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SEMI C6.6-90 © SEMI 1990, 2002 3 NOTICE: SEMI makes no warranties or representations as to the suitability o f the standards set forth herein for any particular application. The determination of the suitability of the st…

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SEMI C6.6-90 © SEMI 1990, 2002 2
4.2 Pressure Reducer — An accessory required for
counters operated at atmospheric pressure, it should
preferably use expansion of the gas through a critical
orifice.
5 Test Method
NOTE 2: The details of sampling configuration,
measurement procedure, and instrument calibration procedure
and frequency must be agreed upon by the user and supplier,
taking into account good engineering practice.
5.1 Determine the average observed concentration of
counts in the background (
B
X ) by passing air, nitrogen
or argon, believed to be free of particles of 0.1
micrometers or more in diameter, through the
instrument and recording the total number of counts. A
suggested assembly for perfoming this test, using a
filter which removes particles in this size range, is
shown in Figure 1. A method recommended by the
instrument manufacturer, such as internal recirculation
through a filter, may be substituted for the system
shown. Count a minimum of 8 sample intervals, each at
least 25 standard liters (0.95 SCF) or 30 minutes,
whichever is greater. Calculate
B
X as defined in
Section 3.
B
X must not exceed 2 particles per 25
standard liters.
5.2 The sampling point should be at outlet of system,
and sampling lines should be as short as possible.
5.3 A suggested sampling probe configuration for
turbulent main line flow is shown in Figure 2. The flow
rate in the sampling tube at pipeline pressure should be
set so that the mean sampling flow velocity at the probe
inlet matches as closely as possible the axial flow
velocity in the pipeline. The pitot sampling tube ID
should be no less than 2 mm (0.08 inch). The orifice
and sampling horn should be sized so that the mean
flow velocity at the particle counter probe inlet matches
the axial flow velocity in the horn as closely as
possible.
5.4 Count the particles in each of at least 8 sample
intervals. Each sample interval must be at least 25
standard liters or 30 minutes, whichever is greater.
Record the number of counts and the sample volume
for each interval. Calculate
C
X and S
C
, as defined in
Section 3.
6 Specification
6.1 Maximum Permissible Particle Concentration
10 particles per 25 standard liters as determined by the
instrument specified in Section 4.
6.2 The specification will be considered met if the
calculated concentration of particles plus two standard
deviations does not exceed 10 particles per 25 standard
liters, i.e.:
X
C
+
2
S
C
10
particles/25 standard liters
7 Report
7.1 The report shall contain the values of all the
variables defined in Section 3.
8 Precision
8.1 This test procedure defines the requirements to
satisfy the specification at the 95% confidence level.
Figure 1
Suggested Assembly for Determining Particle
Counter Background
Figure 2
Schematic Diagram of Configuration for Obtaining
Particle Samples from Pipelines
SEMI C6.6-90 © SEMI 1990, 2002 3
NOTICE: SEMI makes no warranties or
representations as to the suitability of the standards set
forth herein for any particular application. The
determination of the suitability of the standard is solely
the responsibility of the user. Users are cautioned to
refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
standards are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
the contents in whole or in part is forbidden without express written
consent of SEMI.
SEMI C6.7-93 © SEMI 1993, 2002 1
SEMI C6.7-93 (Reapproved 1102)
PARTICLE SPECIFICATION FOR GRADE 10/0.2 NITROGEN IN HIGH
PRESSURE GAS CYLINDERS
This specification was technically approved by the Global Gases Committee and is the direct responsibility of
the North American Gases Committee. Current edition approved by the North American Regional Standards
Committee on July 21, 2002. Initially available at www.semi.org October 2002; to be published November
2002. Originally published in 1993.
1 Purpose
1.1 The purposes of this document are (1) to set a
maximum permissible particle concentration for 10/0.2
grade cylinder nitrogen, and (2) to describe a reference
method for its verification.
2 Scope
2.1 This specification applies to nitrogen contained in
high pressure gas cylinders; it is not applicable to
pipeline gases.
2.2 A nitrogen cylinder consists of three components:
(1) a cylinder bottle, (2) compressed nitrogen contained
within, and (3) a cylinder valve. Each component can
be a particle source. This specification applied to the
total number of particles detected in the gas as obtained
from the cylinder under a prescribed condition. No
consideration is given to the origin of the particles.
2.3 It is known that pressure reduction, if not
controlled, can produce a large number of artifact
particles through nucleation and condensation. To avoid
this complication, this specification adopts particle
counters that can be operated at a pressure up to 200 bar
(3000 psi), eliminating the need for pressure reduction
and its associated problems.
2.4 It is known that particle content in cylinder gases
varies with time because particles can be lost to
cylinder walls by diffusion or sedimentation, and
detached from cylinder walls by flow pulses or
mechanical shocks. It is important to measure particle
concentration under the worst conditions which
represent typical handling of gas cylinders. This
specification describes a standard shock test that fulfills
the above requirements and provides a procedure to
count particles immediately after the shock.
2.5 If this test method is to be used for more than one
cylinder, then each cylinder must be tested. It is known
that particle contamination in cylinder gases is a strong
function of the handling history of the individual
cylinders. Cylinders in the same batch of filling are
usually returned from various customers after various
periods of service. Uniform quality can not be assumed
for the same batch of cylinders unless each of them has
gone through a dedicated process that erases the
memory of previous history prior to filling. Therefore,
batch sampling at 10% or 20% cannot be accepted
because of the significant differences among cylinders.
2.6 The requirement of 100% sampling restricts the
total amount of gas in each cylinder that can be used for
sampling purposes. This restriction, in turn, calls for
certain relaxation of the statistical requirement for
particle sampling at low concentration levels.
2.7 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety health practices and determine the
applicability or regulatory limitations prior to use.
3 Terminology
3.1 Variables
X
Bi
= Observed particle concentration in the i
th
sample
interval of the background
X
Mi
= Observed particle concentration in the i
th
sample
interval before shocks
X
Ni
= Observed particle concentration in the i
th
sample after
shocks
N
B
= Number of sample intervals of the background
N
M
= Number of sample intervals before shocks
N
N
= Number of sample intervals after shocks
B
X=
Averaged observed particle concentration of the
background
M
X=
Averaged observed particle concentration before
shocks
N
X=
Averaged observed particle concentration after
shocks
X
P
= Calculated particle concentration before shocks
X
Q
= Calculated particle concentration after shocks
S
B
=
Standard deviation of
B
X
S
M
=
Standard deviation of
M
X
S
N
=
Standard deviation of
N
X
SE
P
= Standard deviation of X
P
SE
Q
= Standard deviation of X
Q