semi合集-English.pdf - 第4103页

SEMI F59-0302 © SEMI 2000, 2002 9 Table 2 Filter Flow Pressure Drop for Housing with Cartridge Element Remov ed Filter Unit Identification Test Num ber _____________________ Date _____________________ Operator Name _____…

100%1 / 7923
SEMI F59-0302 © SEMI 2000, 2002 8
Table 1 DUT Flow Pressure Drop for Integral Filtration Unit or Gas System
DUT Unit Identification
Test Number _____________________
Date _____________________
Operator Name _____________________
Barometric Pressure _____________________
Test Gas _____________________
Integral Filtration Unit or Gas System
Ambient
Temperature
(
o
C)
Inlet Pressure
(psig, gauge)
P(Unit) Differential
Pressure, unit
(psid, differential)
Flow Meter
Reading
(units)
Normal
Flow
Rate(m
3
/hr)
SEMI F59-0302 © SEMI 2000, 2002 9
Table 2 Filter Flow Pressure Drop for Housing with Cartridge Element Removed
Filter Unit Identification
Test Number _____________________
Date _____________________
Operator Name _____________________
Barometric Pressure _____________________
Test Gas _____________________
Housing with Cartridge Removed
Ambient
Temperature
(
o
C)
Inlet Pressure
(psig, gauge)
P(Housing)
Differential Pressure,
H
ousing
(psid, differential)
Flow Meter
Reading (units)
Normal
Flow Rate
(m
3
/hr)
Table 3 Filter Flow Pressure Drop for Cartridge Element
Cartridge Pressure Drop
P(cartridge) = P(Unit) – P(Housing)
Normal Flow Rate
(m
3
/hr)
P(Unit) Differential
Pressure, unit
(psid, differential)
P(Housing) Differential
Pressure, Housing
(psid, differential)
P(cartridge) Differential
Pressure, Cartridge
(psid, differential)
SEMI F59-0302 © SEMI 2000, 2002 10
Normal Flow Rate
Differential Pressure
Test Pressure 1
Test Pressure 2
Test Pressure 3
Figure 4
Example of a Flow Pressure Drop Curve for a Filter
NOTICE: SEMI makes no warranties or representations as to the suitability of the standard set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant
literature respecting any materials mentioned herein. These standards are subject to change without notice.
The user’s attention is called to the possibility that compliance with this standard may require use of copy-righted
material or of an invention covered by patent rights. By publication of this standard, SEMI takes no position
respecting the validity of any patent rights or copyrights asserted in connection with any item mentioned in this
standard. Users of this standard are expressly advised that determination of any such patent rights or copyrights, and
the risk of infringement of such rights, are entirely their own responsibility.
Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express writte
n
consent of SEMI.