semi合集-English.pdf - 第3865页
SEMI F22-1102 © SEMI 1997, 2002 15 NOTICE: SEMI makes no warranties or represen tations as to the suitability of the standards set forth herein for any particular application. The determination of the suitability of the …

SEMI F22-1102 © SEMI 1997, 2002 14
Figure 4
Specialty Gas Cabinet System Flow Chart (cont.)

SEMI F22-1102 © SEMI 1997, 2002 15
NOTICE: SEMI makes no warranties or representations as to the suitability of the standards set forth herein for any
particular application. The determination of the suitability of the standard is solely the responsibility of the user.
Users are cautioned to refer to manufacturer’s instructions, product labels, product data sheets, and other relevant
literature respecting any materials mentioned herein. These standards are subject to change without notice.
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Copyright by SEMI® (Semiconductor Equipment and Materials
International), 3081 Zanker Road, San Jose, CA 95134. Reproduction o
f
the contents in whole or in part is forbidden without express written
consent of SEMI.

SEMI F23-0697 © SEMI 1997, 2003 1
SEMI F23-0697 (Reapproved 0303)
PARTICLE SPECIFICATION FOR GRADE 10/0.2 FLAMMABLE
SPECIALTY GASES
This specification was technically reapproved by the Global Gases Committee and is the direct responsibility
of the North American Gases Committee. Current edition approved by the North American Regional
Standards Committee on October 25, 2002. Initially available at www.semi.org December 2002; to be
published March 2003. Originally published June 1997.
1 Purpose
1.1 The purpose of this document is to set a maximum
permissible particle concentration for 10/0.2 grade
flammable specialty gases and to describe a reference
method for its verification.
2 Scope
2.1 This document applies only to flammable gases
delivered through specialty gas systems at pressures up
to 8 × 10
5
Pa (8 atmospheres). This method is not
suitable for direct sampling from high pressure
cylinders at pressures above 8 × 10
5
Pa (8
atmospheres). This document applies only to the
following gas:
Hydrogen (H
2
)
2.2 This standard does not purport to address safety
issues, if any, associated with its use. It is the
responsibility of the users of this standard to establish
appropriate safety and health practices and determine
the applicability of regulatory or other limitations prior
to use.
3 Referenced Standards
3.1 SEMI Standard
SEMI C6.3 — Particle Specification for Grade 20/0.2
Hydrogen (H
2
) Delivered as Pipeline Gas
3.2 JIS Standard
1
JIS B 9921 — Japanese Industrial Standard (1989),
“Light Scattering Automatic Particle Counter”
NOTICE: Unless otherwise indicated, all documents
cited shall be the latest published versions.
4 Terminology
4.1 Variables
V
Mi
= Volume of the i
th
sample interval of the system gas
V
Bi
= Volume of the i
th
sample interval of the background
1 Japanese Industrial Standards, Available through the Japanese
Standards Association, 1-24, Akasaka 4-Chome, Minato-ku, Tokyo
107-8440, Japan. Telephone: 81.3.3583.8005; Fax: 81.3.3586.2014
Website: http://www.jsa.or.jp
X
Mi
= Concentration of particles observed in the i
th
sample o
f
interval of the system gas
X
Bi
= Concentration of particles observed in the i
th
sample o
f
interval of the background
N
M
= Number of sample intervals of the system gas
N
B
= Number of sample intervals of the background
M
X=
Average observed concentration of counts in the
system gas sample
B
X=
Average observed concentration of background counts
C
X=
Calculated concentration of particles in the system gas
S
M
=
Standard deviation of
M
X
S
B
=
Standard deviation of
B
X
S
C
=
Standard deviation of
C
X
4.2 gas sample volume (V
Mi
, V
Bi
) — The volume of the
sample interval, expressed in standard liters at standard
conditions, 0°C (32°F) and 1 × 10
5
Pa (1 atmosphere)
pressure. Standard cubic feet (SCF) is defined at
21.1°C (70°F) and 1 × 10
5
Pa (1 atmosphere) pressure.
4.3 average observed concentration of counts
(
M
X ,
B
X ) — The average concentration of counts, i.e.:
X
M
=
Σ
X
Mi
N
M
X
B
=
Σ
X
Bi
N
B
4.4 calculated concentration of particles (
C
X ) — The
concentration of particles in the system gas obtained by
correcting the observed concentration in the system gas
for the observed concentration in the background, i.e.:
X
C
= X
M
− X
B
4.5 standard deviation (S
M
, S
B
, S
C
) — A statistical
measure of the spread of the concentration of the counts
or particles. The first two are obtained from the
interval and average concentrations and the number of
intervals, i.e.: