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SEMI E69-0298 © SEMI 1998, 2003 9 13.3 Repeat Sections 13 .2.1–13.2.6, for a total of th ree times, until at least six sets o f data have been collected at each setpoint (with th e e x ception of 100%). 13.4 Repeat Secti…

SEMI E69-0298 © SEMI 1998, 2003 8
Table 2 Test Data Cover Sheet
MFC
Manufacturer__________ Model__________ Serial Number__________ Attitude__________
Nameplate Gas__________ Seal Type__________ Valve Seat Matl.__________ Full Scale Range__________
Environment
Ambient Temp. (°C)_________ Ambient Press. (kPa)________ Humidity (%)__________
Test Gas__________ Inlet Gas Pres. (kPa)_________ Outlet Gas Press.__________ Gas Temp. (°C)__________
Test Facility
Name__________ City/State__________ Telephone ( )__________ Fax ( )__________
Standard Used__________ Standard Accuracy__________ Facility Bias__________ Certification Date__________
Other Equipment__________ Accuracy__________ Certification Date__________
Other Equipment__________ Accuracy__________ Certification Date__________
Other Equipment__________ Accuracy__________ Certification Date__________
Other Equipment__________ Accuracy__________ Certification Date__________
Comments or Special Instructions:
Technician__________
Date__________
13.1.2 Use the cardinal setpoints and any other
setpoints of specific interest. These setpoints will be
used to determine the reproducibility of the MFC. The
setpoint increments should exceed the expected
deadband of the DUT.
13.1.3 At each setpoint under test, maintain the input
signal until the output of the DUT becomes stabilized at
its apparent final value. Observe and record the output
values in Table 1 for each input value.
13.1.4 Record five readings at each setpoint during
testing.
NOTE 2: If the data points show a trend in one direction,
either up or down, the DUT is not stable enough for the test to
proceed to the next setpoint. Record another five readings at
this setpoint. If the results continue to show a trend, repeat the
measurements at the previous setpoint. If the results are not
satisfactory at this setpoint, stop the test for this MFC. If the
results are not satisfactory, halt the test and verify the
performance of the testing apparatus.
13.1.5 At each point under test, maintain the input
signal until the output of the device under test becomes
stabilized at its apparent final value. Observe and
record the output values for each input value.
13.2 Reproducibility and Zero Drift Test
13.2.1 Apply a 50% setpoint to the MFC and record
data.
13.2.2 Move the setpoint to 100% and record data.
13.2.3 Move the setpoint to 50% and record data.
13.2.4 Move the setpoint to 10% and record data.
13.2.5 After recording data at 10%, apply a 5%
setpoint for 10 minutes, but do not record any data at
this setpoint.
13.2.6 Move the setpoint back up to 10% and record
data.

SEMI E69-0298 © SEMI 1998, 2003 9
13.3 Repeat Sections 13.2.1–13.2.6, for a total of three
times, until at least six sets of data have been collected
at each setpoint (with the exception of 100%).
13.4 Repeat Sections 13.1.1–13.3 weekly for a period
of at least 12 weeks. During the idle time, the MFC
should be continuously powered, with any exceptions
so noted. Gas flow is not required during the idle time,
but any gas flow shall be recorded. Finally, record all
details about the conditions of the MFC during the idle
time.
14 Data Analysis
14.1 Calculations
14.1.1 Determine the precision at a setpoint by
calculating the standard deviation of all the measured
values (both upscale and downscale) for that setpoint.
Perform this calculation at each setpoint:
P=
(V
i
−
A
a
)
2
∑
()
j
∑
n
j
P = Precision
V
i
=
The i
th
reading at a setpoint for a given cycle
A
a
=
Average measured value
n
j
=
N
umber of readings at a setpoint for a given cycle
14.1.2 Determine the short-term reproducibilty at a
setpoint by dividing the precision of the setpoint by the
average setpoint. This is expressed as a percentage of
setpoint. Perform this calculation at each point:
SRS% =
P
S
a
× 100
14.1.3 The long term reproducibility at a setpoint is the
greatest absolute weekly reproducibility at a setpoint.
14.1.4 Determine the precision over the test period at a
setpoint by calculating the standard deviation of all the
measured values (both upscale and downscale) for that
setpoint. Perform this calculation at each setpoint:
P
L
=
( V
i
−
A
a
)
2
∑
(
)
j
∑
( )
w
∑
n
j
∑
(
)
w
∑
P
L
= Precision over the test period
V
i
=
The i
th
reading at a setpoint for a given cycle
A
a
=
Average measured
l
n
j
=
N
umber of readings at a setpoint for a given cycle
w =
N
umber of weeks
14.1.5 Determine the reproducibility at a setpoint by
dividing the precision over the test period at this
setpoint by the average setpoint. This is expressed as a
percentage of setpoint. Perform this calculation at each
setpoint:
RS% =
P
L
S
a
× 100
14.1.6 The overall reproducibility of the DUT is the
maximum value calculated in Section 14.1.4:
±
RD% = RS
max
RD = Reproducibility of the device
14.1.7 Calculate zero drift by subtracting the minimum
zero value from the maximum zero value and dividing
by two. This number is reported as ± sccm or slm over
the specified time period.
15 Data Presentation
15.1 Plot the average measured value of each setpoint
(10%, 50%, 100%) for each measurement period on a
graph, with the x-axis representing time, and the y-axis
showing the actual flow output in sccm or slm.
15.2 Plot the measured value at zero for each
measurement period on a graph, with the x-axis
representing time and the y-axis showing flow output
signal in sccm or slm.
15.3 Reproducibility — Report a single number, as
calculated above, as a percentage of reading stated, with
the time period of the test.
15.4 Zero Drift — Report a single number, as
calculated above, stated with the time period of the test.
16 Related Documents
16.1 SEMI
Standard
SEMI E67 — Test Method for Determining Reliability
of Mass Flow Controller (Refer to this standard if
reliability data is needed for some of the parameters
tested in this method.)
NOTICE: Unless otherwise indicated, all documents
cited shall be the latest published versions.

SEMI E69-0298 © SEMI 1998, 2003 10
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