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SEMI C52-0301 © SEM I 2001 1 SEMI C52-0301 SPECIFICA TION FOR THE SHELF LIFE OF A SPECI ALTY GAS This specif ication was technic ally approved by the Global Ga ses Committee and is the direct responsib ility of the Europ…

SEMI C15-95 © SEMI 1995, 2002 5
detail, because such a calculation can be made by
applying procedures described elsewhere. The accuracy
required in validation will vary with the proposed
application of the moisture standard and may be left to
the discretion of the user of the procedure. It is
recommended that a propagation of errors calculation
be carried out to estimate the accuracy of the validation.
If no such calculation is made, and the minimum
criteria of the procedure are followed, it is estimated
that a validated moisture generator may output moisture
levels which differ from the true values by up to 20%.
NOTICE: SEMI makes no warranties or
representations as to the suitability of the standards set
forth herein for any particular application. The
determination of the suitability of the standard is solely
the responsibility of the user. Users are cautioned to
refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
standards are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this standard may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this standard, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this standard. Users of this standard
are expressly advised that determination of any such
patent rights or copyrights, and the risk of infringement
of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI C52-0301 © SEMI 20011
SEMI C52-0301
SPECIFICATION FOR THE SHELF LIFE OF A SPECIALTY GAS
This specification was technically approved by the Global Gases Committee and is the direct responsibility of
the European Gases Committee. Current edition approved by the European Regional Standards Committee on
December 20, 2000. Initially available at www.semi.org January 2001; to be published March 2001.
1 Purpose
1.1 The purpose of this document is to define
terminology and to recommend minimum periods for
the shelf lives of specialty gases. It is meant to provide
consistency in terminology among gas suppliers and to
provide a general guideline for users of these gases.
2 Scope
2.1 This document applies to the shelf life of properly
packaged, filled and analyzed specialty gases as stored
or supplied by a specialty gas manufacturer or supplier.
In this document, shelf life is viewed from a quality
point of view. The document does not address safety
aspects associated with the prolonged storage of gases.
2.2 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory limitations prior to use.
3 Referenced Standards
None.
4 Terminology
4.1 container — a lecture bottle, cylinder, cylinder
pack, drum or any other vessel which is used to supply
a specialty gas.
4.2 residual level — The amount of product, as a
fraction of the fill weight or fill pressure, which should
be left in a container in order to minimize the impact on
manufacturing processes of the higher level of
impurities in the last gas fraction from a container.
4.3 shelf life — the period of time for which the
specification of a gas is guaranteed by the supplier,
starting from the time of analysis. It defines the period
for which the supplier guarantees the actual level of
impurities, as analyzed, to remain at or below the
specification limit for a particular gas grade.
5 Requirements
5.1 Factors Affecting the Shelf Life of a Specialty Gas
— Shelf life is a function of the following factors:
a. Thermal stability of the gas
b. Quality of the container and valve
• material selection
• leak tightness
c. Time-dependent reactions between
• gas and impurities
• gas and packaging materials
d. Filling and analytical operations
e. Transport and storage conditions
f. Amount of product in the container
5.1.1 The integrity of the valve is a key factor
determining the shelf life of a gas, in particular for low
vapor pressure gases. Time dependent reactions can be
significantly reduced by purification of the gas to a
level where impurities no longer have a significant
effect over time, and by selection of proper packaging
materials. Chemical and physical treatment of the
internal container surface and/or passivation of this
surface before filling also reduces the effect of time-
dependent reactions. For material and gas compatibility
information, please refer to the individual SEMI gas
standards.
5.2 Classification of Specialty Gases on the Basis of
Shelf Life — While there are a large number of
specialty gases used in semiconductor manufacturing,
for the purpose of defining shelf lives, they can be
divided into four groups. It should be noted that for
example chemically reactive gases are sometimes
classified as non-reactive in the table below as the
classification is done from a shelf-life point of view
only.
5.2.1 Non-reactive — Under normal storage
conditions, these gases do not react with ambient air,
the packaging materials or the impurities commonly
found in the specialty gas.
5.2.2 Reactive — These gases react either with
ambient air or standard packaging materials.
5.2.3 Corrosive — These gases react with packaging
materials usually in the presence of traces of moisture.
5.2.4 Unstable — These gases are thermally unstable
and spontaneously decompose over time.

SEMI C52-0301 © SEMI 2001 2
Table 1 Classification of Specialty Gases on the
Basis of Shelf Life
Non-
reactive
Reactive Corrosive Unstable
Air
Ar
CFH
3
CF
2
H
2
CF
3
H
CF
4
CH
4
CO
2
C
2
F
6
C
3
F
8
C
4
F
8
C
5
F
8
He
Kr
Ne
N
2
N
2
O
O
2
SF
6
Xe
AsH
3
CO
D
2
GeH
4
H
2
NF
3
PH
3
SeH
2
SiH
4
Si
2
H
6
BCl
3
BF
3
11
BF
3
ClF
3
Cl
2
F
2
GeF
4
HBr
HCl
HF
NH
3
PF
5
SiCl
2
H
2
SiCl
3
H
SiCl
4
SiF
4
WF
6
B
2
H
6
NO
5.3 Guaranteed Shelf Life Period — The following
guaranteed shelf life periods are recommended as a
minimum.
Table 2 Guaranteed Shelf Life Period
Non-
reactive
Reactive Corrosive Unstable
36 months 24 months 18 months 6 months
5.3.1 When proper packaging materials are chosen and
the container is properly prepared (and passivated),
impurity levels should in theory remain constant over
time for an electronics grade specialty gas with the
exception of the thermally unstable gases. For this
reason, no maximum shelf life periods are
recommended as these will depend on the level of
analytical data collected by the manufacturer or
supplier.
5.4 Mixtures — The shelf life of a mixture is
recommended to be equal to the shelf life of the
component in the mixture with the lowest shelf life. For
example, the minimum shelf life of a reactive gas in a
non-reactive gas matrix would be 24 months. The shelf
life of a mixture should apply both to the impurity
specifications and to the assay of the mixture.
5.4.1 Special attention should be paid to the
preparation of the package for mixtures containing less
than 1,000 ppm of a component. At such levels,
adsorption effects may reduce the shelf life and
minimization of the package internal surface roughness
and/or passivation of the surface may be required.
5.5 Residual Level — The impact of the depletion of a
container on impurity levels is still a matter of debate
among gas suppliers. In general, the impurity levels of
the first gas fraction from a container will differ from
the last gas fraction. In particular moisture levels tend
to rise at lower gas pressures as a result of the relative
increase in importance of the internal container wall
and its adsorbed moisture. In addition, in liquefied
gases the co-existence of both a gas phase and a liquid
phase can have a measurable effect on the distribution
of impurities over the gas fractions. It is argued that at
the point of liquid-dry some impurities, which prefer
solution in the liquid phase over the gas phase, may see
a dramatic rise. It is therefore recommended to always
leave an amount of product in the container and to
avoid a situation of “liquid dry” (i.e., when all of the
liquid phase of a liquefied gas has been used).
NOTICE: SEMI makes no warranties or
representations as to the suitability of the specification
set forth herein for any particular application. The
determination of the suitability of the specification is
solely the responsibility of the user. Users are cautioned
to refer to manufacturer’s instructions, product labels,
product data sheets, and other relevant literature
respecting any materials mentioned herein. These
specifications are subject to change without notice.
The user’s attention is called to the possibility that
compliance with this specification may require use of
copyrighted material or of an invention covered by
patent rights. By publication of this specification, SEMI
takes no position respecting the validity of any patent
rights or copyrights asserted in connection with any
item mentioned in this specification. Users of this
specification are expressly advised that determination
of any such patent rights or copyrights, and the risk of
infringement of such rights, are entirely their own
responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.