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SEMI F68-1101 © SEMI 2001 6 Purge Gas DUT Pure Gas (>9N Purity ) AP IM S or Ultra trace An aly tical Instr umen tatio n Impurity Analy zer P1 Legend DUT = Devic e Unde r Test P1 = Test Pr essure R1 = Pu re Gas 0–100 p…

SEMI F68-1101 © SEMI 20015
8.3.7.2 When the impurity level is in the range of the
APIMS or ultratrace analytical instrumentation, Close
V13 and Open V12. Close V9 and V10, Open V11.
8.3.7.3 Monitor impurity level until stable.
8.3.8 Initiate Impurity Challenge:
8.3.8.1 Isolate the DUT and APIMS or ultratrace
analytical instrumentation. Close V7 and V12, open
V13.
8.3.8.2 Open V3 and adjust R2 to the suggested
operating pressure range of 275–415 kPa (40–60 psig).
Open V5 and set MFC2 to the desired flow. (See
Appendix 1 to determine the desired flow for MFC2).
8.3.8.3 Verify test gas impurity. Close V5 and V11,
Open V4, V8, and V10 supplying test gas to the
impurity analyzer. Monitor test gas impurity until
stable and verified to theoretical impurity value (See
Appendix 1).
8.3.8.4 Initiate test. Isolate impurity analyzer, Close
V8 and V10, Open V11. Input test gas through the
DUT to the APIMS or ultratrace impurity analyzer,
Open V6 and V7. Close V13 and Open V12.
8.3.8.5 Monitor and record the outlet impurity level
until stable.
8.3.8.6 If necessary, repeat the test for a different
challenge gas mixture.
8.3.9 Determination of instantaneous purifier
efficiency:
8.3.9.1 The test may be done on newly activated media
or may be done using existing media that has been
regenerated. The test may be destructive to the DUT
(purifier).
8.3.9.2 Repeat the test as necessary to provide a
statistically valid number of test results. A discussion
of what is statistically valid is beyond the scope of this
document.
9 Exposure Precautions
9.1 The APIMS or ultratrace analytical instrument
should not be exposed to high levels of impurities.
After installation of the purifier, it should be purged
well, per the manufacturer’s recommendation. A
typical recommendation might be to purge a minimum
of 150 bed volumes before directing the flow to the
APIMS.
9.2 Alternative instrumentation should be used to
measure the challenge gas when the concentration of
the challenge gas is greater than the normal calibration
range of the APIMS or other ultratrace analytical
instrumentation.
10 Calculation of Instantaneous Purifer
Efficiency
10.1.1.1 Use the following formula to calculate the
Instantaneous Purifier Efficiency:
1001% ×
÷
÷
ø
ö
ç
ç
è
æ
−=
impurityinlet
impurityoutlet
eff
Example: Let impurity outlet = 10 ppb and impurity
inlet = 10 ppm,
9.99100
000,10
10
1% =×
÷
ø
ö
ç
è
æ
−=eff
11 Reporting Results
11.1 The following test conditions should be reported:
11.1.1 Date and time of test,
11.1.2 Operator,
11.1.3 Pure gas flow rate (slpm),
11.1.4 Challenge gas flow rate (sccm),
11.1.5 Test pressure kPa (psig or psia),
11.1.6 DUT operating temperature (° C),
11.1.7 Purifier manufacturer, model, and serial
number, and volume,
11.1.8 Ultratrace analytical instrumentation used,
11.1.9 Test gas impurities and levels (Table 1), and
11.1.10 Calibration certificates for the mass flow
devices, pressure gauges and ultratrace analytical
instrumentation.
12 Related Documents
SEMI F30 — Start-up and Verification of Purifier
Performance Testing for Trace Gas Impurities and
Particles at an Installation Site.
SEMI F43 — Test Method for Determination of
Particle Contribution by Point-Of-Use Purifiers.
NOTE 2: Unless otherwise indicated, all documents cited
shall be the latest published versions.

SEMI F68-1101 © SEMI 2001 6
Purge Gas
DUT
Pure Gas
(>9N Purity)
APIMS
or
Ultratrace
Analytical
Instrumentation
Impurity Analyzer
P1
Legend
DUT = Device Under Test
P1 = Test Pressure
R1 = Pure Gas 0–100 psig Regulator
R2 = Challenge Gas 0–100 psig Regulator
R3 = Vent Gas 0–100 psig Back Pressure Regulato
r
V1 = Pure Gas Source Isolation Valve
V2 = Pure Gas System Isolation Valve
V3 = Challenge Gas Source Isolation Valve
V4 = Challenge Gas System Isolation Valve
V5 = Challenge Gas Vent Isolation Valve
Challenge Gas
(~1% Impurity)
V4
V5
V6 V7
V8
V9
Vent
V10
V11
MFC1
R1
V1
V2
R3
V
6 = DUT Inlet Isolation Valve
V7 = DUT Outlet Isolation Valve
V8 = DUT Bypass Inlet Isolation Valve
V9 = DUT Bypass Outlet Isolation Valve
V10 = Impurity Analyzer Sample Isolation Valve
V11 = Impurity Analyzer Purge Gas Isolation Valve
V12 = APIMS/UAI Sample Isolation Valve
V13 = APIMS/UAI Purge Gas Isolation Valve
MFC1 = Pure Gas Mass Flow Controller
MFC2 = Challenge Gas Mass Flow Controller
V13
V12
MFC2
R2
V3
Figure 1
Suggested Point of Use Purifier Efficiency Test Setup
Table 1 Efficiency Of DUT Parameters
EFFICIENCY OF DUT
Impurity Pure Gas Flow Challenge Flow Inlet Conc Outlet Conc Zero Gas Analyzer
(slpm) (sccm) (ppm) (ppb) (ppb)
CH
4
H
2
O
2
N
2
CO
2
NMHC

SEMI F68-1101 © SEMI 20017
APPENDIX 1
MFC SIZING
NOTE: The material in this appendix is an official part of SEMI F68 and was approved by full letter ballot
procedures on August 27, 2001.
A1-1 To determine purifier efficiency, the
concentration of impurity entering the purifier and the
quantity of impurity downstream of the purifier must be
determined.
A1-2 Determine the manufacturer’s recommended
flow rate for the purifier. As an example, assume a
flow rate of 5 slpm.
A1-3 Determine the flow rate challenge gas required.
As an example, 5 sccm of a 1% challenge gas would be
blended into 4,995 sccm of pure gas to create at 10 ppm
test gas.
PPM 10
sccm 4,995sccm 5
sccm 5PPM 10,000
Gas Test =
+
×
=
As a large scale system, with a flow of 1,000 slpm, a
flow of 1 slpm of challenge gas (1% impurity) is
required to create a 10 ppm challenge.
PPM 10
slpm 999slpm 1
slpm 1PPM 10,000
Gas Test =
+
×
=
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