel Hardware channel or resource
identifier.
A[80] DVVAL List by PinID.
ClassID Test result class number. U4 DVVAL List by test-site.
ClassName Test result class name. A[80] DVVAL List by ClassID.
ConfigInfo Physical configuration information. Format is
determined by
vendor.
SV Implementation specific
variable.
Cycle Cycle count for this report. U4 DVVAL Valid only in Datalog
reports.
DatalogConfig Datalog Configuration. A[80] SV
DatalogPlanName Datalog report plan name. A[80] SV
DockingStatus Information on handler/prober
docking status.
BOOLEAN SV
SEMI E122.1-0703 © SEMI 2003 8
Variable Name Description SECS-II Type Class Comments
EnabledSites List of test-sites initially enabled at
process program download.
L, n
1. U4
2. U4
:
n. U4
SV n = # of enabled sites
EquipMake Tool Manufacturer. A[80] SV
EquipSerialID Unique Equipment identifier. A[80] SV
FunctionalResult Vector of bits indicating pass or fail
for each pin.
B DVVAL
HardBinID Test result hard-bin number. U4 DVVAL List by test-site.
HardBinName Test result hard-bin name. A[80] DVVAL List by HardBbinID.
HighLimit Higher limit for measurement.
Multiple instances of this variable
exist. See TEST-LIST report.
F4 DVVAL List by TestID.
LowLimit Lower limit for measurement.
Multiple instances of this variable
exist. See TEST-LIST report.
F4 DVVAL List by TestID.
NumberOfHeads The number of test-heads on the
system.
U4 SV
NumberOfPins The number of pins for each test-head. U4 SV
OperatorID Current Operator ID. A[80] ECV
Pass True if the test passed. BOOLEAN DVVAL Valid only in Datalog
reports.
PatternName This must identify the location to
which the vector address and cycle
count are relative.
A[80] DVVAL Valid only in Datalog
reports.
PinID Pin identifier used to identify the pin
results in pin result reports.
U4 DVVAL List by PinID.
PPExecVersion Test program version. A[80] SV
ProcessProgramID Process program identifier. A[80] SV
Range Range used by the measurement unit. F4 DVVAL Valid only in Datalog
reports.
RealResult Measured value. F4 DVVAL Valid only in Datalog
reports.
Signal Signal name. A[80] DVVAL List by PinID.
SiteID Test-board test-site number for multi-
site (parallel) testing.
U4 DVVAL
SoftBinID Test result soft-bin number. U4 DVVAL List by test-site.
SoftBinName Test result soft-bin name. A[80] DVVAL List by SoftBinID.
SoftwareBuildID The build ID of this software list
element. Multiple instances of this
variable exist. See
SOFTWARE-LIST report.
A[80] DVVAL
SoftwareName The name of this software list element
(e.g. Solaris, IG9000, etc.) Multiple
instances of this variable exist. See
SOFTWARE-LIST report.
A[80] DVVAL
SoftwareType The type of this software list element
(e.g. Operating System, Tool Control
System, etc.) Multiple instances of this
variable exist. See
SOFTWARE-LIST report.
A[80] DVVAL
SEMI E122.1-0703 © SEMI 2003 9
Variable Name Description SECS-II Type Class Comments
SoftwareVersion The version of this software list
element. Multiple instances of this
variable exist. See
SOFTWARE-LIST report.
A[80] DVVAL
StartTestPortID Start Test Source
(i.e. hand, keyboard, host).
A[80] DVVAL
TestBoardCalStatus Test-board calibration status. BOOLEAN SV
TestBoardID ID of current test-board. A[80] SV
TestBoardPosition A relative location of a test-site on a
test-board.
Size 2 array of U4 SV X and Y position. Site 1 is
0,0.
TestBoardSiteID A mapping of a test-site to a physical
location on the tester.
L, 3
1. SiteID
2. TestBoardID
3.
TestBoardPosition
SV
TestBoardStatus Test-board availability
(1 = enabled, 0 = disabled).
U4 SV List by test-site.
TestBoardType Type of fixture (test-board, probecard,
cable, contactor, etc.).
A[80] SV
TestHeadID The ID of the test-head. U4 SV
TestHeadStatus (2 = Not Available, 1 = enabled,
0 = disabled)
U4 SV
TestID Test identifier used to identify test
results. Multiple instances of this
variable exist. See TEST-LIST report.
U4 DVVAL
TestInstance Test instance identifier. The TestID
and TestInstance combined should be
unique for one execution of the test
p
rogram. They can be the same for all
results from units tested in parallel by
the same instance of a single test
(possibly different for a serially
applied test in a multi-site test
program).
U4 DVVAL Valid only in Datalog
reports.
TestName Test Name. Multiple instances of this
variable exist. See TEST-LIST report.
A[80] DVVAL List by TestID.
TestSetup Setup conditions used for the test.
Multiple instances of this variable
exist. See TEST-LIST report.
A[80] DVVAL List by TestID.
TestStatus Test status of a specific test in the test
program:
1 = Pass
2 = Fail
3 = Both
U4 DVVAL Valid only in Datalog
reports.
TestTime Test execution time in seconds. F4 DVVAL Valid only in Datalog
reports.
TestType 1 = Parametric Test (real value
result).
2 = Functional test (vector of
pass/fail results).
4 = Text test (arbitrary text string as
result).
Multiple instances of this variable
exist. See TEST-LIST report.
U4 DVVAL List by TestID.