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SEMI D34-0703 © SEMI 2003 3 5.5.3.2 Measurement Conditions 5.5.3.2. 1 Equipm ent: Spectrophotometer 5.5.3.2. 2 Measurement Wavelengt h: 400–700 nm (10 nm interva ls) 5.5.4 Definition and Me asurement Method for Transmitt…

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SEMI D34-0703 © SEMI 2003 2
5.1.2 Defect Measurement (Inspection) Method —
Observe defects under fluorescent light (600–1600 lux),
using either reflection, transmission, or Cross-Nicol
transmission inspection, or a combination of the above,
at approximately 30 cm from the sample.
5.1.2.1 Reflection Inspection: Conduct on a
blackboard, using fluorescent light.
5.1.2.2 Transmission Inspection: Conduct on a
backlight
5.1.2.3 Cross-Nicol: Place a reference polarizing film
on a backlight, and conduct transmission inspection in
transmission inspection Cross-Nicol state.
5.2 Polarizing Film Visual Appearance (Line Defects)
5.2.1 Defect Size Definition
5.2.1.1 Line defects visually detected during reflection,
transmission, or Cross-Nicol inspection. Size is defined
by measuring the length of the long side and short side.
Ｗ
L
Figure 2
Definition of Defect Size (Line Defect)
5.2.2 Defect Measurement (Inspection) Method —
Observe defects under fluorescent light, using either
reflection, transmission, or Cross-Nicol transmission
inspection, or a combination of the above, at
approximately 30 cm from the sample.
5.2.2.1 Reflection Inspection: Conduct on a
blackboard, using fluorescent light.
5.2.2.2 Transmission Inspection: Conduct on a
backlight
5.2.2.3 Cross-Nicol: Place a reference polarizing film
on a backlight, and conduct transmission inspection in
transmission inspection Cross-Nicol state.
5.3 Polarizing Film Visual Appearance (Visual
Exclusion Area)
5.3.1 Definition
5.3.1.1 L of the Visual Exclusion Area is the
measurement of the distance from each side of the
polarizing film.
Ｌ
Figure 3
Definition of Visual Exclusion Area
5.4 Polarizing Film Thickness
5.4.1 Thickness Definition
5.4.1.1 Thickness, excluding the thickness of
protective film and separate film.
5.4.2 Thickness Measurement Method
5.4.2.1 Measured using a thickness gauge that can
measure to 0.001 mm.
5.5 Polarizing Film Optical Characteristics
5.5.1 Definition of Single Transmittance (Ty) and
Measurement Method
5.5.1.1 Value of Transmittance of 1 polarizing film,
visibility corrected (JIS Z8701) by supplementary
standard illuminant C (JIS Z8720)
7
, 2° range of view.
5.5.1.2 Measurement Conditions
5.5.1.2.1 Equipment: Spectrophotometer
5.5.1.2.2 Measurement Wavelength: 400–700 nm
(10 nm intervals)
5.5.2 Definition and Measurement Method of Parallel
Transmittance (T
//
)
5.5.2.1 Value of Transmittance of 2 polarizing films
placed parallel Nicol, visibility corrected (JIS Z8701)
by supplementary standard illuminant C (JIS Z8720),
2° range of view.
5.5.2.2 Measurement Conditions
5.5.2.2.1 Equipment: Spectrophotometer
5.5.2.2.2 Measurement Wavelength: 400–700 nm
(10 nm intervals)
5.5.3 Definition and Measurement Method for Cross
Transmittance (T
⊥
)
5.5.3.1 Value of Transmittance of 2 polarizing films
placed crossed Nicol, visually corrected (JIS Z8701) by
supplementary standard illuminant C (JIS Z8720), 2°
range of view.
7 Commonly known as “Light Source C”. Abbreviated to “Ill.C”.
SEMI D34-0703 © SEMI 2003 3
5.5.3.2 Measurement Conditions
5.5.3.2.1 Equipment: Spectrophotometer
5.5.3.2.2 Measurement Wavelength: 400–700 nm
(10 nm intervals)
5.5.4 Definition and Measurement Method for
Transmittance of each Wavelength
5.5.4.1 Measured value of 1 polarizing film at specific
wavelengths (440 nm, 550 nm, 610 nm)
5.5.4.2 Measurement Conditions
5.5.4.2.1 Equipment: Spectrophotometer
5.5.4.2.2 Measurement Wavelength: 440 nm, 550 nm,
610 nm
5.5.5 Definition and Measurement Method of UV Cut
Performance
5.5.5.1 Transmittance of 1 polarizing film, measured at
380 nm, is defined as UV cut performance.
5.5.5.2 Measurement Conditions
5.5.5.2.1 Equipment: Spectrophotometer
5.5.5.2.2 Measurement Wavelength: 380 nm
5.5.6 Definition and Measurement Method of
Polarization Efficiency (Py)
5.5.6.1 Expressed using the following formula, where
T
A
is transmittance (visibility corrected) on the
absorption axis, and T
B
is transmittance (visibility
corrected) on the transmittance axis.
AB
AB
TT
TT
Py
+
−
=
×100 (%)
5.5.6.2 The same value from the above equation can
also be calculated using the below equation, where T
//
is parallel transmittance and T
⊥
is cross transmittance.
⊥
⊥
+
−
=
TT
TT
Py
//
//
×100 (%)
5.5.6.3 Measurement Conditions
5.5.6.3.1 Equipment: Spectrophotometer
5.5.6.3.2 Measurement Wavelength: 400–700 nm
(10 nm intervals)
5.5.7 Definition and Measurement Method for Hue a*,
b*
5.5.7.1 Polarizing film transmittance value calculated
in accordance with JIS Z8729.
5.5.7.2 Measurement Conditions
5.5.7.2.1 Equipment: Spectrophotometer
5.5.7.2.2 Measurement Wavelength: 400~700 nm (10
nm intervals)
5.5.8 Definition and Measurement Method for Hue a, b
5.5.8.1 Visibility corrected (JIS Z8701) value by
supplementary standard illuminant C (JIS Z8720), 2°
range of view, calculated using the tristimulus values
(X, Y, Z) from the below formula.
(
)
Y
YX02.15.17
a
−
=
(
)
Y
Z847.0Y0.7
b
−
=
5.5.8.2 Measurement Conditions
5.5.8.2.1 Equipment: Spectrophotometer
5.5.8.2.2 Measurement Wavelength: 400–700 nm
(10 nm intervals)
5.5.9 Definition and Measurement Method for Haze
5.5.9.1 Scattered transmittance and all line
transmittance, measured using integrated sphere light
transmittance measurement equipment, expressed as a
ratio.
H =
t
d
T
T
×100 (%)
T
d
: Scattered Transmittance（%）
T
t
: All line transmittance（%）
To be measured in accordance with JIS K7105.
6 Equipment
6.1 Spectrophotometer with the below performance
shall be used.
6.1.1 Optical Wavelength: Sub 10 nm analysis
capability, adjustable between 380–780 mm.
7 Equipment Calibration
7.1 Equipment shall be calibrated in accordance with
the manufacturer’s manual.
7.2 When, due to calibration, there is a change in the
equipment’s performance, for example, linearity, phase
deviation, etc., a record shall be kept.
8 Related Document
8.1 Measurement Method for Optical Characteristics of
Polarizing Films Using Crystal Rotation Method
SEMI D34-0703 © SEMI 2003 4
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