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SEMI G75.6-069 8 © SEMI 1998 1 SEMI G75.6-0698 TEST METHOD FOR MEA SUREM ENT OF THE SHRINKAGE FACTOR OF LEA DFRA ME TAPE 1 Summary of Method 1.1 The leng th of tape sample s is m e a s ured before and after ex pos ure to…

SEMI G75.5-0698 © SEMI 19981

SEMI G75.5-0698

TEST METHOD FOR MEASUREMENT OF WEIGHT LOSS OF

LEADFRAME TAPE

1 Summary of Method

1.1 Specimens are weighed before and after exposure

to temperatures comparable to those used in the

assembly and packaging of microelectronics devices.

The weight loss is calculated as a percentage change in

the weight of the sample.

2 Equipment

2.1 Direct reading balance calibrated to 0.1 mg

accuracy.

2.2 Recirculating air oven capable of 300°C ± 2°C

accuracy.

3 Sampling

3.1 The sampling is one sample per one lot. The

vendor must report the definition of lot, if customer

requires it.

4 Preparation of Specimens

4.1 Allow the samples to stabilize at 23°C ± 2°C and

50 ± 5% RH for 16 hours minimum. This may be

carried out in a climate controlled room or in a

thermohygrostat.

4.2 Cut specimens out of the samples such that the

minimum weight of each specimen is 1 gram.

5 Test Conditions

5.1 Test Condition 1 — 100°C for 60 ± 1 minute.

5.2 Test Condition 2 — 200°C for 60 ± 1 minute.

5.3 Test Condition 3 — 300°C for 10 ± 0.5 minutes.

NOTE: Alternate temperature may be used by agreement

between vendor and customer.

6 Equipment Setup and Cal ibration

6.1 Refer to the thermohygrostat manufacturer’s

manual for setup and calibration procedures.

7 Procedure

7.1 In order to ease the handling of the specimens,

place each into a weighed cup or tray which has tared

their weight (W

7.2 Place the specimens in the oven at the specified

test conditions.

7.3 Remove the specimens from the oven and store at

23°C ± 2°C and 50 ± 5% RH for 16 hours minimum.

7.4 Reweigh the specimens (W

7.5 Calculation

7.5.1 The Weight Loss, A (%), is determined from the

following equation:

A(%) =

− W

) ×100

8 Related Documents

NOTE: As listed or revised, all documents cited shall be the

latest publications of adopted standards.

8.1 JIS Specification

JIS K 0067 — Testing Methods for Loss and Residue of

Chemical Products

NOTICE: These standards do not purport to address

safety issues, if any, associated with their use. It is the

responsibility of the user of these standards to establish

appropriate safety and health practices and determine

the applicability of regulatory limitations prior to use.

SEMI makes no warranties or representations as to the

suitability of the standards set forth herein for any

particular application. The determination of the

suitability of the standard is solely the responsibility of

the user. Users are cautioned to refer to manufacturer’s

instructions, product labels, product data sheets, and

other relevant literature respecting any materials

mentioned herein. These standards are subject to

change without notice.

The user’s attention is called to the possibility that

compliance with this standard may require use of

copyrighted material or of an invention covered by

patent rights. By publication of this standard, SEMI

takes no position respecting the validity of any patent

rights or copyrights asserted in connection with any

item mentioned in this standard. Users of this standard

are expressly advised that determination of any such

patent rights or copyrights, and the risk of infringement

of such rights, are entirely their own responsibility.

1 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-

ku, Tokyo, Japan

International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o

the contents in whole or in part is forbidden without express written

consent of SEMI.

SEMI G75.6-0698 © SEMI 19981

SEMI G75.6-0698

TEST METHOD FOR MEASUREMENT OF THE SHRINKAGE FACTOR

OF LEADFRAME TAPE

1 Summary of Method

1.1 The length of tape samples is measured before and

after exposure to temperatures comparable to those

used in the assembly and packaging of IC. The

shrinkage is calculated as a percentage in the dimension

measured.

2 Equipment

2.1 Magnifying projector with 0.01 mm accuracy

2.2 Circulating air oven capable of 300 ± 2°C

accuracy

2.3 Cutting die for sample preparation

2.4 Thermohygrostat

2.5 Straight edge

2.6 Scribing tool

3 Sampling

3.1 The sampling is one sample per one lot. The

vendor must report the definition of lot, if the customer

requires it.

4 Preparation of Specimens

4.1 Cut specimens out of the samples using the cutting

die. The specimen shall be 100 ± 1.0 mm long and 10 ±

1.0 mm wide.

4.2 Allow the specimen to be stabilized at 23° ± 2°C

and 50 ± 5% RH for 16 hours minimum. This may be

carried out in a climate controlled room or in a

thermohygrostat.

4.3 Using the straight edge and scribing tool, scribe

marks on the specimens as shown in Figure 1. The

marks shall be parallel to each edge of the specimen,

and the distance to be measured, L, shall be parallel to

the long side of the specimen. The mark shall be

located within 5 mm of the ends of the specimen.

Figure 1

Size of a Marked Specimen

5 Test Conditions

5.1 Baking Condition 1 — 100°C for 60 ± 1 minute.

5.2 Baking Condition 2 — 200°C for 60 ± 1 minute.

5.3 Baking Condition 3 — 300°C for 10 ± 0.5

minutes.

NOTE: Alternate temperatures may be used by agreement

between vendor and customer.

6 Procedure

6.1 Place a specimen between the glass plates of the

magnifying projector and measure the length, L

between two marks (see Figure 1). Repeat this

measurement for all specimens.

6.2 Place the specimen in the oven at the appropriate

test condition.

6.3 Remove the specimens from the oven and store at

23° ± 2°C and 50 ± 5% RH for 16 hours minimum.

6.4 Place the specimens between t he glass plates of the

magnifying projector and measure the new length, L

between two marks used in Section 6.1.

6.5 Calculation

6.5.1 The shrinkage factor, A (%), is determined from

the following equation:

A(%)

−

)

100

where

is the length (mm) of the specimen

before baking