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SEMI F42-0600 © SEMI 199 9, 2000 9 0 10 20 30 40 50 60 70 80 90 0 1 02 03 04 05 06 0 Second s %Vnom Van Vbn Vcn Spec NOT E: Equipme n t did n ot meet sta ndard during A to neutral sag events. Figure 4 Example of Single-P…

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SEMI F42-0600 © SEMI 1999, 2000 8
Table 5 Example of Test Data Sheet for Characterizing Equipment Susceptibility to Voltage Sags
Result
Event % Va-n % Vb-n % Vc-n DUT Mode
(Idle or
Processing)
Voltage Sag
Duration
Actual Time to
Interrupt (Seconds)
Comments
1 95 100 100 Processing 0.05 OK Equipment OK.
2 95 100 100 Processing 0.20 OK Equipment OK.
3 95 100 100 Processing 0.50 OK Equipment OK.
4 95 100 100 Processing 1.00 OK Equipment OK.
↓↓ ↓ ↓ ↓ ↓ ↓ ↓
53 30 100 100 Processing 0.05 OK Equipment OK.
54 30 100 100 Processing 0.20 0.16 Equipment Shutdown: EMO Relay
CR1 dropout
55 30 100 100 Processing 0.50 INT No Test - Beyond Interrupt
56 30 100 100 Processing 1.00 INT No Test - Beyond Interrupt
↓↓ ↓ ↓ ↓ ↓ ↓ ↓
129 100 35 100 Processing 0.20 OK Equipment OK.
130 100 35 100 Processing 0.50 OK Equipment OK.
131 100 35 100 Processing 1.00 OK Equipment OK.
132 100 30 100 Processing 0.05 OK Equipment OK.
133 100 30 100 Processing 0.20 0.16 Power Supply PS1 dropout
↓↓ ↓ ↓ ↓ ↓ ↓ ↓
233 100 100 5 Processing 0.05 OK Equipment OK.
234 100 100 5 Processing 0.20 0.16 Equipment Shutdown: EMO Relay
CR1 dropout
235 100 100 5 Processing 0.50 INT No Test - Beyond Interrupt
236 100 100 5 Processing 1.00 INT No Test - Beyond Interrupt
237 100 100 0 Processing 0.05 OK Equipment OK.
238 100 100 0 Processing 0.20 0.16 Same result as event 234.
239 100 100 0 Processing 0.50 INT No Test - Beyond Interrupt
240 100 100 0 Processing 1.00 INT No Test - Beyond Interrupt
.. . .
SEMI F42-0600 © SEMI 1999, 20009
0
10
20
30
40
50
60
70
80
90
0 102030405060
Seconds
%Vnom
Van
Vbn
Vcn
Spec
NOTE: Equipment did not meet standard during A to neutral sag events.
Figure 4
Example of Single-Phase Test Results
0
10
20
30
40
50
60
70
80
90
0 102030405060
Seconds
%Vnom
Vab
Vbc
Vac
Spec
NOTE: Equipment did not meet specification during A-C to sag events.
Figure 5
Example of Phase-to-Phase Test Results
SEMI F42-0600 © SEMI 1999, 2000 10
13 Related Documents
13.1 IEC Standard
2
13.1.1 IEC 61000-4-11 — Electromagnetic
Compatibility (EMC) - Part 4: Testing and Measuring
Techniques - Section 11: Voltage Dips, Short
Interruptions and Voltage Variations Immunity Tests.
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