semi合集-English.pdf - 第4033页

SEMI F50-0200 © SEMI 2000 11 RELATED INFORM A TI ON 2 EXA MPLE OF MEASURED PERFORM A NCE D A T A REPORTED IN MAGNITUDE AND DUR A TI ON BINS NOTE: This re lated inf o rmation is n o t an of ficial part of SEMI F50 and was…

SEMI F50-0200 © SEMI 2000 10

10%

20%

30%

40%

50%

60%

70%

80%

90%

100%

110%

1 10 100 1000

Duration (cycles)

Percent of Nominal Voltage

Figure R1-2

Semiconductor Factory Site Disturbance Data

SEMI F50-0200 © SEMI 200011

RELATED INFORMATION 2

EXAMPLE OF MEASURED PERFORMANCE DATA REPORTED IN

MAGNITUDE AND DURATION BINS

NOTE: This related information is not an official part of

SEMI F50 and was derived from the work of the originating

task force. This related information was approved for

publication by full letter ballot procedures on December 15,

1999. Determination of the suitability of the material is solely

the responsibility of the user.

NOTE: This related information section is reprinted from

IEEE 1346. The IEEE disclaims any responsibility or liability

resulting from the placement and use in the described manner.

Information is reprinted with the permission of the IEEE.

R2-1 Excerpt from IEEE 1346 – Annex D

Constructing Coordination Charts

R2-1.1 The use of bins to count the number of voltage

sag events on a utility service is developed in IEEE

1346

as a step within a procedure for developing

number of sags per year contour graphs. The bin tables

are themselves useful as a tool for comparison of

voltage sag performance of electrical systems. The

paragraphs and tables below have been included to

explain the use of bins in the standardization of

historical or predicted events.

R2-1.2 Table R2-1 shows a grid of nine sag magnitude

ranges in rows and five sag duration ranges in columns.

The combination of nine rows and five columns

produce a total of 45 magnitude/duration bins. Each

measured or predicted sag will have a magnitude and

duration that fits in only one of the 45 bins. The

magnitude bin is a range of sag voltages expressed as a

percentage of nominal. The time bin is a range of sag

durations expressed as seconds. Each sag will have

associated with it one magnitude and one time bin. The

number in each table entry will correspond to the

number of sags that have magnitudes and times in the

same bins. Interruptions would go into the lower row

of bins according to the duration. The number bins

may vary depending on coordination needs for a

particular case. However, this selection of 45 bins is

reasonably convenient.

R2-1.3 For this example, assume each of the 45 bins

contains one sag event. This means there are 45 sags

per year and the characteristics of each sag fits in a

unique bin. The 15 bins in the lower-right corner have

3 Reprinted with the permission of The Institute of Electrical and

Electronic Engineers, Inc. (IEEE), 445 Hoes Lane, P.O. Box 1331

Piscataway, NJ 08855-1331, USA

IEEE 1346 — Recommended Practice for Evaluating Electrical

Power and System Compatibility with Electronic Process Equipment.

bold italic highlighting to promote understanding as this

example continues.

R2-1.4 Table R1-2 shows the cumulative number of

sag events that are worse than or equal to each bin from

Table R1-1. “Worse than” means the magnitude is

lower and the duration is longer. The row and column

headings show only single values instead of ranges.

For example, there are 15 sags in the 50% magnitude,

0.4s entry of Table R1-2. The bold number 15 in Table

R1-2 is the sum of all 15 individual bold entries in

Table R1-1. This means 15 sags will have magnitude

less than or equal to 50% and duration longer than 0.4s.

SEMI F50-0200 © SEMI 2000 12

Table R2-1 Count of Events in Each Bin

Time Bin in Seconds

Magnitude Bin 0.0s < 0.2s 0.2s < 0.4s 0.4s < 0.6s 0.6s < 0.8s >/= 0.8s

> 80−90%

11111

> 70−80%

11111

> 60−70%

11111

> 50−60%

11111

> 40−50%

111

> 30−40%

111

> 20−30%

111

> 10−20%

111

0−10%

111

Table R2-2 Sum of Events Worse Than or Equal to Each Magnitude and Duration

Magnitude Time in Seconds

% of Nominal

Voltage

0.0s 0.2s 0.4s 0.6s 0.8s

90% 45 36 27 18 9

80% 40 32 24 16 8

70% 35 28 21 14 7

60% 30 24 18 12 6

50% 25 20

10 5

40% 20 16 12 8 4

30% 15 12 9 6 3

20%108642

10%54321

NOTICE: SEMI makes no warranties or representations as to the suitability of the guides set forth herein for any

particular application. The determination of the suitability of the guide is solely the responsibility of the user. Users

are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant literature

respecting any materials mentioned herein. These guides are subject to change without notice.

The user’s attention is called to the possibility that compliance with this guide may require use of copyrighted

material or of an invention covered by patent rights. By publication of this guide, SEMI takes no position respecting

the validity of any patent rights or copyrights asserted in connection with any item mentioned in this guide. Users of

this guide are expressly advised that determination of any such patent rights or copyrights, and the risk of

infringement of such rights, are entirely their own responsibility.

International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o

the contents in whole or in part is forbidden without express written

consent of SEMI.