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SEMI G75.13-06 98 © SEMI 1998 3 5 Procedure 5.1 Setu p the test circuit as sho wn i n Figure 2. Figure 2 Test Circuit for Measurement of Leakage Current 5.2 P lace the f irst m olded sample i n th e shielded box and atta…

SEMI G75.13-0698 © SEMI 1998 2

Figure 1

Typical Taped 40 Pin DIP Leadframe

Table 1 Relevant Information for 40 Pin DIP Leadframe

Leadframe Attribute Specification

Leadframe thickness 0.25 mm

Leadframe material Alloy 42

Leadframe manufacturing process Stamping

Plating None/Silver/Others

Surface treatment To be agreed between tape user and supplier.

NOTE 2: The surface state of Alloy 42 is stable compared with Cu alloy, which is oxidized easily.

4.3 The leadframes shall be molded using molding compounds and cured with post mold curing conditions agreed

on between vendor and customer. The untaped leadframe shall be prepared with the same procedure as a control.

4.4 Trim the leads according to a procedure agreed on between vendor and customer.

SEMI G75.13-0698 © SEMI 19983

5 Procedure

5.1 Setup the test circuit as shown in Figure 2.

Figure 2

Test Circuit for Measurement of Leakage Current

5.2 Place the first molded sample in the shielded box and attach clips to the leads A

and A

(see Figure 1).

Measure the initial leakage current at 500 volts maximum.

NOTE 3: The leakage current shall be measured after 5 minutes voltage application.

5.3 Repeat the measurement for all the lead pairs, A

with A

, B

with B

, and B

with B

5.4 Place the samples in the HAST chamber and run the test.

5.5 After the tester has been automatically cooled to room temperature, remove the samples.

5.6 Measure the leakage current between the same lead pairs mentioned in Sections 5.2 and 5.3.

5.7 Repeat the HAST exposure and measure the cur-rent leakage.

5.8 Calculation

5.8.1 Maximum and minimum leakage current shall represent the test results.

5.8.2 Calculate the average result for all of the test points at each test stage.

5.8.3 Obtained data should be converted to 100 volts basis or as agreed on between vendor and customer.

6 Related Documents

6.1 ASTM Specification

ASTM D 257 — Test Methods for D-C Resistance or Conductance of Insulating Materials

6.2 JIS Specification

JIS K 6911 — Testing Methods for Thermosetting Plastics

1 American Society of Testing and Materials, 100 Barr Harbor Drive, West Conshohoken, PA 19428-2959 (all cited standards may be found in

Volume 10.05 of the Annual Book of ASTM Standards)

2 Japanese Standards Association, 1-24, Akasaka 4 Chome, Minato-ku, Tokyo, Japan

SEMI G75.13-0698 © SEMI 1998 4

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