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SEMI F41-0699 © SEMI 1999 4 8.2 Particle Qualification For m o s t accurate results, particle lev els should be m easured on-l ine with a optical particle counter capable of measuring the size of particle that is inclu…

SEMI F41-0699 © SEMI 19993
purity chemical flushed to drain during the qualification
process, this approach may also prove to be more cost
effective depending on the cost of the chemical used for
pickling, compared to the cost of the process chemical
designated for use in the line.
7.2 Conditioning With Same Chemical A variation
on the above approach is to "pickle" the system with the
process chemical that is intended to be used in the
BCDS line a 24-72 hour soak period and flushing the
chemical to drain. While the process chemical may not
be as aggressive in cleaning up the line, this approach
has the advantage that the extracted metals have the
same fingerprint as those that might otherwise be
observed during the final qualification testing, and the
final qualification may be done immediately following
this step, without further preparation.
7.3 Testing the Preconditioning Chemical Rather
than relying on an arbitrary or predetermined lengths of
time for preconditioning the BCDS, test samples are
often taken and analyzed to ensure that the required
level of impurities has actually been obtained. This
testing is often commissioned by the equipment
manufacturer and not reported to the customer as part of
the BCDS qualification. Indicator elements are often
analyzed that are either of particular concern in the
process chemical, or elements such as Ca, Cr, Cu, Fe,
Mg, Na, Ni, and Zn, that are known as common
impurities in chemicals and that are also highly
detrimental in semiconductor processing.
7.4 Conditioning Procedure The three most
common chemicals (HCL, HF, and HNO3) used for
precleaning the BCDS are aggressive in extracting
metallic impurities and particles. The steps followed
include:
7.4.1 Install an acceptable chemical filter element(s)
per the filter and BCDS manufacturer's specifications.
7.4.2 Fill the BCDS and distribution piping with the
chemical of choice and recirculate internally to ensure
that all piping is filled. This may include all
distribution piping. Let the chemical soak the materials
of construction in a static manner for a period of 24 to
72 hours, or continue recirculating the chemical as a
closed loop for the same amount of time.
7.4.3 Flush the chemical from the system.
7.4.4 Depending on the chemical used, a UPW rinse
step or an inert gas purge step for drying may be
required prior to filling the system with the actual
chemical for the qualification testing.
Note: The precleaning chemicals used may add
undesirable contaminants (i.e. F
-
from Hydrofluoric
acid, Cl
-
from hydrochloric acid, etc.). Therefore, if
any of these chemicals are used, additional testing may
be required to determine that these materials have not
added contaminants in excess of any specification.
These contaminants may be tested in the UPW rinse
step or in the final chemical qualification step.
7.5 Solvent Systems The type of chemical used for
flushing solvent BCDS systems is different than that
used for oxidizers and corrosive chemicals since solvent
systems can be made from stainless steel and metal
materials for reasons of safety and chemical
compatibility. Generally, IPA, or the chemical to be
used in the system, is used for the aqueous pre-clean
step in flushing a system where solvents are to be used.
8 Final Chemical Qualification
8.1 Initial Considerations Notwithstanding any of
the steps taken to prepare the BCDS for qualification
testing, certain issues should be considered prior to
starting any sampling required in the qualification
process:
8.1.1 Determination about the adequacy of the
sampling points. The sampling points are generally
coincident with the location of pre-existing sample
ports on the Valve Manifold Box, day tank and other
distribution points. The adequacy of the sampling
points depends on their accessibility, environmental
controls, ability to flush prior to sampling, and safety
considerations.
8.1.2 Adequacy of data. Due to sampling error,
possibility of environmental contamination, handling
problems, and impurities in sampling containers,
samples should be taken in duplicate or triplicate, with
two samples sent to the lab for testing and one sample
retained in case of a dispute.
8.1.3 Use of proper precleaned samp ling containers.
Sampling containers must be chemically compatible
and precleaned in a manner consistent with the desired
specification level for impurities. Sample bottle
preparation differs depending on the type of testing to
be performed.
8.1.4 Use of a contamination-free sampling device for
samples pulled from an open vessel or a drum.
8.1.5 Proper training for personnel a ssigned to
sampling. The proper training is required to ensure
that personnel charged with sampling follow
appropriate safety and contamination-free protocols.

SEMI F41-0699 © SEMI 1999 4
8.2 Particle Qualification For most accurate results,
particle levels should be measured on-line with a
optical particle counter capable of measuring the size of
particle that is included in the guaranteed specification.
Batch samples may be taken and measured for particles
in a lab, but special care is needed to prequalify
containers used for this sampling, and data integrity
may be compromised for the smallest sized particles
due to various contamination sources. An example of a
protocol generally followed to measure particle on-line
includes:
8.2.1 Remove all UPW in the BCDS and distribution
piping.
8.2.2 Remove UPW filters or replace incompatible
chemical filters if present.
8.2.3 Install specified filter element per the BCDS and
filter manufacture's specifications.
8.2.4 Commission the BCDS and distribution piping
with the process chemical.
8.2.5 Recirculate chemical through the BCDS and
through all POU to drain.
8.2.6 Drain all chemicals from the BCDS and
distribution piping.
8.2.7 Refill entire system with chemical and begin
circulation through filters and out to POU to drain.
8.2.8 Begin sampling to a liquid par ticle counter
downstream of the filters either at the outlet of the
BCDS, the POU, or both. Follow a prescribed particle
counting sampling procedure.
8.2.9 The number of particle samples and sample
duration time should be calculated based on the total
volume of chemical desired to be examined by the
particle counter. A "sufficient" volume of chemical
should be examined by the particle counter during the
qualification period. As an example, the particle
concentration could be measured over at least a five-
hour period with thirty consecutive ten-minute samples
taken. In this example, the average of the last
consecutive 30 samples would be calculated and
compared to the specification.
8.2.10 The particle concentration is considered
acceptable if the average is less than the specification.
8.3 Metallic Qualification Metallic impurities are
generally specified both in terms of level of impurity by
element and total amount of impurities. The customer's
specification generally lists each element to be included
in the analysis or may refer to the list of elements
published by SEMI for each chemical at different purity
grades. The maximum impurity levels may be
described as an absolute value (e.g. 1ppb maximum
impurity), or in terms of the quantity of impurities that
may be added by the BCDS including the distribution
piping. This amount of "total adders" is determined by
measuring the impurity levels of the incoming chemical
from the storage or supply vessel compared to the
purity level of the chemical at the end point sample
station or POU. The number of samples and location of
samples vary depending on the type of specification.
When qualifying to a “metallic impurities added”
specification, a sample must be taken from the
incoming chemical supply drums for an incoming
baseline. The testing protocols includes:
8.3.1 Precondition all sampling bottles before use and
follow appropriate sampling protocol.
8.3.2 Send samples to a lab for trace metal analysis
specifying the level of testing required and the number
of elements to be tested. The level of testing required
depends on the agreed upon specification. As a rule of
thumb, the detection limits of the analysis should be at
least 10X's lower than the impurity level to be achieved
for each element. In addition, the lab should follow
high standards of quality control for trace metal
analysis including analysis in duplicate, duplicate
blanks, use of internal standards, instrument calibration
using primary standards, and QC checks.
8.3.3 Review the data that is reported and compare it
to the customer requirement.
8.3.4 If the system does not meet the specification
then repeat the procedure until the system is qualified.
8.3.5 Where maximum levels of impurities are
specified, a sample of the incoming chemical should
either be measured as part of the qualification process,
or retained, to ensure that the incoming chemical is not
a significant source of contamination.
8.3.6 For purposes of metallic qualification, soak
periods similar to those referenced in Section 7.2 are
recommended.
9 Other Considerations
9.1 Accelerated Qualification Techniques
Although process chemicals such as hydrofluoric and
hydrochloric acid may reach acceptable levels of purity
after a few weeks in the BCDS, other chemicals such as
sulfuric acid and ammonium hydroxide extract
impurities much more slowly and significant levels of
impurities are observed even after several months. The
BCDS conditioning process described above is one
approach to preleaching impurities from the BCDS.
Other variations include combinations of static and
dynamic rinses and emphasis on the use of dilute HF as
the aqueous preclean chemical that is particularly
effective for iron removal, however, it contributes high

SEMI F41-0699 © SEMI 19995
levels of fluoride which may be a concern for some
qualification processes.
9.2 Specialty Chemicals Certain CVD chemicals
have high levels of organics which raise concerns about
chemical decomposition, residues and particulate
formation. These concerns may require customized
approaches to the design of a BCDS qualification. For
example, reservoir replacement for these types of
chemicals with vapor pressure from 1-5 Torr and above
may require the use of vacuum less than the vapor
pressure of the chemical whereas low vapor pressure
chemicals with vapor pressures from 1-5 Torr, and
viscous materials, may require a solvent purge. In
addition, purging and pickling of he BCDS and
chemical delivery lines should be performed per
Sections 7.1 and 7.2. CAUTION: UPW introduced into
the lines frequently interacts with the CVD chemicals
causing decomposition.
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
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other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
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compliance with this standard may require use of
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takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
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