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SEMI G75.4-069 8 © SEMI 1998 2 NOTICE: T hese standards do n ot purport to address safety issues, if any, ass o ciated with their use. It is the responsibility of t he user of these standards to establish appropriate saf…

SEMI G75.4-0698 © SEMI 19981
SEMI G75.4-0698
TEST METHOD FOR MEASUREMENT OF WATER ABSORPTION OF
LEADFRAME TAPE
1 Summary of Method
1.1 Leadframe tape is exposed to an environment at
constant humidity and temperature. The water
absorption is measured by directly weighing the
samples before and after test.
2 Referenced Documents
NOTE: As listed or revised, all documents cited shall be the
latest publications of adopted standards.
2.1 ASTM Specification
1
ASTM D 1193 — Standard Specification for Reagent
Water
3 Equipment
3.1 Direct reading electric balance capable of reading
0.1 mg.
3.2 Thermohygrostat capable of 23 ± 2°C and 50 ± 5%
RH.
3.3 Thermohygrostat capable of 85 ± 2°C and 85 ± 5%
RH.
4 Materials
4.1 Deionized Water — Refer to ASTM D 1193.
5 Test Conditions
5.1 Specimen Conditioning
Temperature — 23 ± 2°C
Humidity — 50 ± 5% RH
5.2 Test Conditions
Temperature — 85 ± 2°C
Humidity — 85 ± 5% RH
6 Sampling
6.1 The sampling is one sample per one lot. The
vendor must report the definition of lot, if customer re-
quires it.
6.2 The sample’s weight shall be 1 gram minimum.
6.3 Use plastic tweezers to handle the samples.
1 American Society of Testing and Materials, 100 Barr Harbor Drive,
West Conshohoken, PA 19428-2959 (all cited standards may be
found in Volume 10.05 of the Annual Book of ASTM Standards)
7 Equipment Setup and Cal ibration
7.1 Refer to the thermohygrostat manufacturer’s
manual for setup and calibration procedures.
8 Procedure
8.1 Separate off the protective film from the leadframe
tape.
8.2 Set the thermohygrostat at 23°C and 50% RH and
condition the samples at these conditions for 16 hours
minimum.
8.3 Weigh each sample to 0.1 mg accuracy (W
1
,
Units-grams).
8.4 Set the thermohygrostat at 85°C and 85% RH and
leave the samples at these conditions for 20 ± 0.25
hours.
8.5 Wipe the water from sample surface with lint-free
clean wipes.
8.6 Reweigh each sample (W
2
, Unit-grams).
8.7 Calculation
The water absorption obtained, A (%), is deter-mined
from the following equation:
A(%) =
(W
2
− W
1
) ×100
W
1
9 Related Documents
NOTE: As listed or revised, all documents cited shall be the
latest publications of adopted standards.
9.1 ASTM Specification
ASTM D 570 — Standard Test Method for Water
Absorption of Plastics
9.2 JIS Specifications
2
JIS K 6911 — Testing Methods for Thermosetting
Plastics
JIS K 7209 — Testing Methods for Water and Boiling
Water Absorption of Plastics
2 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-
ku, Tokyo, Japan

SEMI G75.4-0698 © SEMI 1998 2
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI G75.5-0698 © SEMI 19981
SEMI G75.5-0698
TEST METHOD FOR MEASUREMENT OF WEIGHT LOSS OF
LEADFRAME TAPE
1 Summary of Method
1.1 Specimens are weighed before and after exposure
to temperatures comparable to those used in the
assembly and packaging of microelectronics devices.
The weight loss is calculated as a percentage change in
the weight of the sample.
2 Equipment
2.1 Direct reading balance calibrated to 0.1 mg
accuracy.
2.2 Recirculating air oven capable of 300°C ± 2°C
accuracy.
3 Sampling
3.1 The sampling is one sample per one lot. The
vendor must report the definition of lot, if customer
requires it.
4 Preparation of Specimens
4.1 Allow the samples to stabilize at 23°C ± 2°C and
50 ± 5% RH for 16 hours minimum. This may be
carried out in a climate controlled room or in a
thermohygrostat.
4.2 Cut specimens out of the samples such that the
minimum weight of each specimen is 1 gram.
5 Test Conditions
5.1 Test Condition 1 — 100°C for 60 ± 1 minute.
5.2 Test Condition 2 — 200°C for 60 ± 1 minute.
5.3 Test Condition 3 — 300°C for 10 ± 0.5 minutes.
NOTE: Alternate temperature may be used by agreement
between vendor and customer.
6 Equipment Setup and Cal ibration
6.1 Refer to the thermohygrostat manufacturer’s
manual for setup and calibration procedures.
7 Procedure
7.1 In order to ease the handling of the specimens,
place each into a weighed cup or tray which has tared
their weight (W
1
).
7.2 Place the specimens in the oven at the specified
test conditions.
7.3 Remove the specimens from the oven and store at
23°C ± 2°C and 50 ± 5% RH for 16 hours minimum.
7.4 Reweigh the specimens (W
2
).
7.5 Calculation
7.5.1 The Weight Loss, A (%), is determined from the
following equation:
A(%) =
(W
1
− W
2
) ×100
W
1
8 Related Documents
NOTE: As listed or revised, all documents cited shall be the
latest publications of adopted standards.
8.1 JIS Specification
1
JIS K 0067 — Testing Methods for Loss and Residue of
Chemical Products
NOTICE: These standards do not purport to address
safety issues, if any, associated with their use. It is the
responsibility of the user of these standards to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
SEMI makes no warranties or representations as to the
suitability of the standards set forth herein for any
particular application. The determination of the
suitability of the standard is solely the responsibility of
the user. Users are cautioned to refer to manufacturer’s
instructions, product labels, product data sheets, and
other relevant literature respecting any materials
mentioned herein. These standards are subject to
change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
1 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-
ku, Tokyo, Japan
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.