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SEMI E118-1104 E © SEMI 2002, 2004 2 5 Terminology 5.1 Abbrevi ations and Acrony ms 5.1.1 FOUP — Front Opening Unified Po d 5.1.2 WIDR — Wafer ID Reader 5.2 Definitions 5.2.1 attribute — information about or associated w…

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SEMI E118-1104
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SEMI E118-1104
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SPECIFICATION FOR WAFER ID READER COMMUNICATION
INTERFACE — THE WAFER ID READER FUNCTIONAL STANDARD:
CONCEPTS, BEHAVIOR AND SERVICE
This specification was technically approved by the Global Information and Control Committee and is the
direct responsibility of the Japan Information and Control Committee. Current edition approved by the Japan
Regional Standards Committee on July 19, 2002. Initially available at www.semi.org October 2002; to be
published November 2002.
E
This standard was editorially modified in February 2005 to correct errors in Figure R2-1.
NOTICE: The designation of SEMI E118 was updated during the 1104 publishing cycle to reflect revisions to
SEMI E118.1.
1 Purpose
1.1 The purpose of the Wafer ID Reader Functional
Standard is to provide a common specification for
concepts, behavior, and services (functions) provided
by a Wafer ID Reader to an upstream controller.
1.2 A standard interface will increase interchange-
ability of Wafer ID Readers so that users and
equipment suppliers have a wider range of choices.
2 Scope
2.1 The Wafer ID Reader Functional Standard
addresses the functional requirements for a generic
Wafer ID Reader interface with an upstream controller.
2.2 The specification includes required behavior and
required communications for a Wafer ID Reader.
2.3 This specification does not require, define, or
prohibit asynchronous messages sent by the Wafer ID
Reader.
2.4 This specification intents to read the Wafer ID
specified by SEMI Standard and accessed in the
equipment where the wafers transfer in / out is executed
with a carrier unit.
NOTICE: This standard does not purport to address
safety issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory or other limitations prior
to use.
3 Limitations
3.1 This standard does not define the specific protocol
to be used for the Wafer ID Reader. Supplements to this
standard are required to describe how the functions of
the Wafer ID Reader are implemented for specific
protocols.
4 Referenced Standards
4.1 SEMI Standards
SEMI E15 Specification for Tool Load Port
SEMI E30 Generic Model for Communications and
Control of Manufacturing Equipment (GEM)
SEMI E39 Object Services Standard: Concepts,
Behavior, and Services
SEMI E47.1 Provisional Mechanical Specification
for Boxes and Pods Used to Transport and Store 300
mm Wafers
SEMI E62 Provisional Specification for 300 mm
Front-Opening Interface Mechanical Standard (FIMS)
SEMI E87 Specification for Carrier Management
(CMS)
SEMI E90 Specification for Substrate Tracking
SEMI E99 — The Carrier ID Reader/Writer Functional
Standard: Specification of Concepts, Behaviors, and
Services
SEMI E101 — Provisional Guide for EFEM Functional
Structure Model
SEMI T7 Specification for Back Surface Marking of
Double-Side Polished Wafers With a Two-Dimensional
Matrix Code Symbol
4.2 ISO/IEC Standard
1
ISO/IEC 16022 — International Symbology
Specification – Data Matrix
NOTICE: Unless otherwise indicated, all documents
cited shall be the latest published versions.
1 International Organization for Standardization, ISO Central
Secretariat, 1, rue de Varembé, Case postale 56, CH-1211 Geneva 20,
Switzerland. Telephone: 41.22.749.01.11; Fax: 41.22.733.34.30
Website: www.iso.ch
SEMI E118-1104
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© SEMI 2002, 2004 2
5 Terminology
5.1 Abbreviations and Acronyms
5.1.1 FOUP — Front Opening Unified Pod
5.1.2 WIDR Wafer ID Reader
5.2 Definitions
5.2.1 attribute — information about or associated with
some entity or object.
5.2.2 carrier — any cassette, box, pod, or boat that
contains wafers.
5.2.3 cassette — an open structure that holds one or
more substrates [SEMI E44].
5.2.4 controller — a system that provides control
(performs required operations when certain conditions
occur or when interpreting and acting upon
instructions) and communicates with a higher level
manager. Controllers exist at all levels within a factory.
Examples of controllers include the Multiple Wafer ID
Reader Controller, the Equipment Controller.
5.2.5 data matrix code symbol — a two-dimensional
array of square cells arranged in contiguous rows and
columns. In certain ECC200 symbols, data regions are
separated by alignment patterns. The data region is
surrounded by a finder pattern [ISO/IEC 16022].
5.2.6 front-opening unified pod (FOUP) — a box (that
complies with SEMI E47.1) with a non-removable
cassette (so that its interior complies with SEMI E1.9)
and with a front-opening interface (that mates with a
FIMS port that complies with SEMI E62).
5.2.7 fundamental requirements — the requirements
for information and behavior that must be satisfied for
compliance to a standard. Fundamental requirements
apply to specific areas of application, objects, or
services.
NOTE 1: All portions of the Wafer ID Reader specification
are considered to be fundamental requirements unless
explicitly described as optional. See also optional
requirement.
5.2.8 load port — the interface location on a tool
where wafer carriers are delivered. It is possible that
wafers are not removed from, or inserted into, the
carrier at this location.
5.2.9 message interleaving — the practice of sending a
new message request before receiving the reply to an
earlier request.
5.2.10 Multiple Wafer ID Reader controller — a unit
controlling the Reader function of one or multiple ID
Reader Heads, communicates the command/data with
the equipment controller or the equivalent controller
such as equipment controller.
5.2.11 optional capability — a specification that is not
required for an implementation to be compliant to a
standard. See also fundamental requirement.
5.2.12 reader head — a structured portion which
functions to detect the ID code. The ID reader unifying
a head function inside its body can be placed as a head.
The ID reader not unifying a head function will be
located separately from the head.
5.2.13 substrate handler — a physical subsystem
which transfers substrates between the carriers and the
process part of the equipment.
5.2.14 upstream controller a controller that directs
the Wafer ID Reader through the communication
interface.
5.2.15 Wafer ID — an identifier for a wafer. A value
that uniquely identifies a given wafer in a factory. The
identifier may be represented physically with LASER
technologies, etc.
5.2.16 Wafer ID mark — a physical structure for
storing Wafer ID and other information.
5.2.17 Wafer ID Reader — a unit (subsystem) that
detects and decodes data from the Wafer ID mark, and
that communicates with the upstream controller. Wafer
ID Reader may be composed of Multiple Wafer ID
Reader controller and reader heads.
5.3 Data Types
5.3.1 enumerated — may take on one of a limited set
of possible values. These values may be given logical
names, but they may be represented by any single-item
data type.
5.3.2 form — type of data: positive integer, unsigned
integer, integer, floating point (float), enumerated,
boolean, text, formatted text, structure, list, ordered list.
5.3.3 integer — may take on the value of any negative
or unsigned integer. Messaging protocol may impose a
limit on the range of possible values.
5.3.4 structure — a specific set of items, of possibly
mixed data types, in a specified arrangement.
5.3.5 text — a character string. Messaging protocol may
impose restrictions, such as length or ASCII
representation.
5.3.6
unsigned integer — may take on the value of any
positive integer or zero. Messaging protocol may
impose a limit on the range of possible values.
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6 Conventions
6.1 State Model Methodology
6.1.1 This document uses the Harel state chart convention for describing dynamic operation of defined objects. The
outline of this convention is described in an attachment of SEMI E30. The official definition of this convention is
described in “State Charts: A Visual Formalism for Complex Systems” written by D. Harel in Science of Computer
Programming 8, 1987
2
.
6.1.2 Transition tables are provided in conjunction with the state diagrams to explicitly describe the nature of each
state transition. A transition table contains columns for Transition number, Previous State, Trigger, New State,
Actions, and Comments. The “trigger” (column 3) for the transition occurs while in the “previous” state. The
“actions” (column 5) includes a combination of:
Actions taken upon exit of the previous state.
Actions taken upon entry of the new state.
Actions taken which are most closely associated with the transition.
6.1.2.1 No differentiation is made between these cases.
6.2 Object Notation
6.2.1 The object models in Related Information 2 use the Object Modeling Technique (OMT) developed by
Rumbaugh, James, et al, in Object-Oriented Modeling and Design
3
. An overview of this notation is provided in
SEMI E39, Object Services Standard: Concepts, Behavior, and Services.
Num Previous State Trigger New State Actions Comments
6.3 Service Message Representation
6.3.1 Services are functions or methods that may be provided by either the equipment or the host. A service
message may be either a request message, which always requires a response, or a notification message, that does not
require a response.
6.3.2 Service Definition
6.3.2.1 A service definition table defines the specific set of messages for a given service resource, as shown in the
following table:
Message Service Name Type Description
Type can be either “N” = Notification or “R” = Request & Response.
6.3.2.2 Notification type messages are initiated by the service provider (e.g., the equipment) and the provider does
not expect to get a response from the service user. Request messages are initiated by a service user (e.g., the host).
Request messages ask for data or an activity from the provider. Request messages expect a specific response
message (no presumption on the message content).
6.3.3 Service Parameter Dictionary
6.3.3.1 A service parameter dictionary table defines the description, format and its possible value for parameters
used by services, as shown in the following table:
2 Elsevier Science, P.O. Box 945, New York, NY 10159-0945, http://www.elsevier.nl/homepage/browse.htt
3 James Rumbaugh, Michael Blaha, William Premerlani, Frederick Eddy, William Lorensen, Object-Oriented Modeling and Design
, Englewood
Cliffs, New Jersey: Prentice-Hall, 1991.